Pregled po CROSBI profilu: Željko Pastuović (CROSBI Profil: 26629, MBZ: 229642)
Pronađeno 86 radova
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1.Bernat, Robert; Bakrač, Luka; Radulović, Vladimir; Snoj, Luka; Makino, Takahiro; Ohshima, Takeshi; Pastuović, Željko; Capan, Ivana4H-SiC Schottky barrier diodes for efficient thermal neutron detection // Materials, 14 (2021), 17; 5105, 10 doi:10.3390/ma14175105 (međunarodna recenzija, članak, znanstveni)
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2.Coutinho, J; Gouveia, J.D.; Makino, T.; Ohshima, T.; Pastuović, Željko; Bakrač, Luka; Brodar, Tomislav; Capan, IvanaM center in 4H-SiC is a carbon self-interstitial // Physical review. B., 103 (2021), 180102, 4 doi:10.1103/PhysRevB.103.L180102 (međunarodna recenzija, pismo, znanstveni)
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3.Bernat, Robert; Capan, Ivana; Bakrač, Luka; Brodar, Tomislav; Makino, Takahiro; Ohshima, Takeshi; Pastuović, Željko; Sarbutt, AdamResponse of 4H-SiC Detectors to Ionizing Particles // Crystals, 11 (2021), 1; 10, 13 doi:10.3390/cryst11010010 (međunarodna recenzija, članak, znanstveni)
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4.Ditalia Tchernij, S.; Lühmann, T.; Corte, E.; Sardi, F.; Picollo, F.; Traina, P.; Brajković, Marko; Crnjac, Andreo; Pezzagna, S.; Pastuović, Željko et al.Fluorine-based color centers in diamond // Scientific reports, 10 (2020), 21537, 7 doi:10.1038/s41598-020-78436-6 (međunarodna recenzija, članak, znanstveni)
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5.Radulović, Vladimir; Ambrožič, Klemen; Snoj, Luka; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Pastuović, Željko; Sarbutt, Adam; Ohshima, Takeshi; Yamazaki, Yuichi; Coutinho, JoséE-SiCure Collaboration Project: Silicon Carbide Material Studies and Detector Prototype Testing at the JSI TRIGA Reactor // ANIMMA 2019 – Advancements in Nuclear Instrumentation Measurement Methods and their Applications / Lyoussi, A. ; Giot, M. ; Carette, M. ; Jenčič, I. ; Reynard-Carette, C. ; Vermeeren, L. ; Snoj, L. ; Le Dû, P. (ur.).
Portorož, Slovenija: EDP Sciences, 2020. 07007, 6 doi:10.1051/epjconf/202022507007 (radionica, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
6.Brodar, Tomislav; Bakrač, Luka; Capan, Ivana; Ohshima, Takeshi; Snoj, Luka; Radulović, Vladimir; Pastuović, ŽeljkoDepth Profile Analysis of Deep Level Defects in 4H- SiC Introduced by Radiation // Crystals, 10 (2020), 9; 845, 16 doi:10.3390/cryst10090845 (međunarodna recenzija, članak, znanstveni)
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7.Coutinho, José; Torres, Vitor J. B.; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Bernat, Robert; Radulovič, Vladimir; Ambrožič, Klemen; Snoj, Luka; Pastuović, Željko et al.Silicon carbide diodes for neutron detection // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 986 (2020), 164793, 55 doi:10.1016/j.nima.2020.164793 (međunarodna recenzija, pregledni rad, znanstveni)
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8.Radulović, Vladimir; Yamazaki, Yuichi; Pastuović, Željko; Sarbutt, Adam; Ambrožič, Klemen; Bernat, Robert; Ereš, Zoran; Coutinho, José; Ohshima, Takeshi; Capan, Ivana; Snoj, LukaSilicon carbide neutron detector testing at the JSI TRIGA reactor for enhanced border and port security // Nuclear instruments & methods in physics research. Section A, Accelerators, spectrometers, detectors and associated equipment, 972 (2020), 164122, 8 doi:10.1016/j.nima.2020.164122 (međunarodna recenzija, članak, znanstveni)
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9.Vittone, Ettore; Garcia Lopez, Javier; Jakšić, Milko; Jimenez Ramos, Carmen; Lohstroh, Annika; Pastuović, Željko; Rath, Shyama; Siegele, Reiner; Skukan, Natko; Vizkelethy, Georgy; Simon, AlizDetermination of radiation hardness of silicon diodes // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 449 (2019), 6-10 doi:10.1016/j.nimb.2019.04.032 (međunarodna recenzija, članak, znanstveni)
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10.Capan, Ivana; Brodar, Tomislav; Ohshima, Takeshi; Sato, Shinichiro; Makino, Takahiro; Pastuovic, Željko; Siegele, Rainer; Snoj, Luka; Radulović, Vadimir; Coutinho, José et al.Deep Level Defects in 4H-SiC Epitaxial Layers // ICSCRM 2017 - The 2017 International Conference on Silicon Carbide and Related Materials
