Pregled po CROSBI profilu: Anđelka Tonejc (CROSBI Profil: 28588, MBZ: 50121)
Pronađeno 129 radova
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51.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunStructural investigations of nanocrystalline TiO2 samples // Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials / Labar, Janos ; Weirich Thomas ; Zou, Xiaodong (ur.).
Erice: Ettore Majorama Foundation centre and Centre for Scienticic Culture, 2004. str. 1-1 (poster, međunarodna recenzija, sažetak, znanstveni) -
52.Tonejc, AnđelkaHRTEM Investigation of Nanocrystalline Materials // Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials / Labar, Janos ; Weirich Thomas ; Zou, Xiaodong (ur.).
Erice: Ettore Majorama Foundation centre and Centre for Scienticic Culture, 2004. str. 1-12 (pozvano predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
53.Djerdj, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, NikolaXRD analysis of tungsten thin films // 10th joint vacuum conference : Program and book of abstracts / Mozetic, M. ; Šetina, J. ; Kovač, J. (ur.).
Ljubljana: Društvo za vakuumsko tehniko Slovenije, 2004. str. 28-28 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
54.Djerdj, Igor; Tonejc, Anđelka; Bijelić, Mirjana; Vraneša, Vladimir; Turković, AleksandraTransmission electron microscopy studies of nanostructured TiO2 films on different substrates // 10th Joint Vacuum Conference and 11th Meeting of Slovenian and Croatian vacuum scientists and 24th Slovenian Vacuum Symposium : program and book of abstracts / Mozetč, Miran ; Šetina, Janez ; Kovač, Janez (ur.).
Ljubljana: Infokart, 2004. str. 68-68 (poster, međunarodna recenzija, sažetak, znanstveni) -
55.Djerdj, IgorStrukturna ispitivanja nanokristalnog titanovog dioksida, 2003., doktorska disertacija, Prirodoslovno-matematički fakultet, Zagreb
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56.Skoko, Željko; Djerdj, Igor; Popović, Stanko; Tonejc, AnđelkaMicrostructure of Al-Zn Alloys // Proceedings of 6th multinational congress on microscopy. / O. Milat, D. Ježek (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2003. str. 221-222 (poster, međunarodna recenzija, sažetak, znanstveni) -
57.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunThe calculation of the average grain size of nanocrystalline titania by means of electron microscopy and XRD // Proceedings of 6th Multinational Congress on Microscopy-European Extension / Milat, Ognjen ; Ježek, Davor (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2003. str. 221-222 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
58.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunThe Rietveld refinement of XRD data obtained on nanocrystalline TiO2 // Twelfth Croatian-Slovenian Crystallographic meeting, Book of abstracts / Cetina, Mario ; Kajfež, Tanja ; Popović, Stanko ; Štefanić, Zoran (ur.).
Zagreb: Croatian Academy of Sciencies and Arts and Croatian Crystallographic Association, 2003. (predavanje, sažetak, znanstveni) -
59.Tonejc, Anđelka; Djerdj, IgorHRTEM processing investigation of nanocrystalline materials // Proceedings of 6th multinational congress on microscopy-European Extension / Milat, Ognjen ; Ježek, Davor (ur.) (ur.).
Zagreb: Croatian society for electron microscopy, 2003. str. 213-214 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
60.Radić, Nikola; Tonejc, Antun; Tonejc, Anđelka; Djerdj, Igor; Furlan, Andrej; Panjan, Peter; Čekada, Miha; Jakšić, Milko; Medunić, Zvonkobeta -W faza u tankim filmovima - posljedica naprezanja ili kisika u filmu? // Zbornik Povzetkov / Jenko, M. (ur.).
Ljubljana: Društvo za vakuumsko tehniko slovenije, 2003. str. 9-9 (poster, sažetak, znanstveni) -
61.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunApplication of Rietveld method to XRD and SAED pattern of nanocrystalline TiO2 samples // XIX Congress and General Assembly of the International Union of Crystallography ; Abstracts Volume II
Ženeva: IUCR, 2002. str. 342-342 (poster, međunarodna recenzija, sažetak, znanstveni) -
62.Lopac, Vjera; Tonejc, Anđelka; Pećina, PlaninkaThe Past and Present of Physics in Croatia: Gender Differences in Graduation Statistics and Textbook Illustrations // Institute of Physics Conference Proceedings, AIP - Volume 628 / Beverly Karplus Hartline, Dongqi Li (ur.).
Melville (NY): American Institute of Physics (AIP), 2002. str. 149-150 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
63.Smontara, Ana; Tonejc, Anđelka; Gradecak, Silvija; Tonejc, Antun; Bilušić, Ante; Lasajunias, J.C.Structural (XRD and HRTEM) investigations of fullerite C60 and C70 samples // Materials Science and Engineering C, 19 (2002), 1/2; 21-25 doi:10.1016/S0928-4931(01)00427-1 (podatak o recenziji nije dostupan, konferencijsko priopćenje, znanstveni)
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64.Ivanda, Mile; Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Mariotto, Gino; Montagna, MaurizioDetermination of nanosized particles distribution by low freqyency Raman scattering: Comparison to electron microscopy // Lecture Notes in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research / Heun, S. ; Salviati, G. ; Watanabe, Y. (ur.).
