Pregled po CROSBI profilu: Ivančica Bogdanović Radović (CROSBI Profil: 14188, MBZ: 180511)
Pronađeno 256 radova
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51.Identifikacija i molekularno mapiranje modernih slikarskih materijala pomoću MeV SIMS metode s primjenom u forenzici, 2018., diplomski rad, diplomski, Prirodoslovno matematički fakultet, Zagreb
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52.Helium load on W-O coatings grown by pulsed laser deposition // Surface & coatings technology, 355 (2018), 215-221 doi:10.1016/j.surfcoat.2018.02.089 (međunarodna recenzija, članak, znanstveni)
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53.Opportunities for ion track studies at small and medium size accelerator facilities // SHIM-ICACS 2018 : Book of abstracts / Ban d'Etat, Brigitte ; Monnet, Isabelle ; Rothard, Hermann ; Vickridge, Ian (ur.).
Caen, 2018. str. 43-43 (poster, međunarodna recenzija, sažetak, znanstveni) -
54.Surface analysis and depth profiling using time-of-flight elastic recoil detection analysis with argon sputtering // Scientific Reports, 8 (2018), 10392, 6 doi:10.1038/s41598-018-28726-x (međunarodna recenzija, članak, znanstveni)
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55.Measurements of Particle-Induced Gamma Ray Emission (PIGE) cross sections // Development of a Reference Database for Particle Induced Gamma Ray Emission (PIGE) Spectroscopy / Nuclear Data Section (ur.).
Beč: International Atomic Energy Agency (IAEA), 2017. str. 61-199 -
56.Determination of deposition order of blue ballpoint pen lines by MeV Secondary Ion Mass Spectrometry // Forensic Chemistry, 7 (2017), 75-80 doi:10.1016/j.forc.2017.10.004 (međunarodna recenzija, članak, znanstveni)
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57.Ge/Si core/shell quantum dots in alumina: tuning the optical absorption by the core and shell size // Nanophotonics, 6 (2017), 5; 1055-1062 doi:10.1515/nanoph-2016-0133 (međunarodna recenzija, članak, znanstveni)
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58.Nanostrukturiranje površina i 2D materijala koristeći snopove brzih teških iona: osnove i primjene // 10. znanstveni sastanak Hrvatskog fizikalnog društva : knjiga sažetaka / Smolčić, Varnesa ; Ban, Ticijana ; Bilušić, Ante ; Horvatić, Vlasta ; Jelić, Vibor ; Karuza, Marin ; Kralj, Marko ; Kumerički, Krešimir ; Nesti, Fabrizio ; Stanić, Denis (ur.).
Zagreb: Hrvatsko Fizikalno Društvo, 2017. str. 33-33 (predavanje, domaća recenzija, sažetak, znanstveni) -
59.Plasma–wall interaction studies within the EUROfusion consortium: progress on plasma-facing components development and qualification // Nuclear fusion, 57 (2017), 116041-1 doi:10.1088/1741-4326/aa796e (međunarodna recenzija, članak, znanstveni)
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60.Overview of the FTU results // Nuclear fusion, 57 (2017), 102004-1 doi:10.1088/1741-4326/aa6239 (međunarodna recenzija, članak, znanstveni)
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61.Composition and source apportionment of fine particulate matter during extended calm periods in the city of Rijeka, Croatia // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406 (2017), Part A; 82-86 doi:10.1016/j.nimb.2017.02.084 (međunarodna recenzija, članak, znanstveni)
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62.Plasma-wall interaction studies in the full-W ASDEX Upgrade during helium plasma discharges // Nuclear fusion, 57 (2017), 6; 066015-1 doi:10.1088/1741-4326/aa69c4 (međunarodna recenzija, članak, znanstveni)
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63.Benchmarking the evaluated proton differential cross sections suitable for the EBS analysis of natSi and 16O // Nuclear Instruments and Methods in Physics Research. B, 405 (2017), 50-60 doi:10.1016/j.nimb.2017.05.021 (međunarodna recenzija, članak, znanstveni)
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64.Erosion yield and W surface enrichment of Fe-W model system exposed to low flux deuterium plasma in the linear device GyM // Nuclear materials and energy, 10 (2017), 9-16 doi:10.1016/j.nme.2017.01.014 (međunarodna recenzija, članak, znanstveni)
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65.GISAXS analysis of ion beam modified films and surfaces // Computer physics communications, 212 (2017), 69-81 doi:10.1016/j.cpc.2016.10.011 (međunarodna recenzija, članak, znanstveni)
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66.Influence of experimental parameters on secondary ion yield for MeV-SIMS // Nuclear instruments and Methods. Section B: Beam interactions with materials and atoms, 404 (2017), 110-113 doi:10.1016/j.nimb.2017.01.022 (međunarodna recenzija, članak, znanstveni)
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67.Identification and imaging of modern paints using Secondary Ion Mass Spectrometry with MeV ions // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 406 (2017), Part A; 296-301 doi:10.1016/j.nimb.2017.01.007 (međunarodna recenzija, članak, znanstveni)
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68.Assessment of PM2.5 sources and their corresponding level of uncertainty in a coastal urban area using EPA PMF 5.0 enhanced diagnostics // Science of the total environment, 574 (2017), 155-164 doi:10.1016/j.scitotenv.2016.09.047 (međunarodna recenzija, članak, znanstveni)
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69.22nd International Conference on Ion Beam Analysis // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 371 (2016), 1-3 doi:10.1016/j.nimb.2015.12.028 (međunarodna recenzija, uvodnik, ostalo)
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70.Observation of ion tracks on GaN and TiO2 surfaces by AFM and GISAXS // SAXS on nanosystems: current trends and perspectives.
Bazovica, 2016. str. 68-68 (poster, međunarodna recenzija, sažetak, znanstveni) -
71.Modification of semiconductor or metal nanoparticle lattices in amorphous alumina by MeV heavy ions // New journal of physics, 18 (2016), 093032, 10 doi:10.1088/1367-2630/18/9/093032 (međunarodna recenzija, članak, znanstveni)
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72.Formation of swift heavy ion tracks on rutile TiO2 (001) surface // Journal of Applied Crystallography, 49 (2016), 1704-1712 doi:10.1107/S1600576716013704 (međunarodna recenzija, članak, znanstveni)
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73.Nanostructuring surfaces and 2D materials using swift heavy ions // Programme and Book of Abstracts / Janez Kavač, Gregor Jakša (ur.).
Portorož: Slovenian Society for Vacuum Technology, 2016. str. 44-45 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
74.Swift heavy ions: a versatile tool for nanoscale modifications and analysis // Program Book ISNNM-2016 / Z. Gacsi, C.K. Rhee (ur.).
Seoul: The Korean Power Metallurgy Institute, 2016. str. AMP-04 (predavanje, međunarodna recenzija, pp prezentacija, znanstveni) -
75.Low temperature deposition of a-SiC:H thin films applying a dual plasma source process // Thin solid films, 616 (2016), 164-171 doi:10.1016/j.tsf.2016.07.030 (međunarodna recenzija, članak, znanstveni)
