Pregled po CROSBI profilu: Mladen Petravić (CROSBI Profil: 11615, MBZ: 112322)
Pronađeno 184 radova
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151.Acheron, C.E.; Wong-Leung, J.; Petravić, Mladen; Williams, J.S.Defect evolution in hydrogen implanted silicon // Proceedings of the 9th International Conference on Ion Beam Modification of Materials / J.S.Williams, R.G.Elliman and M.C.Ridgway (ur.).
Amsterdam: Elsevier, 1995. (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
152.Fell, C.J.; King, B.V.; Petravić, Mladen; Wielunski, L.S.Ion beam mixing of isotopic nickel bilayers // Proceedings of the 9th International Conference on Ion Beam Modification of Materials / J.S.Williams, R.G.Elliman and M.C.Ridgway (ur.).
Amsterdam: Elsevier, 1995. (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
153.Li, G.; Petravić, Mladen; Jagadish, C.Growth of Zn d-doped AlxGa1-xAs by low pressure metal organic vapour phase epitaxy // Journal of applied physics, 78 (1995), 5; 3546-3548 doi:10.1063/1.359930 (međunarodna recenzija, članak, znanstveni)
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154.Hoffman, A.; Moss, S.; Patterson, P.J.K.; Petravić, MladenElectron stimulated desorption of positive and negative ions from YBa2Cu3O7 surfaces // Journal of applied physics, 78 (1995), 11; 6858-6860 doi:10.1063/1.360450 (međunarodna recenzija, članak, znanstveni)
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155.Petravić, Mladen; Williams, James S.Electronic effects in ion-stimulated desorption of positive halogen ions from semiconductor surfaces // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 101 (1995), 1-2; 64-68 doi:10.1016/0168-583X(95)00065-8 (međunarodna recenzija, članak, znanstveni)
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156.Petravić, Mladen; Williams, James S.Desorption of positive and negative fluorine ions from BaF2 surfaces by core level excitation under electron bombardment // Journal of vacuum science & technology. A. Vacuum, surfaces, and films, 13 (1995), 1; 26-29 doi:10.1116/1.579438 (međunarodna recenzija, članak, znanstveni)
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157.Wong-Leung, J.; Asheron, C.E.; Petravić, Mladen; Elliman, R.G.; Williams, J.S.Gettering of copper to hydrogen-induced cavities in silicon // Applied physics letters, 66 (1995), 10; 1231-1233 doi:10.1063/1.113246 (međunarodna recenzija, članak, znanstveni)
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158.Ascheron, C.E.; Petravić, Mladen; Williams, J.S.Incorporation of implanted hydrogen in Si // Trans.Mater.Res.Soc.Jpn. 17 / I. Yamada, et al. (ur.).
Tokyo, 1994. (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
159.King, B.V.; Petravić, Mladen; Elliman, R.G.; Chater, R.J.Temperature dependence of SIMS depth profiles of Ag109/Ag107 bilayers // Secondary Ion Mass Spectrometry SIMS-IX / A.Benninghoven, Y.Nihei, R.Shimizu and H.W.Werner (ur.).
Chichester: John Wiley & Sons, 1994. (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
160.Petravić, Mladen; Li, GangOn the estimation of depth resolution durind SIMS profiling in GaAs and GaAs/AlGaAs structures // Secondary Ion Mass Spectrometry, SIMS IX / A.Benninghoven, Y.Nihei, R.Shimizu and H.W.Werner (ur.).
Chichester: John Wiley & Sons, 1994. str. 960-964 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
161.Svensson, Bengt G.; Mohadjeri, Babak; Petravić, MladenSurface recession and oxidation of silicon during bombardment by low energy oxygen ions // Journal of applied physics, 76 (1994), 6; 3831-3834 doi:10.1063/1.357386 (međunarodna recenzija, članak, znanstveni)
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162.Williams, James S.; Petravić, Mladen; Svensson, Bengt. G.; Conway, MartinOxidation of silicon by low energy oxygen bombardment // Journal of applied physics, 76 (1994), 3; 1840-1846 doi:10.1063/1.357704 (međunarodna recenzija, članak, znanstveni)
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163.Svensson, B.G.; Linnarsson, M.; Mohadjeri, B.; Petravić, Mladen; Williams, J.S.SIMS and depth profiling of semiconductor structures // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85 (1994), 1-4; 363-369 doi:10.1016/0168-583X(94)95845-9 (međunarodna recenzija, članak, znanstveni)
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164.Petravić, MladenDepth resolution during sputter profiling of Si in GaAs // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 85 (1994), 1-4; 388-390 doi:10.1016/0168-583X(94)95850-5 (međunarodna recenzija, članak, znanstveni)
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165.Williams, J.S.; Goldberg, R.D.; Petravić, Mladen; Rao, Z.Phase transformations and compound formation during ion irradiation of materials // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 84 (1994), 2; 199-203 doi:10.1016/0168-583X(94)95754-1 (međunarodna recenzija, članak, znanstveni)
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166.Petravić, MladenDesorption of positive and negative ions from SiO2/Si surfaces by electron excitation of core levels // Physical review. B, Condensed matter, 48 (1993), 4; 2627-2631 doi:10.1103/PhysRevB.48.2627 (međunarodna recenzija, članak, znanstveni)
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167.Prawer, S.; Hoffman, A.; Petravić, Mladen; Kalish, R.Conductivity in insulators due to implantation of conducting species // Journal of applied physics, 73 (1993), 8; 3841-3845 doi:10.1063/1.352893 (međunarodna recenzija, članak, znanstveni)
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168.Petravić, Mladen; Williams, J.S.; Wong, C.W.Electron stimulated desorption of positive and negative ions from SiO2/Si surfaces // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 78 (1993), 1-4; 333-336 doi:10.1016/0168-583X(93)95821-L (međunarodna recenzija, članak, znanstveni)
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169.Svensson, B.G.; Ridgway, M.C.; Petravić, MladenIsotope effect for mega-electronvolt boron ions in amorphous silicon // Journal of applied physics, 73 (1993), 10; 4836-4840 doi:10.1063/1.353798 (međunarodna recenzija, članak, znanstveni)
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170.Williams, J.S.; Elliman, R.G.; Ridgway, M.C.; Jagadish, C.; Ellingboe, S.L.; Goldberg, R.; Petravić, Mladen; Wong, W.C.; Dezhang, Z; Nygren, E.; Svensson, B.G.MeV implantation into semiconductors // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 80-81 (1993), 1; 507-513 doi:10.1016/0168-583X(93)96170-H (međunarodna recenzija, članak, znanstveni)
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171.Petravić, Mladen; Elliman, R.G.; Williams, J.S.Ion beam mixing in SIMS profiling of thin buried layers // Secondary Ion Mass Spectrometry, SIMS VIII / A.Benninghoven, K.T.F.Jansen, J.Tumpner and H.W.Werner (ur.).