Washington D.C., Sjedinjene Američke Države: Trans Tech Publications, Ltd., 2018. str. 225-228 doi:10.4028/www.scientific.net/msf.924.225 (ostalo, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
11.Radulović, Vladimir; Ambrožič, Klemen; Snoj, Luka; Capan, Ivana; Brodar, Tomislav; Ereš, Zoran; Pastuović, Željko; Sarbutt, Adam; Ohshima, Takeshi; Yamazaki, Yuichi; Coutinho, JoséE-SiCure Collaboration Project: Silicon Carbide Material Studies and Detector Prototype Testing at the JSI TRIGA Reactor // NENE 2018 - The 27th International Conference Nuclear Energy for New Europe
Portorož, Slovenija, 2018. 702, 1 (radionica, podatak o recenziji nije dostupan, sažetak, znanstveni) -
12.Brodar, Tomislav; Capan, Ivana; Radulovic, Vladimir; Snoj, Luka; Pastuović, Željko; Coutinho, Jose; Ohshima, TakeshiLaplace DLTS study of deep defects created in neutron-irradiated n-type 4H-SiC // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 437 (2018), 1; 27-31 doi:10.1016/j.nimb.2018.10.030 (međunarodna recenzija, članak, znanstveni)
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13.Capan, Ivana; Brodar, Tomislav; Pastuović, željko; Ohshima, Takeshi; Snoj, Luka; Radulović, Vladimir; Coutinho, Jose; Demouche, KamelDouble negatively charged carbon vacancy at the h- and k-sites in 4H-SiC: Combined Laplace-DLTS and DFT study // Journal of applied physics, 123 (2018), 16; 161597, 37 doi:10.1063/1.5011124 (međunarodna recenzija, članak, znanstveni)
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14.Pastuović, Željko; Siegele, Rainer; Capan, Ivana; Brodar, Tomislav; Sato, Shin-icihiro; Ohshima, TakeshiDeep level defects in 4H-SiC introduced by ion implantation: the role of single ion regime // Journal of physics. Condensed matter, 29 (2017), 47; 475701, 6 doi:10.1088/1361-648X/aa908c (međunarodna recenzija, članak, znanstveni)
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15.Vittone, E.; Pastuović, Željko; Breese, M.; Garcia Lopez, J.; Jakšić, Milko; Raisanen, J.; Siegele, R.; Simon, A.; Vizkelethy, G.Charge collection efficiency degradation induced by MeV ions in semiconductor devices : Model and experiment // Nuclear Instruments and Methods in Physics Research B, 372 (2016), 128-142 doi:10.1016/j.nimb.2016.01.030 (međunarodna recenzija, članak, znanstveni)
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16.Capan, Ivana; Pastuović, Željko; Siegele, Rainer; Jaćimović, RadojkoVacancy-related defects in n-type Si implanted with a rarefied microbeam of accelerated heavy ions in the MeV range // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 372 (2016), 156-160 doi:10.1016/j.nimb.2015.12.039 (međunarodna recenzija, članak, znanstveni)
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17.Pastuović, Željko; Capan, Ivana; David D. Cohen; Jacopo, Forneris; Naoya, Iwamoto; Takeshi, Ohshima; Rainer, Siegele; Norihiro, Hoshino; Tsuchida, HidekazuRadiation hardness of n-type SiC Schottky barrier diodes irradiated with MeV He ion microbeam // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 348 (2015), 233-239 doi:10.1016/j.nimb.2014.12.064 (međunarodna recenzija, članak, znanstveni)
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18.Pastuović, Željko; Capan, Ivana; ...; Vittone, EttoreGeneration of vacancy cluster-related defects during single MeV silicon ion implantation of silicon // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 332 (2014), 298-302 doi:10.1016/j.nimb.2014.02.082 (međunarodna recenzija, članak, znanstveni)
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19.Zamboni, Ivana; Pastuović, Željko; Jakšić, MilkoRadiation hardness of single crystal CVD diamond detector tested with MeV energy ions // Diamond and related materials, 31 (2013), 65-71 doi:10.1016/j.diamond.2012.11.002 (međunarodna recenzija, članak, znanstveni)
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20.Zamboni, Ivana; Pastuović, Željko; Jakšić, MilkoRadiation hardness of single crystal CVD diamond detector tested with MeV energy ions // 2nd RBI Detector Workshop "Diamond Detectors Development and Applications": Book of Abstracts / Milko Jakšić, Tome Antičić, Mladen Kiš (ur.).
