Pregled po CROSBI profilu: Ivana Capan (CROSBI Profil: 17649, MBZ: 239373)
Pronađeno 141 radova
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51.Martin-Sanchez, J.; Chahboun, A.; Gomes, M.J.M.; Rolo, A.G.; Pivac, Branko; Capan, IvanaCarrier storage in Ge nanoparticles produced by pulsed laser deposition // Physica status solidi-rapid research letters, 6 (2012), 5; 223-225 doi:10.1002/pssr.201206104 (međunarodna recenzija, članak, znanstveni)
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52.Tomas, Antonia; Falandys, Slaven; Borjanović, Vesna; Jakovljević, Suzana; Schauperl, Zdravko; Capan, Ivana; Bistričić, Lahorija; Pivac, BrankoNiskotemperaturni rast ZnO nanocijevi na siliciju, aluminiju i polimernoj podlozi // Knjiga sažetaka-7. znanstveni sastanak HFD-a / Andreja Gajović, Vedrana Tokić, Maja Zorić, Tomislav Maruščak (ur.).
Zagreb: Hrvatsko filozofsko društvo, 2011. str. 185-185 (poster, domaća recenzija, sažetak, znanstveni) -
53.Capan, Ivana; Bak-Misiuk, Jadwiga; Pivac, Branko; Dubček, Pavo; Misiuk, Andrzej; Bernstorff, Sigrid; Romanowski, P.Defects in silicon introduced by helium implantation and subsequent annealing // Radiation physics and chemistry, 80 (2011), 10; 1099-1103 doi:10.1016/j.radphyschem.2011.02.006 (međunarodna recenzija, članak, znanstveni)
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54.Pastuović, Željko; Vittone, Ettore; Capan, Ivana; Jakšić, Milko;Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation // Applied physics letters, 98 (2011), 9; 092101, 3 doi:10.1063/1.3559000 (međunarodna recenzija, članak, znanstveni)
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55.Capan, Ivana; Pivac, Branko; Slunjski, RobertElectrical characterisation of Si-SiO2 structures // Physica status solidi. C, Current topics in solid state physics, 8 (2011), 3; 816-818 doi:10.1002/pssc.201000076 (međunarodna recenzija, članak, znanstveni)
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56.Slunjski, Robert; Capan, Ivana; Pivac, Branko; Le Donne, Alessia; Binetti, Simona;Effects of low-temperature annealing on polycrystalline silicon for solar cells // Solar energy materials and solar cells, 95 (2011), 2; 559-563 doi:10.1016/j.solmat.2010.09.016 (međunarodna recenzija, članak, znanstveni)
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57.Buljan, Maja; Grenzer, J.; Holý, V.; Radić, Nikola; Mišić-Radić, Tea; Levichev, S.; Bernstorff, S.; Pivac, Branko; Capan, IvanaStructural and charge trapping properties of two bilayer (Ge+SiO2)/SiO2 films deposited on rippled substrate // Applied physics letters, 97 (2010), 16; 63117-63119 doi:10.1063/1.3504249 (međunarodna recenzija, članak, znanstveni)
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58.Capan, Ivana; Buljan, Maja; Mišićc-Radic, Tea; Pivac, Branko; Radić, Nikola; Grenzer, Joerg; Holy, Vaclav; Levichev, Sergey; Bernstorff, SigridElectrical Characterization of Ge Nanocrystals in Oxide Matrix // MRS Online Proceedings Library
Boston (MA), Sjedinjene Američke Države: Cambridge University Press, 2010. str. 1-1 doi:10.1557/opl.2011.298 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
59.Kovačević, Goran; Lipić, Tomislav; Skala, Karolj; Capan, Ivana; Pivac, Branko;Breakdown simulation in thin dielectric films based on DLA model // E-MRS 2010 Spring Meeting BOOK OF ABSTRACTS
Strasbourg, 2010. (poster, međunarodna recenzija, sažetak, znanstveni) -
60.Capan, Ivana; Pivac, BrankoElectrical characterization of Si-SiO2 structures // E-MRS 2010 Spring Meeting BOOK OF ABSTRACTS
Strasbourg, 2010. (poster, međunarodna recenzija, sažetak, znanstveni) -
61.Buljan, Maja; Dubček, Pavo; Radić, Nikola; Capan, Ivana; Desnica, Uroš V.; Bernstorff, Sigrid; Holý, Vaclav; Pivac, Branko;A comparative study of self ordering growth of silicon and germanium quantum dots in amorphous matrix // E-MRS 2010 Spring Meeting, BOOK OF ABSTRACTS
Strasbourg, 2010. (predavanje, međunarodna recenzija, sažetak, znanstveni) -
62.Novoselnik, Branimir; Pilipovic, Marko; Jaćimović, Radojko; Pivac, Branko; Slunjski, Robert; Capan, IvanaCapacitance changes in neutron irradiated n-type silicon: The flux effect // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 268 (2010), 15; 2400-2402 doi:10.1016/j.nimb.2010.04.017 (međunarodna recenzija, članak, znanstveni)
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63.Slotte, J.; Kuitunen, K.; Kilpeläinen, S.; Tuomisto, F.; Capan, IvanaDivacancies at room temperature in germanium // Thin solid films, 518 (2010), 9; 2314-2316 doi:10.1016/j.tsf.2009.09.183 (međunarodna recenzija, članak, znanstveni)
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64.Capan, Ivana; Pivac, Branko; Hawkins, I. D.; Markevich, V. P.; Peaker, A. R.; Dobaczewski, L.; Jačimović, RadojkoNeutron-irradiation-induced defects in germanium: A Laplace deep level transient spectroscopy study // Vacuum, 84 (2009), 1; 32-36 doi:10.1016/j.vacuum.2009.04.003 (međunarodna recenzija, članak, znanstveni)
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65.Capan, Ivana; Dubček, Pavo; Buljan, Maja; Desnica, Uroš; Slunjski, Robert; Krstulović, Nikša; Kregar, Zlatko; Milošević, Slobodan; Radić, Nikola; Zorc, Hrvoje et al.Nanostructures for the next generation semiconductor devices // Zbronik sažetaka, Croatian-Japanese Workshop on Advanced Materials Science / Gumhalter, Branko ; Tadić, Tonči (ur.).
