Pregled po CROSBI profilu: Ivana Čorni (CROSBI Profil: 5295, MBZ: 200522)
Pronađeno 5 radova
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1.Dubček, Pavo; Pivac, Branko; Bernstorff, Sigrid; Corni, F.; Tonini, R.; Ottaviani, G.X-ray reflectivity study of hydrogen implanted silicon // Applied Surface Science, 253 (2006), 283-286 (međunarodna recenzija, članak, znanstveni)
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2.Dubček, Pavo; Pivac, Branko; Bernstorff, Sigrid; Tonini, R.; Corni, F.; Ottaviani, G.Grazing incidence small angle x-ray scattering study of irradiation induced defects in monocrystalline silicon, 2002. (podatak o recenziji nije dostupan, izvještaj).
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3.Pivac, Branko; Rakvin, Boris; Tonini, R; Corni, F; Ottaviani, GReply to comments on 'EPR study of He-implanted Si' by P. Pivac, B. Rakvin, R. Tonini, F. Corni, G. Ottaizani, Published in Mater. Sci. Eng. B73 (2000) 60-63 - Written by M. Kakazey, M. Vlasova, and J.G. Gonzalez-Rodriguez - Reply to discussio // Materials Science & Engineering B-Solid State Materials for Advanced Technology, 90 (2002), 1-2; 211-212 (međunarodna recenzija, članak, znanstveni)
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4.Mikšić, Vesna; Pivac, Branko; Rakvin, Boris; Zorc, Hrvoje; Corni, F.; Tonini, R.; Ottaviani, G.DLTS and EPR study of defects in H implanted silicon // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 186 (2002), 1/4; 36-40 doi:10.1016/S0168-583X(01)00919-3 (međunarodna recenzija, članak, znanstveni)
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5.Rakvin, Boris; Pivac, Branko; Tonini, R.; Corni, F.; Ottaviani, G.Electron paramagnetic evidence for reversible transformation of thermal donor into shallow donor-type center in hydrogen-implanted silicon // Applied physics letters, 73 (1998), 3250-3252 (međunarodna recenzija, članak, znanstveni)
