Pregled po CROSBI profilu: Igor Đerđ (CROSBI Profil: 16764, MBZ: 225002)
Pronađeno 248 radova
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226.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunStructural investigations of nanocrystalline TiO2 samples // Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials / Labar, Janos ; Weirich Thomas ; Zou, Xiaodong (ur.).
Erice: Ettore Majorama Foundation centre and Centre for Scienticic Culture, 2004. str. 1-1 (poster, međunarodna recenzija, sažetak, znanstveni) -
227.Djerdj, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, NikolaXRD analysis of tungsten thin films // 10th joint vacuum conference : Program and book of abstracts / Mozetic, M. ; Šetina, J. ; Kovač, J. (ur.).
Ljubljana: Društvo za vakuumsko tehniko Slovenije, 2004. str. 28-28 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
228.Ivanda, M.; Furić, K.; Musić, S.; Gotić, M.; Desnica, U.; Tonejc, A.M.; Djerdj, I.Ramanova spektroskopija u istraživanju nanostruktura // Zbornik Četvrtog sastanka Hrvatskog fizikalnog društva / Krešimir Kumerički (ur.).
Zagreb: Hrvatsko fizikalno društvo, 2003. str. 121-121 (poster, domaća recenzija, sažetak, znanstveni) -
229.Djerdj, IgorStrukturna ispitivanja nanokristalnog titanovog dioksida, 2003., doktorska disertacija, Prirodoslovno-matematički fakultet, Zagreb
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230.Skoko, Željko; Djerdj, Igor; Popović, Stanko; Tonejc, AnđelkaMicrostructure of Al-Zn Alloys // Proceedings of 6th multinational congress on microscopy. / O. Milat, D. Ježek (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2003. str. 221-222 (poster, međunarodna recenzija, sažetak, znanstveni) -
231.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunThe calculation of the average grain size of nanocrystalline titania by means of electron microscopy and XRD // Proceedings of 6th Multinational Congress on Microscopy-European Extension / Milat, Ognjen ; Ježek, Davor (ur.).
Zagreb: Hrvatsko mikroskopijsko društvo, 2003. str. 221-222 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
232.Djerdj, Igor; Tonejc, Anđelka; Tonejc, AntunThe Rietveld refinement of XRD data obtained on nanocrystalline TiO2 // Twelfth Croatian-Slovenian Crystallographic meeting, Book of abstracts / Cetina, Mario ; Kajfež, Tanja ; Popović, Stanko ; Štefanić, Zoran (ur.).
Zagreb: Croatian Academy of Sciencies and Arts and Croatian Crystallographic Association, 2003. (predavanje, sažetak, znanstveni) -
233.Tonejc, Anđelka; Djerdj, IgorHRTEM processing investigation of nanocrystalline materials // Proceedings of 6th multinational congress on microscopy-European Extension / Milat, Ognjen ; Ježek, Davor (ur.) (ur.).
Zagreb: Croatian society for electron microscopy, 2003. str. 213-214 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
234.Radić, Nikola; Tonejc, Antun; Tonejc, Anđelka; Djerdj, Igor; Furlan, Andrej; Panjan, Peter; Čekada, Miha; Jakšić, Milko; Medunić, Zvonkobeta -W faza u tankim filmovima - posljedica naprezanja ili kisika u filmu? // Zbornik Povzetkov / Jenko, M. (ur.).
Ljubljana: Društvo za vakuumsko tehniko slovenije, 2003. str. 9-9 (poster, sažetak, znanstveni) -
235.Ivanda, Mile; Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Mariotto, Gino; Montagna, MaurizioDetermination of nanosized particles distribution by low freqyency Raman scattering: Comparison to electron microscopy // Lecture Notes in Physics: Nanoscale Spectroscopy and Its Applications to Semiconductor Research / Heun, S. ; Salviati, G. ; Watanabe, Y. (ur.).
Heidelberg: Springer, 2002. str. 24-36 -
236.Tonejc, Antun; Radić, Nikola; Djerdj, Igor; Tonejc, Anđelka; Ivkov, JovicaObservation of amorphous tungsten in "bulk" thin films deposited by magnetron sputtering technique // Book of Abstracts / Leban, Ivan (ur.).