Zagreb: Institut Ruđer Bošković, 2012. str. 12-12 (predavanje, domaća recenzija, sažetak, znanstveni) -
21.Desnica, Vladan; Jakšić, Milko; Fazinić, Stjepko; Bogovac, Mladen; Pastuović, ŽeljkoIntegration of the PIXE and XRF spectrometries for simultaneous applications // Integration of Nuclear Spectrometry Methods as a New Approach to Material Research / Markowicz, Andrzej (ur.).
Beč: International Atomic Energy Agency (IAEA), 2011. str. 57-66 -
22.Fazinić, Stjepko; Pastuović, Željko; Jakšić, Milko; Kusijanović, K; Mudronja, Domagoj; Braun, Mario; Desnica, VladanCharacterization of inorganic pigments used by selected painters by using ion microprobe and other complementary techniques // Nuclear Techniques for Cultural Heritage Research / Markowicz, Andrzej (ur.).
Beč: International Atomic Energy Agency (IAEA), 2011. str. 147-164 -
23.Olivero, P.; Forneris, J.; Jakšić, Milko; Pastuović, Željko; Picollo, F.; Skukan, Natko; Vittone, E.Focused ion beam fabrication and IBIC characterization of a diamond detector with buried electrodes // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 269 (2011), 20; 2340-2344 doi:10.1016/j.nimb.2011.02.021 (međunarodna recenzija, članak, znanstveni)
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24.Olivero, P.; Forneris, J.; Gamarra, P.; Jakšić, Milko; Giudice, A. Lo; Manfredotti, C.; Pastuović, Željko; Skukan, Natko; Vittone, E.Monte Carlo analysis of a lateral IBIC experiment on a 4H-SiC Schottky diode // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 269 (2011), 20; 2350-2354 doi:10.1016/j.nimb.2011.02.020 (međunarodna recenzija, članak, znanstveni)
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25.Varašanec, Marijana; Bogdanović-Radović, Ivančica; Pastuović, Željko; Jakšić, MilkoCreation of microstructures using heavy ion beam lithography // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 269 (2011), 20; 2413-2416 doi:10.1016/j.nimb.2011.02.056 (međunarodna recenzija, članak, znanstveni)
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26.Zamboni, Ivana; Pastuović, Željko; Jakšić, MilkoDijamantni detektori - spektroskopska svojstva i otpornost na zračenje // 7. znanstveni sastanak Hrvatskog fizikalnog društva: Knjiga sažetaka / Gajović, Andreja ; Tokić, Vedrana ; Zorić, Maja ; Maruščak, Tomislav (ur.).
