Pregled po CROSBI profilu: Josip Žilak (CROSBI Profil: 30995, MBZ: 329055)
Pronađeno 44 radova
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26.Suligoj, Tomislav; Koričić, Marko; Žilak, Josip; Mochizuki, Hidenori; Morita, So-Ichi; Shinomura, Katsumi; Imai, HisayaHorizontal current bipolar transistor (HCBT) - a low-cost, high-performance flexible BiCMOS technology for RF communication applications // Facta Universitatis. Series: Electronics and Energetics, 28 (2015), 4; 507-525 doi:10.2298/FUEE1504507S (podatak o recenziji nije dostupan, članak, znanstveni)
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27.Žilak, Josip; Koričić, Marko; Suligoj, Tomislav; Mochizuki, Hidenori; Morita, So-ichiImpact of Emitter Interface Treatment on the Horizontal Current Bipolar Transistor (HCBT) Characteristics and RF Circuit Performance // Proceedings of the 2015 Bipolar/BiCMOS Circuits and Technology Meeting
Boston (MA): Institute of Electrical and Electronics Engineers (IEEE), 2015. str. 31-34 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
28.Koričić, Marko; Žilak, Josip; Suligoj, TomislavImpact of the emitter length scaling on electrical characteristics of horizontal current bipolar transistor with single polysilicon region // Proceedings of the 38th International Convention MIPRO 2015 / Biljanović, Petar (ur.).
Rijeka: GRAFIK, 2015. str. 31-36 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
29.Koričić, Marko; Žilak, Josip; Suligoj, TomislavDouble-Emitter Reduced-Surface-Field Horizontal Current Bipolar Transistor With 36 V Breakdown Integrated in BiCMOS at Zero Cost // IEEE electron device letters, 36 (2015), 2; 90-92 doi:10.1109/LED.2014.2385107 (međunarodna recenzija, članak, znanstveni)
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30.Suligoj, Tomislav; Koričić, Marko; Poljak, Mirko; Žonja, Sanja; Knežević, Tihomir; Žilak, JosipDesign of a scalable model of GaN devices, 2014. (podatak o recenziji nije dostupan, ekspertiza).
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31.Suligoj, Tomislav; Knežević Tihomir; Poljak, Mirko; Žonja, Sanja; Žilak, JosipPureB layers – XRD measurements and temperature characteristics, 2014. (podatak o recenziji nije dostupan, ekspertiza).
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32.Suligoj, Tomislav; Koričić, Marko; Knežević, Tihomir; Poljak, Mirko; Žilak, JosipLarge Area Reverse Structure Avalanche Photodiode Simulations, 2014. (podatak o recenziji nije dostupan, ekspertiza).
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33.Suligoj, Tomislav; Koričić, Marko; Žilak, JosipHCBT MIX1B-Aktivno dvostruko balansirano frekvencijsko miješalo u tehnologiji bipolarnog tranzistora s horizontalnim tokom struje
Hrvatski patentni glasnik 8 (2014) 172. -
34.Suligoj, Tomislav; Koričić, Marko; Žilak, JosipHCBT MIX1B-Aktivno dvostruko balansirano frekvencijsko miješalo s pojačalom lokalnog oscilatora u tehnologiji bipolarnog tranzistora s horizontalnim tokom struje
Hrvatski patentni glasnik 8 (2014) 172. -
35.Žilak, Josip; Koričić, Marko; Mochizuki, Hidenori; Morita, So-ichi; Shinomura, Katsumi; Imai, Hisaya; Suligoj, TomislavExamination of Horizontal Current Bipolar Transistor (HCBT) Reliability Characteristics // Proceedings of the 2014 Bipolar/BiCMOS Circuits and Technology Meeting
San Diego (CA), Sjedinjene Američke Države; Coronado (CA), Sjedinjene Američke Države: Institute of Electrical and Electronics Engineers (IEEE), 2014. str. 37-40 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
36.Suligoj, Tomislav; Koričić, Marko; Knežević, Tihomir; Poljak, Mirko; Žilak, JosipXPS Data interpretation of PureB layers, 2013. (podatak o recenziji nije dostupan, ekspertiza).
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37.Suligoj, Tomislav; Knežević, Tihomir; Poljak, Mirko; Žilak, JosipSpectroscopic elipsometry and Internal photoemission characterization of of PureB layers, 2013. (podatak o recenziji nije dostupan, ekspertiza).
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38.Suligoj, Tomislav; Koričić, Marko; Žilak, Josip; Mochizuki, Hidenori; Morita, So-ichi; Shinomura, Katsumi; Imai, HisayaOptimization of Horizontal Current Bipolar Transistor (HCBT) Technology Parameters for Linearity in RF Mixer // Proceedings of the 2013 Bipolar/BiCMOS Circuits and Technology Meeting
Bordeaux, Francuska: Institute of Electrical and Electronics Engineers (IEEE), 2013. str. 13-16 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
39.Suligoj, Tomislav; Knežević, Tihomir; Poljak, Mirko; Žonja, Sanja; Žilak, JosipOptimization of diode capacitance of Annular BS detector, 2012. (podatak o recenziji nije dostupan, ekspertiza).
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40.Žilak, Josip; Koričić, Marko; Suligoj, TomislavImpact of Bipolar Transistor Parameters on the Characteristics of the Double-Balanced Mixer // MIPRO 2012 - 35th International Convention on Information and Communication Technology, Electronics and Microelectronics / Biljanović, Petar (ur.).
Rijeka: Croatian Society MIPRO, 2012. str. 97-102 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
41.Suligoj, Tomislav; Koričić, Marko; Knežević, Tihomir; Žilak, JosipEmitter Coupled Logic (ECL) Circuit Testing and Measurements in a Novel Horizontal Current Bipolar Transistor (HCBT) Technology – 2nd Lot, 2011. (podatak o recenziji nije dostupan, ekspertiza).
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42.Žilak, Josip; Knežević, Tihomir; Suligoj, TomislavOptimization of Stress Distribution in Sub-45 nm CMOS Structures // Proceedings of 45th International Conference on Microelectronics, Devices and Materials MIDEM 2009 / Topič M. ; Krč, J. ; Šorli, I. (ur.).
Ljubljana: MIDEM Society for Microelectronics, Electronic Components and Materials, 2009. str. 85-90 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
43.Žilak, JosipUtjecaj naprezanja na karakteristike skaliranih CMOS tranzistora, 2009., diplomski rad, Fakultet elektrotehnike i računarstva, Zagreb
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44.Knežević, Tihomir; Žilak, Josip; Suligoj, TomislavStress Effect in Ultra-Narrow FinFET Structures // Proceedings of 32nd International Convention MIPRO 2009 / Biljanović, Petar ; Skala, Karolj (ur.).
Zagreb: Croatian Society MIPRO, 2009. str. 89-94 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
