Pregled po CROSBI profilu: Ivana Capan (CROSBI Profil: 17649, MBZ: 239373)
Pronađeno 141 radova
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26.Radulović, Vladimir; Ambrožič, Klemen; Snoj, Luka; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Pastuović, Željko; Sarbutt, Adam; Ohshima, Takeshi; Yamazaki, Yuichi; Coutinho, JoséE-SiCure Collaboration Project: Silicon Carbide Material Studies and Detector Prototype Testing at the JSI TRIGA Reactor // NENE 2018 - The 27th International Conference Nuclear Energy for New Europe
Portorož, Slovenija, 2018. 702, 1 (radionica, podatak o recenziji nije dostupan, sažetak, znanstveni) -
27.Capan, Ivana; Brodar, Tomislav; Coutinhi, Jose; Ohshima, Takeshi; Markevich, Vladimir; Peaker, AnthonyAcceptor levels of the carbon vacancy in 4H-SiC: Combining Laplace deep level transient spectroscopy with density functional modeling // Journal of applied physics, 124 (2018), 24; 245701, 10 doi:10.1063/1.5063773 (međunarodna recenzija, članak, znanstveni)
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28.Brodar, Tomislav; Capan, Ivana; Radulovic, Vladimir; Snoj, Luka; Pastuović, Željko; Coutinho, Jose; Ohshima, TakeshiLaplace DLTS study of deep defects created in neutron-irradiated n-type 4H-SiC // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 437 (2018), 1; 27-31 doi:10.1016/j.nimb.2018.10.030 (međunarodna recenzija, članak, znanstveni)
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29.Knežević, Tihomir; Nanver, Lis K.; Capan, Ivana; Suligoj, TomislavNon-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures // Proceedings of the 41st International Convention MIPRO 2018 / Biljanovic, Petar (ur.).
Rijeka: Institute of Electrical and Electronics Engineers (IEEE), 2018. str. 12-17 doi:10.23919/mipro.2018.8399822 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
30.Mozetič, M.; Vesel, A.; Primc, G.; Eisenmenger-Sittner, C.; Bauer, J.; Eder, A.; Schmid, G.H.S.; Ruzic, D.N.; Ahmed, Z.; Barker, D. et al.Recent developments in surface science and engineering, thin films, nanoscience, biomaterials, plasma science, and vacuum technology // Thin solid films, 660 (2018), 120-160 doi:10.1016/j.tsf.2018.05.046 (međunarodna recenzija, članak, znanstveni)
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31.Capan, Ivana; Brodar, Tomislav; Pastuović, željko; Ohshima, Takeshi; Snoj, Luka; Radulović, Vladimir; Coutinho, Jose; Demouche, KamelDouble negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study // Journal of applied physics, 123 (2018), 16; 161597, 37 doi:10.1063/1.5011124 (međunarodna recenzija, članak, znanstveni)
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32.Krstulović, Nikša; Salamon, Krešimir; Budimlija, Ognjen; Kovač, Janez; Dasović, Jasna; Umek, Polona; Capan, IvanaParameters optimization for synthesis of Al- doped ZnO nanoparticles by laser ablation in water // Applied surface science, 440 (2018), 916-925 doi:10.1016/j.apsusc.2018.01.295 (međunarodna recenzija, članak, znanstveni)
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33.Brodar, TomislavElektrički aktivni defekti u 4H-SiC uvedeni zračenjem, 2017., diplomski rad, diplomski, Prirodoslovno matematički fakultet, Zagreb
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34.Pastuović, Željko; Siegele, Rainer; Capan, Ivana; Brodar, Tomislav; Sato, Shin-icihiro; Ohshima, TakeshiDeep level defects in 4H-SiC introduced by ion implantation: the role of single ion regime // Journal of physics. Condensed matter, 29 (2017), 47; 475701, 6 doi:10.1088/1361-648X/aa908c (međunarodna recenzija, članak, znanstveni)
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35.Krstulović, Nikša; Umek, Polona; Salamon, Krešimir; Capan, IvanaSynthesis of Al-doped ZnO nanoparticles by laser ablation of ZnO:Al2O3 target in water // Materials Research Express, 4 (2017), 105003, 5 doi:10.1088/2053-1591/aa896d (međunarodna recenzija, članak, znanstveni)
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36.Blažeka, Damjan; Capan, Ivana; Ohshima, Takeshi; Sato, Shin-ichiro; Makino, Takahiro; Snoj, Luka; Radulović, Vladimir;Transport properties of neutron-irradiated 4H-SiC Schottky diode // Scientific program & book of abstracts : 7th Central European Symposium on Plasma Chemistry / Milošević, Slobodan ; Krstulović, Nikša (ur.).
Zagreb: LDK-PROMET d.o.o., 2017. str. 122-122 (poster, sažetak, znanstveni) -
37.Blažeka, Damjan; Brodar, Tomislav; Capan, Ivana; Ohshima, Takeshi; Sato, Shin-ichiro; Makino, Takahiro; Snoj, Luka; Radulović, Vladimir;Usporedba transportnih svojstava Si i 4H-SiC detektora // 24th International Scientific Meeting on Vacuum Science and Technique, Book of abstracts / Buljan, Maja ; Karlušić, Marko (ur.).