Zagreb: Hrvatsko fizikalno društvo, 2011. str. 94-94 (poster, domaća recenzija, sažetak, znanstveni) -
27.Pastuović, Željko; Vittone, Ettore; Capan, Ivana; Jakšić, Milko;Probability of divacancy trap production in silicon diodes exposed to focused ion beam irradiation // Applied physics letters, 98 (2011), 9; 092101, 3 doi:10.1063/1.3559000 (međunarodna recenzija, članak, znanstveni)
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28.Karlušić, Marko; Pastuović, Željko; Skukan, Natko; Smith, R.W.; Jakšić, MilkoSingle swift heavy ion irradiation setup at RBI // 24th International Conference on Atomic Colisions in Solids
Kraków, Poljska, 2010. (poster, međunarodna recenzija, sažetak, znanstveni) -
29.Fazinić, Stjepko; Božičević, Iva; Pastuović, Željko; Jakšić, Milko; Mudronja, Domagoj; Kusijanović, Katarina; Braun, Mario; Desnica, VladanIon beam techniques for analysis of cultural heritage objects: collaboration between the Ruđer Bošković Institute and the Croatian Conservation Institute // Science for Cultural Heritage
Veli Lošinj, Hrvatska: World Scientific Publishing, 2010. str. 15-22 doi:10.1142/9789814307079_0002 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni) -
30.Zamboni, Ivana; Pastuović, Željko; Jakšić, MilkoscCVD Diamond Detector: Spectroscopic Performance and Radiation Hardness Tests // 12th International Conference on Nuclear Microprobe Technology and Applications: Book of Abstracts
Leipzig: Leipziger Universitätsverlag GmbH Leipzig, 2010. str. 161-161 (poster, međunarodna recenzija, sažetak, znanstveni) -
31.Zamboni, Ivana; Pastuović, Željko; Jakšić, MilkoSingle crystal CVD diamond detectors, spectroscopy and radiation hardness tests // 1st SPIRIT workshop "New detector technologies for advanced materials research using ion beam analysis": Book of Abstracts
Zagreb: Institut Ruđer Bošković, 2010. str. 15-15 (predavanje, domaća recenzija, sažetak, znanstveni) -
32.Mudronja, Domagoj; Jakšić, Milko; Fazinić, Stjepko; Božičević, Iva; Desnica, Vladan; Pastuović, željko; Krstić, Dragica, Woodhead, Jon; Stos-Gale, ZophiaCROATIAN APOXIOMENOS – METAL COMPOSITION AND LEAD PROVENANCE STUDY // Technart 2009 - Non-destructive and Microanalytical Techniques in Art and Cultural Heritage / Kyriaki Polikreti, Andreas-Germanos Karydas, Demetrios Anglos (ur.).
Atena, 2009. str. 89-89 (predavanje, međunarodna recenzija, sažetak, ostalo) -
33.Pastuović, Željko; Jakšić, Milko; Kalinka, G.; Novak, M.; Simon, A.Deterioration of electrical and spectroscopic properties of a detector grade silicon photodiode exposed to short range proton, lithium and oxygen ion irradiation // IEEE transactions on nuclear science, 56 (2009), 4; 2457-2464 doi:10.1109/TNS.2009.2023123 (međunarodna recenzija, članak, znanstveni)
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34.Pastuović, Željko; Jakšić, MilkoPromjene efikasnosti sakupljanja naboja u Si-detektorima čestica koji su izloženi fokusiranim ionskim snopovima // Knjiga sažetaka / Buljan, Hrvoje ; Horvatić, Davor (ur.).
Zagreb: Hrvatsko fizikalno društvo, 2009. (poster, sažetak, znanstveni) -
35.Kalinka, G.; Novak, M.; Simon, A.; Pastuović, Željko; Jakšić, Milko; Kiss, A.Z.Empirical approach to the description of spectral performance degradation of silicon photodiodes used as particle detectors // Nuclear Instruments and Methods in Physics Research B, 267 (2009), 12/13; 2203-2207 (međunarodna recenzija, članak, znanstveni)
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36.Pastuović, ŽeljkoPromjene električkih svojstava i efikasnosti sakupljanja naboja u silicijskim fotodiodama izloženim fokusiranim ionskim snopovima, 2009., doktorska disertacija, Prirodoslovno matematički, Zagreb
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37.Vittone, E.; Skukan, Natko; Pastuović, Željko; Olivero, P.; Jakšić, MilkoCharge collection efficiency mapping of interdigitated 4H-SiC detectors // Nuclear Instruments and Mehods in Physics Research B, 267 (2009), 12/13; 2197-2202 doi:10.1016/j.nimb.2009.03.054 (međunarodna recenzija, članak, znanstveni)
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38.Olivero, P.; Amato, G.; Bellotti, F.; Budnyk, O.; Colombo, E.; Jakšić, Milko; Manfredotti, C.; Pastuović, Željko; Picollo, F.; Skukan, Natko et al.Direct fabrication of three-dimensional buried conductive channels in single crystal diamond with ion microbeam induced graphitization // Diamond and related materials, 18 (2009), 870-876 doi:10.1016/j.diamond.2008.10.068 (međunarodna recenzija, članak, znanstveni)
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39.Zamboni Mićanović, Ivana; Pastuović, Željko; Jakšić, MilkoscCVD Diamond Detector Spectroscopic Performance and Radiation Hardness Test // Nuclear Structure and Dynamics: Book of Abstracts / Prepolec, Lovro ; Nikšić, Tamara (ur.).
