Pregled po CROSBI profilu: Anđelka Tonejc (CROSBI Profil: 28588, MBZ: 50121)
Pronađeno 129 radova
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26.Buljan, Maja; Bogdanović Radović, Ivančica; Jakšić, Milko; Desnica, Uroš V.; Ivanda, Mile; Saguy, C.; Kalish, R.; Djerdj, Igor; Tonejc, Anđelka; Gamulin, OzrenImplantation conditions for diamond nanocrystals formation in amorphous silica // Journal of applied physics, 104 (2008), 3; 034315-1 doi:10.1063/1.2968204 (međunarodna recenzija, članak, znanstveni)
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27.Gržeta, Biserka; Tkalčec, Emilija; Popović, Jasminka; Tonejc, Anđelka; Bijelić, Mirjana; Goebbert, ChristianXRD and TEM study on microstructure of ITO // Seventeenth Slovenian-Croatian Crystallographic Meeting : book of abstracts / Pevec, Andrej ; Leban, Ivan (ur.).
Ljubljana: University of Ljubljana, 2008. str. 62-62 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
28.Popović, Jasminka; Gržeta, Biserka; Tkalčec, Emilija; Tonejc, Anđelka; Bijelić, Mirjana; Goebbert, ChristianTEM and XRD structure examination of Sn-doped indium oxide (ITO) // Womeninnano winter school : abstract book / Kobe, Spomenka (ur.).
Ljubljana: Institut Jožef Stefan, 2008. str. 46-47 (poster, međunarodna recenzija, sažetak, znanstveni) -
29.Tonejc Anđelka; Ivanda Mile; Tonejc AntunTEM and Raman scattering determination of nanocrystalline distributions of CdSxSe1-x nanoparticles embedded in glass matrix // Proceedings of 8th multinational congress on microscopy / Nebesarova jana ; Hozak Pavel (ur.).
Prag: Czechoslovak Microscopy Society, 2007. str. 315-316 (poster, međunarodna recenzija, sažetak, znanstveni) -
30.Tonejc, Anđelka; Ivanda MIle; Tonejc AntunIstraživanje CdSxSe1-x nanočestica u amorfnoj matrice elektronskom mikroskopijom i difrakcijom // KNJIGA SAŽETAKA, 5. Znanstveni sastanak Hrvatskog fizikalnog društva / Dulčić, Antonije (ur.).
Zagreb: Prirodoslovno-matematički fakultet Sveučilišta u Zagrebu, 2007. str. 40-40 (poster, domaća recenzija, sažetak, znanstveni) -
31.Popović, Jasminka; Gržeta, Biserka; Tkalčec, Emilija; Tonejc, Anđelka M.; Bijelić, Mirjana; Goebbert, ChristianEffect of tin level on particle size and strain in nanocrystalline ITO // Size-Strain V. Diffraction Analysis of the Microstructure of Materials : abstracts / Mittermeijer, Eric ; Leineweber, Andreas ; Welzel, Udo (ur.).
Garmisch-Partenkirchen: Max Planck Institute for Metals Research, 2007. str. 79-79 (poster, međunarodna recenzija, sažetak, znanstveni) -
32.Ivanda, Mile; Furić, Krešimir; Musić, Svetozar; Ristić, Mira; Gotić, Marijan; Ristić, Davor; Tonejc, Anđelka; Đerđ, Igor; Mattarelli, M.; Montagna, Maurizio et al.Low Wavenumber Raman Scattering of Nanoparticles and Nanocomposite Materials // Journal of Raman spectroscopy, 38 (2007), 6; 647-659 doi:10.1002/jrs.1723 (međunarodna recenzija, članak, znanstveni)
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33.Radić, Nikola; Dubček, Pavo; Bernstorff, Sigrid; Djerdj, Igor; Tonejc, AnđelkaStructural study of nanocrystalline nickel thin films // Journal of applied crystallography, 40 (2007), s1; 377-382 (međunarodna recenzija, članak, znanstveni)
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34.Ivanda, Mile; Tonejc, Anđelka M.; Djerdj, Igor; Montagna, M.; Ferrari, M.; Righini, G.; Berneschi, S.; Crnjak Orel, Z.; Schmitt, M.Raman scattering determination of size distribution of CdSxSe1-x nanoparticles embedded in glass matrix // Asian Journal of Physics, 15 (2006), 64-69 (podatak o recenziji nije dostupan, članak, znanstveni)
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35.M. Ivanda, A. M. Tonejc, I. Djerdj, M. Montagna, M. Ferrari, G. Righini, S. Berneschi, Z. Crnjak Orel, M. SchmittRaman scattering determination of size distribution of CdSxSe1-x nanoparticles embedded in glass matrix, 2006. (podatak o recenziji nije dostupan, popularni rad).
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36.Skoko, Željko; Popović, Stanko; Tonejc, Anđelka; Gajović, AndrejaMicrostructure and Thermal Properties of Al-44at% Zn and Al-48at% Zn Alloys // Zbornik radova / Gajović, Srećko (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2006. str. 138-139 (predavanje, domaća recenzija, prošireni sažetak, znanstveni) -
37.Djerdj, Igor; Tonejc Anđelka; Tonejc, AntunStructural investigations of nanocrystalline TiO2 samples // Electron Crystallography Novel Approaches for Structure Determination of Nanosized Materials Proceedings of the NATO Advanced Study Institute on Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials / Labar, Janos ; Weirich Thomas ; Zou, Xiaodong (ur.).
