Pregled po CROSBI profilu: Branko Pivac (CROSBI Profil: 19833, MBZ: 67912)
Pronađeno 231 radova
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201.Borjanović, Vesna; Kovačević, Ivana; Šantić, Branko; Pivac, BrankoOxygen-related deep levels in oxygen doped EFG poly-Si // Materials science and engineering B : solid state materials for advanced technology, 71 (2000), SI; 292-296 doi:10.1016/S0921-5107(99)00393-1 (međunarodna recenzija, članak, znanstveni)
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202.Vujičić, Miroslav; Borjanović, Vesna; Pivac, BrankoCarbon influence on gamma-irradiation induced defects in n-type CZ Si // Materials science and engineering B : solid state materials for advanced technology, 71 (2000), SI; 92-95 doi:10.1134/S0020168507110015 (međunarodna recenzija, članak, znanstveni)
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203.Pivac, Branko; Furić, Krešimir; Desnica-Franković, Dunja Ida; Borghesi, Alessandro; Sassella, A.Raman line profile in polycrystalline silicon // Journal of applied physics, 86 (1999), 8; 4383-4386 (međunarodna recenzija, članak, znanstveni)
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204.Pivac, Branko; Rakvin, Boris; Borghesi, A.; Sassella, A.; Bachetta, M.; Zanotti, L.;Nitrogen influence on dangling bond configuration in silicon-rich SiOx : N, H thin films // Journal of vacuum science and technology B, 17 (1999), 1; 44-48 (međunarodna recenzija, članak, znanstveni)
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205.Pivac, Branko; Etlinger, Božidar; Borjanović, VesnaOxigen Influence on Carbon Redistribution in Thermally Treated EFG Poly-Si // Peoceedings of the Int. Conf. held at Vienna, Austria / J. Schmid, H.A. Ossenbrik, P. Helm, H. Ehmann, E.D. Dunlop (ur.).
Beč: Joint Research Centre, 1998. str. 1657-1660 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
206.Vujičić, MiroslavIstraživanje defekata u siliciju kapacitivnom spektroskopijom, 1998., diplomski rad, Prirodoslovna-matematički fakultet, Zagreb
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207.Pivac, Branko; Etlinger, Božidar; Borjanović, VesnaOxygen influence on carbon redistribution in thermally treated EFG poly-Si // Proceedings of 2nd World Conference on Photovoltaic Solar Energy Conversion / Schmid, J. ; Ossenbrick, H.A. ; Helm, P. ; Ehman, H. ; Dunlop, E.D. (ur.).
Beč: Joint Research Centre, European Commision, 1998. str. 1657-1660 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
208.Pivac, Branko; Moguš-Milanković, Andrea; Day, D.E.Iron valence and coordination in phosphate glasses as studied by optical spectroscopy // Journal of non-crystalline solids, 226 (1998), 1-2; 41-46 doi:10.1016/S0022-3093(98)00367-6 (međunarodna recenzija, članak, znanstveni)
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209.Rakvin, Boris; Pivac, Branko; Tonini, R.; Corni, F.; Ottaviani, G.Electron paramagnetic evidence for reversible transformation of thermal donor into shallow donor-type center in hydrogen-implanted silicon // Applied physics letters, 73 (1998), 3250-3252 (međunarodna recenzija, članak, znanstveni)
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210.Rakvin, Boris; Pivac, Branko; Tonini, R.; Corni, F.; Ottaviani, G.Investigation of S2 Defect in H implanted CZ-Si by EPR // Magnetic resonance and related phenomena / Dieter Ziessow, Wolfgang Lubitz, Fridhelm Lendzian (ur.).
Berlin: Technische Universitat Berlin, 1998. str. 1103-1104 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
211.Pivac, BrankoStructure and defects in thin silicon oxynitride films // Extended Abstracts of 7th Joint Vacuum Conference of Hungary, Austria, Croatia and Slovenia / Bohatka S. (ur.).
Deberecen, 1997. (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni) -
212.Rakvin, Boris; Pivac, Branko; Reitano, R.Electron paramagnetic Resonance Study of Amorphous Silicon Produced by Kr^+ Ion Implantation into Silicon // Journal of applied physics, 81 (1997), 8; 3453-3456 (međunarodna recenzija, članak, znanstveni)
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213.Moguš-Milanković, Andrea; Pivac, Branko; Furić, Krešimir; Day, Delbert E.Structural study of iron phosphate glasses // Physics and chemistry of glasses, 38 (1997), 2; 74-78 (međunarodna recenzija, članak, znanstveni)
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214.Pivac, Branko; Rakvin, Boris; Corni, F.; Tonini, R.; Ottaviani, G.EPR study of defect formation in H implanted and annealed CZ Si // Defects in electronic materials II / Michel, J ; Kennedy, T ; Wada, K ; Thonke, K. (ur.).