Zagreb: Institut Ruđer Bošković, 2009. str. 155-155 (poster, međunarodna recenzija, sažetak, znanstveni) -
40.Jakšić, Milko; Karlušić, Marko; Bogdanović- Radović, Ivančica; Pastuović, Željko; Skukan, Natko; Medunić, ZvonkoModification of electronic properties in insulators using ion microprobe // IAEA-Tecdoc, 1607 (2008), 19-26 (podatak o recenziji nije dostupan, članak, znanstveni)
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41.Karlušić, Marko; Pastuović, Željko; Skukan, Natko; Jakšić, MilkoDesign and performance of single ion hit detection system at RBI ion microprobe // Book of Abstract
Lyon, Francuska, 2008. (poster, međunarodna recenzija, sažetak, znanstveni) -
42.Desnica, Vladan; Škarić, Ksenija; Mudronja, Domagoj; Bošnjak, Marija; Fazinić, Stjepko; Pastuović, ŽeljkoXRF and PIXE analysis of the wooden polychrome altars from the northern Croatian region // European Conference on X-Ray Spectrometry (EXRS 2008) : Book of Abstract / Fazinić, Stjepko ; Jakšić, Milko (ur.).
Zagreb: Institut Ruđer Bošković, 2008. str. 123-123 (poster, sažetak, znanstveni) -
43.Šatović, D.; Desnica, Vladan; Valek, L.; Martinez, S.; Fazinić, Stjepko; Pastuović, ŽeljkoHomogeneity study of modern bronzes for artistic castings using PIXE and PLP // Book of Abstracts / Fazinić, S., Jakšić, M. (ur.).
Zagreb: Institut Ruđer Bošković, 2008. (poster, sažetak, znanstveni) -
44.Šatović, D.; Valek, L.; Desnica, Vladan; Martinez, S.; Fazinić, Stjepko; Pastuović, ŽeljkoContribution of tin compounds to protective properties of patina layers on statuary bronzes // Book of Abstracts / Fazinić, S. ; Jakšić, M. (ur.).
Zagreb: Institut Ruđer Bošković, 2008. str. PA-9 (poster, sažetak, znanstveni) -
45.Vittone, E.; Pastuović, Željko; Olivero, P.; Manfredotti, C.; Jakšić, Milko; Lo Giudice, A.; Fizzotti, F.; Colombo, E.Semiconductor characterization by scanning ion beam induced charge (IBIC) microscopy // Nuclear Instruments and Methods in Physic Research. Section B : Beam Interactions With Materials And Atoms, 266 (2008), 8; 1312-1318 doi:10.1016/j.nimb.2007.12.083 (međunarodna recenzija, članak, znanstveni)
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46.Šatović, Domagoj; Valek, Lidija; Desnica, Vladan; Martinez, Sanja; Fazinić, Stjepko; Pastuović, ŽeljkoContribution of tin compounds to protective properties of patina layers on statuary bronzes // EXRS-2008 European Conference on X-Ray Spectrometry / Fazinić, Stjepko ; Jakšić, Milko (ur.).
Zagreb: Institut Ruđer Bošković, 2008. str. 125-125 (poster, međunarodna recenzija, sažetak, znanstveni) -
47.Šatović, Domagoj; Desnica, Vladan; Valek, Lidija; Martinez, Sanja; Fazinić, Stjepko; Pastuović, ŽeljkoHomogeneity study of modern bronzes for artistic castings using PIXE and PLP // Book of Abstracts, EXRS-2008 European Conference on X-Ray Spectrometry / Fazinić, Stjepko ; Jakšić, Milko (ur.).
Zagreb: Institut Ruđer Bošković, 2008. str. 124-124 (poster, međunarodna recenzija, sažetak, znanstveni) -
48.Karlušić, Marko; Pastuović, Željko; Skukan, Natko; Jakšić, MilkoIon fluence measurements for microprobe irradiation using low beam currents and single ions // Book of Abstracts
Fiorentina: INFN LABEC, University of Florence, 2007. str. 44-44 (poster, međunarodna recenzija, sažetak, znanstveni) -
49.Desnica, Vladan; Fazinić, Stjepko; Pastuović, Željko; Jakšić, MilkoPIXE spectroscopy for the analysis of cultural heritage objects // Strojarstvo, 49 (2007), 393-401 (međunarodna recenzija, članak, znanstveni)
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50.Simon, A.; Kalinka, G.; Jakšić, Milko; Pastuović, Željko; Novák, M.; Kiss, A.Z.Investigation of radiation damage in a Si PIN photodiode for particle detection // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 260 (2007), (1); 304-308 (međunarodna recenzija, članak, znanstveni)