Erice, Italija: Springer, 2006. str. 497-501 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
38.Djerdj, Igor; Tonejc, Andjelka; Bijelić, Mirjana; Vraneša, Vladimir; Turković, AleksandraTransmission Electron Microscopy Studies of Nanostructured TiO2 Films on Various Substrates // 2nd Croatian Congress on Microscopy with International Participation : Proceedings / Gajović, Srećko (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2006. str. 120-121 (pozvano predavanje, domaća recenzija, sažetak, znanstveni) -
39.Tonejc, AnđelkaHRTEM Investigation of Nanocrystalline Materials // Electron Crystallography / Labar, Janos ; Weirich Thomas ; Zou, Xiaodong (ur.).
Dordrecht: Springer, 2006. str. 443-453 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
40.Gajović, Andreja; Djerdj, Igor; Furić, Krešimir; Su, Dangsheng; Tonejc, Antun; Tonejc, Anđelka M.; Musić, Svetozar; Schlögl, RobertMechanism of ZrTiO4 synthesis by mechanochemical processing of TiO2 and ZrO2 // Journal of the American Ceramic Society, 89 (2006), 7; 2196-2205 (međunarodna recenzija, članak, znanstveni)
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41.Djerdj, Igor; Tonejc, Anđelka; Bijelić, Mirjana; Buljan, Maja; Desnica, Uroš Vladan; Kalish, RafiTransmission electron microscopy study of carbon nanophases produced by ion beam implantation // Materials science & engineering. C, 26 (2006), 5/7; 1202-1206 doi:10.1016/j.msec.2005.09.015 (međunarodna recenzija, članak, znanstveni)
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42.Djerdj, Igor; Tonejc, AnđelkaStructural investigations of nanocrystalline TiO2 samples // Journal of alloys and compounds, 413 (2006), 1-2; 159-174 (međunarodna recenzija, članak, znanstveni)
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43.Djerdj, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, NikolaOn the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungsten thin films // Fizika A, 15 (2006), 1; 35-50 (podatak o recenziji nije dostupan, članak, znanstveni)
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44.Ivanda, Mile; Furić, Krešimir; Musić, Svetozar; Gotić, Marijan; Ristić, Mira; Turković, Aleksandra; Tonejc, Anđelka M.; Djerdj, Igor; Crnjak Orel, Zorica; Montagna, M. et al.Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles // Guang sanshe xuebao / Chinese Journal of Light Scattering, 17 (2005), 3; 245-248 (podatak o recenziji nije dostupan, članak, znanstveni)
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45.Djerdj, Igor; Tonejc, Anđelka M.; Bijelić, Mirjana; Vraneša, Vladimir; Turković, AleksandraTransmission electron microscopy studies of nanostructurd TiO2 films on different substrates // Vacuum, 80 (2005), 4; 371-378 doi:10.1016/j.vacuum.2005.06.015 (međunarodna recenzija, članak, znanstveni)
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46.Djerdj, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, NikolaXRD line profile analysis of tungsten thin films // Vacuum, 80 (2005), 1-3; 151-158 (međunarodna recenzija, članak, znanstveni)
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47.Ivanda, Mile; Furić, Krešimir; Musić, Svetozar; Gotić, Marijan; Ristić, Mira; Turković, Aleksandra; Tonejc, Anđelka; Djerdj, Igor; Crnjak, Orel, Zorica; Montagna, Maurizio et al.Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles // Proceedings of International Conference on Optoelectronics and Spectroscopy of Nano-Structured Thin films and Materials / Fang, Yan (ur.). (ur.).
Peking: Beijing Key Lab for Nano-Photonics, 2004. str. 47-48 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
48.Ivanda, Mile; Furić, Krešimir; Musić, Svetozar; Gotić, Marijan; Ristić, Mira; Turković, Aleksandra; Tonejc, Anđelka; Djerdj, Igor; Crnjak, Orel, Zorica; Montagna, Maurizio et al.Application of Raman scattering technique in determination of size distribution of different type of nanoparticles // Proceedings of the XIXth International Conference on Raman Spectroscopy / Fredericks, P.M. ; Frost, R.L. ; Rintoul, L. (ur.).
Brisbane, Australija: Viley, 2004. str. 615-616 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
49.Ivanda, Mile (predavač); Furić, Krešimir; Musić, Svetozar; Gotić, Marijan; Ristić, Mira; Turković, Aleksandra; Tonejc, Anđelka; Djerdj, Igor; Crnjak Orel, Zorica; Montagna, Maurizio et al.Raman Technique in Determination of Size Distribution of Oxide and Semiconductor Nanoparticles // Proceedings of International Conference on Optoelectronics and Spectroscopy of Nano-Structured Thin films and Materials, ICOSFM 2004 / Fang, Yan (ur.).
Peking: Beijing Key Lab for Nano-Photonics, 2004. str. 47-48 (pozvano predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
50.Ivanda, Mile; Musić, Svetozar; Gotić, Marijan; Ristić, Mira; Turković, Aleksandra; Tonejc, Anđelka; Djerdj, Igor; Crnjak, Orel, Zorica; Montagna, Maurizio; Ferrari, Maurizio et al.Determination of Size Distribution of Oxide and Semiconductor Nanoparticles by HRTEM and Raman Spectroscopy // Book of abstracts, XXVII European Congress on Molecular Spectroscopy (XXVII EUCMOS) / Handke, Miroslaw ; Hasik, Magdalena (ur.).
Krakov: Paluszkiewicz, Czeslawa, 2004. (predavanje, međunarodna recenzija, sažetak, znanstveni)