Pittsburgh (PA): Materials Research Society, 1997. str. 293-298 -
215.Guizzetti, G.; Marabelli, F.; Patrini, M.; Pelegrino, P.; Pivac, Branko; Miglio, L.; Meregalli, V.; Lange, H.; Henrion, W.; Tomm, V.Measurement and simulation of anisotropy in the infrared and Raman spectra of beta-FeSi2 single crystals // Physical review B : condensed matter, 55 (1997), 14290-14297 (međunarodna recenzija, članak, znanstveni)
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216.Sassella, Adele; Borghesi Alessandro; Corni, F.; Monelli, A.; Ottaviani, G.; Tonini, R; Pivac, Branko; Baccetta, M.; Zanotti, L.Infrared study of Si-rich silicon oxide films deposited by plasma-enhanced chemical vapor deposition // Journal of vacuum science and technology A, 15 (1997), 377-389 (međunarodna recenzija, članak, znanstveni)
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217.Mahfoud, Khalid; Pivac, Branko; Muller, J.C.P/Al co-gettering effectiveness in various polycrystalline silicon // Solar energy materials and solar cells, 46 (1997), 2; 123-131 (međunarodna recenzija, članak, znanstveni)
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218.Pivac, Branko; Sassella, Adele; Borghesi, AlessandroInfrared study of oxygen segregation at structural defects in polycrystalline silicon // Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference / Mink, János ; Keresztury, Gábor ; Kellner, Robert (ur.).
Beč: Springer Vienna, 1997. str. 485-487 doi:10.1007/978-3-7091-6840-0_116 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
219.Sassella, Adele; Borghesi, Alessandro; Pivac, BrankoCross-sectional infrared transmission measurements for highly sensitive thin-film characterization // Progress in Fourier Transform Spectroscopy : proceedings of the 10th International Conference / Mink, János ; Keresztury, Gábor ; Kellner, Robert (ur.).
Beč: Springer Vienna, 1997. str. 343-344 doi:10.1007/978-3-7091-6840-0_77 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
220.Pivac, Branko; Furić, Krešimir; Milun, Milorad; Valla, Tonica; Borghesi, Alessandro; Sassella, AdeleSpectroscopic study of SiC-like structures formed on polycrystalline silicon sheets during growth // Journal of applied physics, 75 (1994), 7; 3586-3592 doi:10.1063/1.356993 (međunarodna recenzija, članak, znanstveni)
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221.Pivac, Branko; Rakvin, Boris; Pavesi, L.Paramagnetic centers at and near the Si/SiOx interface in porous silicon // Applied physics letters, 65 (1994), 25; 3260-3262 doi:10.1063/1.112430 (međunarodna recenzija, članak, znanstveni)
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222.Pivac, Branko; Rakvin, Boris, Pavesi, L.Radiation effects on porous silicon // Journal of Luminescence, 57 (1993), 1-6; 227-229 (međunarodna recenzija, članak, znanstveni)
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223.Dubček, Pavo; Etlinger, Božidar; Pivac, Branko; Kranjčec, MladenInfrared investigation of phonon modes in (GaxIn1-x)2Se3 solid-solution in the 0.10 less-than-or-equal-to X less-than-or-equal-to 0.40 concentration range // Solid state communications, 81 (1992), 9; 735-737 doi:10.1016/0038-1098(92)90779-9 (međunarodna recenzija, članak, znanstveni)
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224.Pivac, Branko; Borghesi, A.; Moscardini, M.; Bottazzi, P.; Desnica, UrošSiC-like structures in edge-defined film-fed growth polysilicon ribbons // Journal of Materials Science Letters, 9 (1990), 4; 397-399 doi:10.1007/BF00721010 (međunarodna recenzija, članak, znanstveni)
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225.Pivac, Branko; Desnica, Uroš V.Influence of high-temperature thermal treatment on edge-defined film-fed growth silicon // Journal of applied physics, 65 (1989), 12; 4759-4762 doi:10.1063/1.343229 (međunarodna recenzija, članak, znanstveni)
