Pregled po CROSBI profilu: Marko Petric (CROSBI Profil: 33638, MBZ: 356553, ORCID: 0000-0002-3742-4275)
Pronađeno 35 radova
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26.Petric, Marko; Bohinc, Rok; Bučar, Klemen; Nowak, Stanisław H.; Žitnik, Matjaž; Kavčič, MatjažElectronic Structure of Third-Row Elements in Different Local Symmetries Studied by Valence-to-Core X-ray Emission Spectroscopy // Inorganic chemistry, 55 (2016), 11; 5328-5336 doi:10.1021/acs.inorgchem.6b00237 (međunarodna recenzija, članak, znanstveni)
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27.Petric, Marko; Kavčič, MatjažChemical speciation via X-ray emission spectroscopy in the tender X-ray range // Journal of analytical atomic spectrometry, 31 (2016), 2; 450-457 doi:10.1039/C5JA00394F (međunarodna recenzija, članak, znanstveni)
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28.Petric, Marko; Kavčič, Matjaž; Žitnik, Matjaž; Bučar, Klemen; Szlachetko, JakobChemical speciation of phosphorus, sulfur and chlorine by means of high-energy resolution PIXE measurements // IBA2015 Book of Abstracts / Bogdanović Radović, Iva ; Jakšić, Milko ; Karlušić, Marko ; Vidoš, Ana (ur.).
Opatija: Ruđer Bošković Institute, Zagreb, Croatia, 2015. str. 201-201 (poster, međunarodna recenzija, sažetak, znanstveni) -
29.T. Marchenko, T.; ...; Žitnik, M.; ...; Bučar, K.; ...; Petric, Marko; ...; Simon, M.Electron Dynamics in the Core-Excited CS_2 Molecule Revealed through Resonant Inelastic X-Ray Scattering Spectroscopy // Physical Review X, 5 (2015), 031021-1 doi:10.1103/PhysRevX.5.031021 (međunarodna recenzija, članak, znanstveni)
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30.Nowak, Stanislaw H.; Bjeoumikhov, Aniouar; von Borany, Johannes; Buchriegler, Josef; Munnik, Frans; Petric, Marko; Renno, Axel D.; Radtke, Martin; Reinholz, Uwe; Scharf, Oliver et al.Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera // X-ray spectrometry, 44 (2015), 3 (S-.I.); 135-140 doi:10.1002/xrs.2590 (međunarodna recenzija, članak, znanstveni)
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31.Nowak, Stanislaw H.; Bjeoumikhov, Aniouar; von Borany, Johannes; Buchriegler, Josef; Munnik, Frans; Petric, Marko; Radtke, Martin; Renno, Axel D.; Reinholz, Uwe; Scharf, Oliver; Wedell, ReinerSub-pixel resolution with a color X-ray camera // Journal of analytical atomic spectrometry, 30 (2015), 9; 1890-1897 doi:10.1039/C5JA00028A (međunarodna recenzija, članak, znanstveni)
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32.Petric, Marko; Bohinc, Rok; Bučar, Klemen; Žitnik, Matjaž; Szlachetko, Jakub; Kavčič, MatjažChemical State Analysis of Phosphorus Performed by X-ray Emission Spectroscopy // Analytical chemistry, 87 (2015), 11; 5632-5639 doi:10.1021/acs.analchem.5b00782 (međunarodna recenzija, članak, znanstveni)
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33.Petric, Marko; Kavčič, Matjaž; Žitnik, Matjaž; Bučar, Klemen; Szlachetko, JakobAnaliza kemijskega stanja lahkih elementov z meritvijo PIXE spektrov z visoko energijsko ločljivostjo // ZBORNIK POVZETKOV: 9. konference fizikov v osnovnih raziskavah / Osterman, Natan ; Škarabot, Miha (ur.).
Ljubljana: Fakulteta za matematiko in fiziko, Univerza v Ljubljani, 2014. str. 72-72 (poster, domaća recenzija, sažetak, znanstveni) -
34.Petric, Marko; Kavčič, Matjaž; Žitnik, Matjaž; Bučar, Klemen; Szlachetko, JakobChemical speciation of phosphorus by means oh high energy resolution PIXE measurements // Conferenc program and abstract / 8th International Symposium on BioPIXE / Pelicon, Primož ; Kavčič, Matjaž (ur.).
Ljubljana: Narodna in univerzitetna knjižnica, Ljubljana, 2014. str. 69-69 (poster, međunarodna recenzija, sažetak, znanstveni) -
35.Petric, MarkoSpektralni odziv solarne ćelije bazirane na nanokristaliničnom siliciju, 2013., diplomski rad, diplomski, Prirodoslovno-matematički fakultet, Zagreb