Ljubljana: Faculty of Chemistry and Chemical Technology, Univ. of Ljubljana, 2002. (poster, sažetak, znanstveni) -
237.Tonejc, Antun; Djerdj, Igor; Tonejc, Anđelka; Radić, NikolaThe comparison of various methods for extraction of size-strain data from XRD powder pattern of thin films // Book of Abstracts / Leban, Ivan (ur.).
Ljubljana: Faculty of Chemistry and Chemical Technology, Univ. of Ljubljana, 2002. (poster, međunarodna recenzija, sažetak, znanstveni) -
238.Ivanda, Mile; Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Mariotto, Gino; Montagna, MaurizioDetermination of nanosized particles distribution by low frequency Raman scattering: Comparison to electron microscopy // Nanoscale spectroscopy and its applications to semiconductor research / Watanabe, Y. ; Heun, S. ; Salviati, G. ; Yamamoto, N. (ur.).
Heidelberg: Springer, 2002. str. 16-27 (poster, sažetak, znanstveni) -
239.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunStructure of ball milled ZrO2 and ZrO2-10 mol % Y2O3 powders revealed by HRTEM image processing // Fizika A, 10 (2001), 177-190 (podatak o recenziji nije dostupan, članak, znanstveni)
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240.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunAn analysis of evolution of grain size-lattice parameter dependence in nanocrystalline TiO2 anatase // Materials Science & Engineering C, 19 (2001), 1-2; 85-89 (međunarodna recenzija, članak, znanstveni)
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241.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunEvidence from HRTEM image processing, XRD and EDS on nanocrystalline iron-doped titanium oxide powders // Materials Science and Engineering B, 85 (2001), 55-63 (međunarodna recenzija, članak, znanstveni)
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242.Ivanda, Mile (predavač); Tonejc, Anđelka M.; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Mariotto, GinoComparison of high resolution transmission electron microscopy and low frequency Raman scattering in determination of particles size distribution of nanosized TiO2 // Abstracts Book of the 1st International workshop on nanoscale spectroscopy and its applications to semiconductor research / Heun, Stefano (ur.).
Trst: Elettra Sincrotrone Trieste, 2000. str. 48-48 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni) -
243.Tonejc, Anđelka; Djerdj, Igor; Tonejc, AntunHRTEM image processing analysis of nanocrystalline iron-titanium powders // Proceedings 12th european congress on electron microscopy / Frank, Ludek ; Čiampor, Fedor (ur.).
Brno: Czechslovak Society for Electron Microscopy, 2000. str. 303-304 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
244.Hršak, Damir; Sučik, Gabriel; Kuffa, Tarzicius; Djerdj, IgorSilicon nitride as advanced ceramic material // Zbornik sažetaka s 4. međunarodnog simpozija Hrvatskog metalurškog društva, Metalurgija 39(2000), 3 ; 191-224 / Mamuzić, Ilija (ur.).
Zagreb: Hrvatsko metalurško društvo, 2000. str. 204-204 (poster, međunarodna recenzija, sažetak, ostalo) -
245.Hršak, Damir; Djerdj, Igor; Tomičić, TitoSilicon Nitride - Material of Future // Nonmetal Inorganic Materials ; Manufacturing-Processing-Application ; Proceedings / Karić, Asim (ur.).
Zenica: Faculty for Metallurgy and Materials Science in Zenica, 2000. str. 27-33 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), stručni) -
246.Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Popović, Stanko; Tonejc, AntunXRD, TEM and HRTEM study of iron doped TiO2 // 8th Croatian-Slovenian Crystallographic Meeting-Book of Abstracts / Popović, Stanko (ur.).
Zagreb: Croatian Crystallographic association, 1999. (predavanje, domaća recenzija, sažetak, znanstveni) -
247.Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Musić, Svetozar; Popović, Stanko; Tuđa, MarijanTEM, HREM, SEM and XRD study of iron doped TiO2 // Proceedings of the 1st congress of the croatian society for electron microscopy / Vranešić, Đuro (ur.).
Zagreb: Croatian electron microscopy society, 1999. str. 84-85 (poster, domaća recenzija, cjeloviti rad (in extenso), znanstveni) -
248.Tonejc, Anđelka; Djerdj, Igor; Gotić, Marijan; Tudja, Marijan; Popović, Stanko; Tonejc, Antun; Musić, SvetozarTEM, HRTEM, SEM and X-ray diffraction study of iron doped TiO2 // Proceedings of 4th multinational congress on electron microscopy
Veszprém: University of Veszprem, 1999. str. 375-376 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