Zagreb, 2009. str. 15-15 (predavanje, sažetak, znanstveni) -
66.Pivac, Branko; Dubček, Pavo; Capan, Ivana; Zulim, Ivan; Betti, Tihomir; Zorc, Hrvoje; Bernstorff, SigridNano Si Superlattices for the Next Generation Solar Cells // Journal of Nanoscience and Nanotechnology, 9 (2009), 6; 3853-3857 doi:10.1166/jnn.2009.NS79 (međunarodna recenzija, članak, znanstveni)
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67.Dubček, Pavo; Pivac, Branko; Capan, Ivana; Radić, Nikola; Zorc, Hrvoje; Bernstorff, SigridGrowth of Ge nanostructures with different methods // Proceedings of ICTF14 & RSD2008 / De Gryse, Roger ; Depla, Diederik ; Poelman, D. ; Mahieu, S. ; Leroy, W.P. ; Poelman, H. (ur.).
Ghent: University of Ghent, 2008. str. 264-264 (poster, međunarodna recenzija, sažetak, znanstveni) -
68.Capan, Ivana; Pivac, Branko; Markevich, V.P.; Peaker, A.R.; Jačimović, R.;Laplace Transform Spectroscopy Studies of Radiation Induced Defects in Germanium // Programme & Book of abstracts of the 12th JVC, 10th EVC, and 7th Annual Meeting of GVS / Bohatka, S. (ur.).
Deberecen: REXPO Kft., 2008. str. 139-139 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni) -
69.Slunjski, Robert; Capan, Ivana; Jakšić, Milko; Pivac, Branko;Radiation defects in EFG polycrystalline Si for solar cells // Programme & Book of abstracts of the 12th JVC, 10th EVC, and 7th Annual Meeting of GVS / Bohatka, S. (ur.).
Deberecen: REXPO Kft., 2008. str. 120-120 (poster, međunarodna recenzija, sažetak, znanstveni) -
70.Pivac, Branko; Dubček, Pavo; Capan, Ivana; Slunjski, Robert; Radić, Nikola; Zorc, Hrvoje; Bernstorff, S.;Nano Si layers for solar cell application // Programme & Book of abstracts of the 12th JVC, 10th EVC, and 7th Annual Meeting of GVS / Bohatka, S. (ur.).
Deberecen: REXPO Kft., 2008. str. 48-48 (poster, međunarodna recenzija, sažetak, znanstveni) -
71.Markevich, V.P.; Capan, Ivana; Khan, M.K.; Rana, M.A.; Hawkins, I.D.; Peaker, A.R.; Litvinov, V.VAntimony-vacancy complexes in irradiated and annealed Ge crystals // Book of abstracts FROM E-MRS 2008 Spring Meeting
Strasbourg, 2008. str. J-4 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
72.Rana, M.A.; Markevich, V.; Hawkins, I.D.; Slotte, J.; Kuitunen, K.; Tuomisto, I.; Capan, Ivana; Pivac, Branko; Jačimović, Radojko; Peaker, A.R.;Vacancy cluster formation in implanted and in neutron irradiated germanium // Book of abstracts
Strasbourg, 2008. str. j-3 (poster, međunarodna recenzija, sažetak, znanstveni) -
73.Wieteska, K.; Misiuk, A.; Wierzchowski, W.; Bak-Misiuk, J.; Romanowski, P.; Surma, B.; Capan, Ivana; Yang, D.; Shalimov, A.; Graeff, W.; Prujszczyk, M.Revealing the Defects Introduced in N- or Ge-doped Cz-Si by gamma Irradiation and High Temperature-High Pressure Treatment // Acta Physica Polonica. A, 114 (2008), 2; 439-446 doi:10.12693/APhysPolA.114.439 (međunarodna recenzija, članak, znanstveni)
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74.Kuitunen, K.; Tuomisto, F.; Slotte, J.; Capan, IvanaDivacancy clustering in neutron-irradiated and annealed n-type germanium // Physical review. B, Condensed matter and materials physics, 78 (2008), 3; 033202, 4 doi:10.1103/PhysRevB.78.033202 (međunarodna recenzija, članak, znanstveni)
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75.Pivac, Branko; Dubček, Pavo; Capan, Ivana; Zorc, Hrvoje; Bernstorff, S.; Duguay, S.; Slaoui, A.;Structural analysis of annealed amorphous SiO/SiO2 superlattice // Thin Solid Films, 516 (2008), 20; 6796-6799 doi:10.1016/j.tsf.2007.12.005 (međunarodna recenzija, članak, znanstveni)