Chichester: John Wiley & Sons, 1992. str. 367-370 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
172.Claphman, L.; Whitton, J.L.; Ridgway, M.C.; Hauser, N.; Petravić, MladenHigh-dose, heavy-ion implantation into metals-the use of a sacrificial carbon surface layer for increased dose retention // Journal of applied physics, 72 (1992), 9; 4014-4019 doi:10.1063/1.352254 (međunarodna recenzija, članak, znanstveni)
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173.Williams, J.S.; Petravić, Mladen; Li, Y.H.; Davies, J.A.; Palmer, G.Precipitation and segregation of Sb at Si-SiO2 interfaces during thermal oxidation // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 64 (1992), 1-4; 156-159 doi:10.1016/0168-583X(92)95457-3 (međunarodna recenzija, članak, znanstveni)
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174.Petravić, Mladen; Williams, J.S.Core ionization and ion ejection during SIMS analysis // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 64 (1992), 1-4; 659-662 doi:10.1016/0168-583X(92)95553-4 (međunarodna recenzija, članak, znanstveni)
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175.Ridgway, M.C.; Elliman, R.G.; Petravić, Mladen; Thornton, R.P.; Williams, J.S.The influence of implanted impurities on the termally-induced epitaxial recrystallization of CoSi2 // Journal of materials research, 6 (1991), 5; 1035-1039 doi:10.1557/JMR.1991.1035 (međunarodna recenzija, članak, znanstveni)
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176.Petravić, Mladen; Williams, J.S.Ion-induced noncollisional ejection of positive secondary ions // Surface science, 259 (1991), 1-2; 215-220 doi:10.1016/0039-6028(91)90539-5 (međunarodna recenzija, članak, znanstveni)
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177.Ilić, M.; Petravić, Mladen; Cooper, J.R.; Leontić, B.; Millat, O.; Bratina, G.Synthesis, oxygen treatment and AC susceptibility studies of YBaCuO single crystals // Fizika, 21 (1989), 27-30 (podatak o recenziji nije dostupan, članak, znanstveni)
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178.Petravić, Mladen; Forro, L.; Cooper, J.R.; Levy, F.Resistivity and threshold electric field measurements under pressure for the inorganic chain conductor (NbSe4)10/3I // Fizika, 21 (1989), 92-96 (podatak o recenziji nije dostupan, članak, znanstveni)
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179.Petravić, Mladen; Forro, Laszlo; Cooper, J.R.; Levy, F.Hall effect in the charge density wave system (NbSe4)10/3I // Physical review. B, Condensed matter, 40 (1989), 5; 2885-2888 doi:10.1103/PhysRevB.40.2885 (međunarodna recenzija, članak, znanstveni)
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180.Petravić, Mladen; Forro, Laszlo; Cooper, J.R.; Levy, F.High-pressure study of a charge density wave compound (NbSe4)10/3I // Physical review. B, Condensed matter, 40 (1989), 11; 8064-8067 doi:10.1103/PhysRevB.40.8064 (međunarodna recenzija, članak, znanstveni)
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181.Cooper, J.R.; Petravić, Mladen; Drobac, Đuro; Korin, B.; Brničević, Nevenka; Paljević, Matija; Collin, G.Low temperature AC susceptibility of yttrium barium copper oxide single crystals: Attempts to measure the superconducting penetration depth // Physica. C, Superconductivity, 153-155 (1988), 3; 1491-1492 doi:10.1016/0921-4534(88)90386-3 (međunarodna recenzija, članak, znanstveni)
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182.Forro, Laszlo; Petravić, Mladen; Leontić, BoranHall effect of the high Tc superconductors Y-Ba-Cu-O and Gd-Ba-Cu-O // Solid state communications, 65 (1988), 11; 1355-1358 doi:10.1016/0038-1098(88)90092-0 (međunarodna recenzija, članak, znanstveni)
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183.Petravić, Mladen; Tutis, Eduard; Hamzić, Amir; Forro, LaszloHall effect measurements in La2-xSrxCuO4 // Solid state communications, 65 (1988), 7; 573-576 doi:10.1016/0038-1098(88)90340-7 (međunarodna recenzija, članak, znanstveni)
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184.Petravić, Mladen; Hamzić, Amir; Leontić, Boran; Forro, LaszloTemperature dependence of the Hall effect in La2-xSrxCuO4 and ABa2Cu3O7 (A=Y, Gd) high temperature superconductors // International journal of modern physics A, 2 (1987), 4; 1067-1069 doi:10.1142/S0217979287001572 (međunarodna recenzija, članak, znanstveni)