Heidelberg: Springer, 2002. str. 24-36 -
65.Tonejc, Antun; Radić, Nikola; Djerdj, Igor; Tonejc, Anđelka; Ivkov, JovicaObservation of amorphous tungsten in "bulk" thin films deposited by magnetron sputtering technique // Book of Abstracts / Leban, Ivan (ur.).
Ljubljana: Faculty of Chemistry and Chemical Technology, Univ. of Ljubljana, 2002. (poster, sažetak, znanstveni) -
66.Tonejc, Antun; Djerdj, Igor; Tonejc, Anđelka; Radić, NikolaThe comparison of various methods for extraction of size-strain data from XRD powder pattern of thin films // Book of Abstracts / Leban, Ivan (ur.).
Ljubljana: Faculty of Chemistry and Chemical Technology, Univ. of Ljubljana, 2002. (poster, međunarodna recenzija, sažetak, znanstveni) -
67.Radić, Nikola; Tonejc, Antun; Tonejc, Anđelka M.; Furlan, Andrej; Panjan , Peter; Čekada, Miha; Jakšić, Milko; Medunić, Zvonko; Ivkov, Jovicabeta-W PHASE OCCURENCE AND STABILITY IN SPUTTER-DEPOSITED TUNGSTEN THIN FILMS // Final Programme and Book of Abstracts 9th Joint Vacuum Conference / Leisch, Manfred , Winkler, Adolf (ur.).
Graz: Austrian Vacuum Society, 2002. str. 25-26 (poster, međunarodna recenzija, sažetak, znanstveni) -
68.Ivanda, Mile; Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Mariotto, Gino; Montagna, MaurizioDetermination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy // Nanoscale spectroscopy and its applications to semiconductor research / Watanabe, Y. ; Heun, S. ; Salviati, G. ; Yamamoto, N. (ur.).
Heidelberg: Springer, 2002. str. 16-27 (poster, sažetak, znanstveni) -
69.Smontara, Ana; Bilušić, Ante; Lasjaunias, J. C.; Saint-Paul, M.; Gradečak, S.; Mejaški-Tonejc, Anđelka; Tonejc, Antun; Kitamura, N.; Bennington, S.Thermal and elastic properties of hard carbon // Strojarstvo, 44 (2002), 3/6; 195-200 (podatak o recenziji nije dostupan, kongresno priopćenje, znanstveni)
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70.Lasajunias, J. C.; Saint-Paul, M.; Bilušić, Ante; Smontara, Ana; Gradečak, Silvija; Tonejc, Anđelka; Tonejc, Antun; Kitamura, N.Acoustic and thermal transport properties of hard carbon formed from C60 fullerene // Physical Review B, 66 (2002) (međunarodna recenzija, članak, znanstveni)
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71.Radić, Nikola; Tonejc, Anđelka; Tonejc, Antun; Furlan, AndrejUtjecaj uvjeta depozicije na pojavu beta-faze u tankim volframskim filmovima // Zbornik Povzetkov 8. Mednarodni znanstveni sestanek Vakuumska znanost in tehnika / Belič, Lidija I. (ur.).
Ljubljana: Društvo za vakuumsko tehniko Slovenije, 2001. str. 12-12 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
72.Radić, Nikola; Tonejc, Anđelka M.; Tonejc, Antun; Furlan, AndrejUtjecaj uvjeta depozicije na pojavu beta-faze u tankim volframskim filmovima // Knjiga sažetaka Treći znanstveni sastanak Hrvatskog fizikalnog društva / Jakšić, Milko ; Kokanović, Ivan ; Milošević, Slobodan (ur.).
Zagreb: Hrvatsko fizikalno društva, 2001. str. 133-133 (poster, domaća recenzija, sažetak, znanstveni) -
73.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunAn analysis of evolution of grain size-lattice parameters dependence in nanocrystalline TiO2 anatase // Book of Abstracts of E-MRS 2001 Spring Meeting
Strasbourg, Francuska, 2001. str. S-14 (poster, međunarodna recenzija, sažetak, znanstveni) -
74.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunHigh-resolution electron microscopy (HRTEM)image processing analysis of defects and grain boundaries in ball-milled ZrO2 and ZrO2-Y2O3 powders // Book of Abstracts of The Conference on Modern Microscopical Methods
Innsbruck, Austrija, 2001. (poster, međunarodna recenzija, sažetak, znanstveni) -
75.Radić, Nikola; Furlan, Andrej; Tonejc, Antun; Tonejc, AnđelkaThe influence of deposition conditions on ß-phase occurrence in tungsten thin films // Book of Abstracts of 10th Croatian-Slovenian crystallographic meeting / Danilovski A., Kajfež T., Popović S. (ur.).
Zagreb: Pliva d.d., 2001. (predavanje, međunarodna recenzija, sažetak, znanstveni)
