Pregled po CROSBI profilu: Davor Balzar (CROSBI Profil: 11326, MBZ: 105541)
Pronađeno 18 radova
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1.Djerdj, Igor; Gracin, Davor; Juraić, Krunoslav; Marinović, Adam; Balzar, DavorMicrostructural and optical study of inhomogeneous SnO2 thin films // ISMANAM 2012 : Book of abstracts
Moskva, Ruska Federacija, 2012. (predavanje, međunarodna recenzija, sažetak, znanstveni) -
2.Gracin, Davor; Juraić, Krunoslav; Djerdj, Igor; Lausi, Andrea; Čeh, Miran; Balzar, DavorNano Structure of In-homogeneous Amorphous-nano-crystalline Si Thin Films by Grazing Incidence X-ray Diffraction // BITS 1st Annual Conference and Expo of Analytix-2012 / Xiaodan Mei (ur.).
Peking: BIT Congress Inc., 2012. str. 145-145 (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni) -
3.Juraić, Krunoslav; Gracin, Davor; Djerdj, Igor; Lausi, Andrea; Čeh, Miran; Balzar, DavorStructural Analysis of Amorphous-Nanocrystalline Silicon Thin Films by Grazing Incidence X-ray Diffraction // Nuclear Instruments and Methods in Physics Research. Section B: Beam Interactions with Materials and Atoms, 284 (2012), 78-82 doi:10.1016/j.nimb.2011.07.018 (međunarodna recenzija, članak, znanstveni)
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4.Juraić, Krunoslav; Gracin, Davor; Djerdj, Igor; Lausi, Andrea; Čeh, Miran; Balzar, DavorGIXRD analiza tankih filmova amorfno-nanokristalnog silicija // Knjiga sažetaka: Sedmi znanstveni sastanak Hrvatskog fizikalnog društva / Gajović, A (ur.).
Zagreb: Hrvatsko fizikalno društvo, 2011. str. 139-139 (poster, domaća recenzija, sažetak, znanstveni) -
5.Djerdj, Igor; Gracin, Davor; Juraić, Krunoslav; Meljanac, Daniel; Balzar, DavorStructural analysis of inhomogeneous SnOx thin films // Denver X-ray conference : abstracts
Colorado Springs (CO), Sjedinjene Američke Države, 2011. (predavanje, međunarodna recenzija, sažetak, znanstveni) -
6.Juraić K.; Gracin D.; Djerdj, I.; Lausi A.; Čeh, M.; Balzar D.Structural Analysis of amorphous-nanocrystalline silicon thin films by Grazing Incidence X-ray Diffraction // EMRS-2011. Spring Meeting
Nica, Francuska, 2011. (poster, međunarodna recenzija, sažetak, znanstveni) -
7.Popa, Nicolae; Balzar, Davor; Štefanić, Goran; Vogel, Sven; Brown, Donald; Bourke, Mark; Clausen, BjornResidual-Strain Determination by Least-Squares Refinement of TOF Neutron-Diffraction Measurements of Deformed Uranium // Advances in X-ray Analysis
Denver (CO), Sjedinjene Američke Države, 2004. str. 373-378 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
8.Gall, Ken; Dunn, Martin; Liu, Yiping; Štefanić, Goran; Balzar, DavorInternal stress storage in shape memory polymer nanocomposites // Applied Physics Letters, 85 (2004), 2; 290-292 (međunarodna recenzija, članak, znanstveni)
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9.Balzar, DavorLine-profile analysis and standards // Abstracts of the 6th Powder Diffraction Conference EPDIC-6 / Ungar, Tamas ; Svab, Erzsebet (ur.).
Budimpešta: Diffraction Division ofthe Roland Eotvos Physical Society, Hunga, 1998. (pozvano predavanje, međunarodna recenzija, sažetak, znanstveni) -
10.Balzar, Davor; Stephens, P.W; Ledbetter, H;Synchrotron X-ray Diffraction Line Profile // Fizika A, 6 (1997), 41-50 (recenziran, članak, znanstveni)
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11.Musić, Svetozar; Balzar, Davor; Popović, Stanko; Gotić, Marijan; Czako-Nagy, Ilona; Dalipi, SametFormation and Characterization of NiFe2O4 // Croatica chemica acta, 70 (1997), 2; 719-734 (međunarodna recenzija, članak, znanstveni)
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12.Balzar, Davor; Ledbetter, HSoftware for Comparative Analysis of Diffraction-Line Broadening // Advances in X-ray analysis, 39 (1996), 457-464 (podatak o recenziji nije dostupan, članak, ostalo)
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13.Musić, Svetozar; Gotić, Marijan; Czakonagy, Ilona; Popović, Stanko; Balzar, DavorA study of the mechanochemistry of nickel ferrite by Mossbauer spectroscopy // Conference Proceedings "ICAME-95" / Ortalli, Ida (ur.).
Bolonja: SIF, 1996. str. 267-271 (poster, međunarodna recenzija, sažetak, ostalo) -
14.Musić, Svetozar; Hannoyer, Beatrice; Popović, Stanko; Lenglet, Michael; Czakonagy, Ilona; Ristić, Mira; Balzar, DavorFormation of solid solutions in the system (Cr_xFe_1-x)_2O_3, x = 0-1 // Conference Proceedings "ICAME-95" / Ortalli, Ida (ur.).
Bolonja: SIF, 1996. str. 169-173 (poster, međunarodna recenzija, sažetak, ostalo) -
15.Balzar, DavorDiffraction line broadening - Nuisance or lattice-imperfections fingerprints // Croatica chemica acta, 69 (1996), 3; 1069-1115 (međunarodna recenzija, članak, znanstveni)
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16.Balzar, Davor; Popović, StankoReliability of the Simplified Integral-Breadth Methods in Diffraction Line-Broadening Analysis // Journal of applied crystallography, 29 (1996), 1; 16-23 doi:10.1107/S0021889895008478 (međunarodna recenzija, članak, znanstveni)
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17.Musić, Svetozar; Lenglet, Michael; Popović, Stanko; Hannoyer, Beatrice; Czako-Nagy, Ilona; Ristić, Mira; Balzar, Davor; Gashi, FadbarthFormation And Characterization Of The Solid Solutions (CrxFe1-x)2O3, 0-Less-Than-Or-Equal-To- x-Less-Than-Or-Equal-To-1 // Journal of materials science, 31 (1996), 15; 4067-4076 (međunarodna recenzija, članak, znanstveni)
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18.Gracin, Davor; Radić, Nikola; Desnica, U.V.; Andreić, Željko; Balzar, D.Thermal Stability of Amorphous Silicon-Carbon Alloys Deposited by Magnetron Source // Fizika A, 4 (1995), 329-335 (podatak o recenziji nije dostupan, članak, znanstveni)