Zagreb: Hrvatsko Vakuumsko Društvo (HVD), 2017. str. 20-20 (poster, sažetak, znanstveni) -
38.Damjan, BlaženkaTransportna svojstva poluvodičkih detektora, 2017., diplomski rad, diplomski, Prirodoslovno-matematički fakultet, Zagreb
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39.Krstulović, Nikša; Salamon, Krešimir; Umek, Polona; Capan, IvanaSynthesis of Al-doped ZnO nanoparticles by pulsed laser ablation in water medium // 24th International Scientific Meeting on Vacuum Science and Technique : book of abstracts / Buljan, Maja ; Marko, Karlušić (ur.).
Zagreb: Ars Kopija, 2017. str. 25-25 (poster, sažetak, znanstveni) -
40.Capan, Ivana; Carvalho, Aleksandra; Coutinho, JoseAn Outlook on Silicon Nanocrystals for Optoelectronics // Journal of Green Engineering, 5 (2016), 3-4; 49-70 doi:10.13052/jge1904-4720.5344 (međunarodna recenzija, članak, znanstveni)
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41.Capan, Ivana; Pastuović, Željko; Siegele, Rainer; Jaćimović, RadojkoVacancy-related defects in n-type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV range // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 372 (2016), 156-160 doi:10.1016/j.nimb.2015.12.039 (međunarodna recenzija, članak, znanstveni)
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42.Pastuović, Željko; Capan, Ivana; David D. Cohen; Jacopo, Forneris; Naoya, Iwamoto; Takeshi, Ohshima; Rainer, Siegele; Norihiro, Hoshino; Tsuchida, HidekazuRadiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeam // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 348 (2015), 233-239 doi:10.1016/j.nimb.2014.12.064 (međunarodna recenzija, članak, znanstveni)
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43.Lešić, Nikolina; Budimlija, Ognjen; Krstulović, Nikša; Bišćan, Marijan; Umek, Polona; Capan, IvanaZnO Nanoparticles Produced by Pulsed Laser Ablation in Water Media for UV Protective Coatings // 22nd International Scientific Meeting on Vacuum Science and Technique / Janez Kovač, Gregor Jakša (ur.).
Ljubljana: Infokart d.o.o., 2015. str. 32-32 (poster, sažetak, znanstveni) -
44.Capan, Ivana; Carvalho, Alexandra; Coutinho, JoseSilicon and germanium nanocrystals: properties and characterization // Beilstein journal of nanotechnology, 5 (2014), 1787-1794 doi:10.3762/bjnano.5.189 (međunarodna recenzija, pregledni rad, znanstveni)
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45.Pastuović, Željko; Capan, Ivana; ...; Vittone, EttoreGeneration of vacancy cluster-related defects during single MeV silicon ion implantation of silicon // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 332 (2014), 298-302 doi:10.1016/j.nimb.2014.02.082 (međunarodna recenzija, članak, znanstveni)
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46.Martín-Sánchez, J.; Capan, Ivana; ...; Gomes, M.J.M.Shadowed off-axis production of Ge nanoparticles in Ar gas atmosphere by pulsed laser deposition: Morphological, structural and charge trapping properties // Applied surface science, 280 (2013), 632-640 doi:10.1016/j.apsusc.2013.04.170 (međunarodna recenzija, članak, znanstveni)
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47.Pivac, Branko; Dubček, Pavo; Capan, Ivana; Zorc, Hrvoje; Dasović, Jasna; Bernstorff, Sigrid; Wu, Marvin; Vlahovic, BranislavGISAXS study of Si nanostructures in SiO2 matrix for solar cell applications // Physica status solidi. A, Applications and materials science, 210 (2013), 4; 755-759 doi:10.1002/pssa.201200527 (međunarodna recenzija, članak, znanstveni)
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48.Dasović, Jasna; Capan, Ivana; Radić, Nikola; Pivac, BrankoEvolution of photoluminescence during the formation of Si nanoparticles in SiOx matrix // JVC14/ EVC12/ AMDVG11/ CroSloVM19 Programme and Book of Abstracts / Radić, Nikola ; Milošević, Slobodan (ur.).
Zagreb: Hrvatsko Vakuumsko Društvo (HVD), 2012. str. 150-150 (poster, međunarodna recenzija, sažetak, znanstveni) -
49.Vieira, E.M.F.; ...; Buljan, Maja; Capan, Ivana; ...; Gomes, M.J.M.Structural and electrical studies of ultrathin layers with Si0.7Ge0.3 nanocrystals confined in a SiGe/SiO2 superlattice // Journal of applied physics, 111 (2012), 10; 104323-1 doi:10.1063/1.4722278 (međunarodna recenzija, članak, znanstveni)
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50.Capan, Ivana; Janicki, Vesna; Jaćimović, Radojko; Pivac, BrankoC–V and DLTS studies of radiation induced Si–SiO2 interface defects // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 282 (2012), 1; 59-62 doi:10.1016/j.nimb.2011.08.065 (međunarodna recenzija, članak, znanstveni)
