Pregled po CROSBI profilu: Sabina Krivec (CROSBI Profil: 33917, MBZ: 359466)
Pronađeno 7 radova
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1.Krivec, Sabina; Poljak, Mirko; Suligoj, TomislavThe Physical Mechanisms Behind the Strain-Induced Electron Mobility Increase in InGaAs-On-InP MOSFETs // IEEE transactions on electron devices, 65 (2018), 7; 2784-2789 doi:10.1109/TED.2018.2838681 (međunarodna recenzija, članak, znanstveni)
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2.Sabina Krivec, Mirko Poljak, Tomislav SuligojBand-Structure of Ultra-Thin InGaAs Channels: Impact of Biaxial Strain and Thickness Scaling // Proceedings of the 40th International Convention MIPRO 2017 / Biljanović, Petar (ur.).
Rijeka: GRAFIK, 2017. str. 74-80 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
3.Krivec, Sabina; Poljak, Mirko; Suligoj, TomislavStrain-induced increase of electron mobility in ultra-thin InGaAs-OI MOS transistors // Proceedings of the 3rd Joint EUROSOI-ULIS Conference 2017
Atena, Grčka, 2017. str. 136-139 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
4.Krivec, Sabina; Poljak, Mirko; Suligoj, TomislavElectron mobility in ultra-thin InGaAs channels : Impact of surface orientation and different gate oxide materials // Solid-state electronics, 115 (2016), 1; 109-119 doi:10.1016/j.sse.2015.08.009 (međunarodna recenzija, članak, znanstveni)
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5.Krivec, Sabina; Poljak, Mirko; Suligoj, TomislavImpact of different gate insulator materials on the electron mobility in ultra-thin (100) InGaAs-on-insulator MOS devices // Proceedings of the 38th International Convention MIPRO 2015 / Biljanović, Petar (ur.).
Rijeka: GRAFIK, 2015. str. 25-30 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
6.Poljak, Mirko; Krivec, Sabina; Suligoj, TomislavOn the enhancement of electron mobility in ultra-thin (111)-oriented In0.53Ga0.47As channels // Proceedings of the First Joint EUROSOI-ULIS Conference 2015 / Palestri, Pierpaolo ; Gnani, Elena (ur.).
Bolonja, 2015. str. 117-120 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
7.Krivec, Sabina; Prgić, Hrvoje; Poljak, Mirko; Suligoj, TomislavComparison of RF performance between 20 nm-gate bulk and SOI FinFET // Proceedings of the 37th International Convention MIPRO / Biljanović, Petar (ur.).
Rijeka: GRAFIK, 2014. str. 51-56 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
