Pregled po CROSBI profilu: Milko Jakšić (CROSBI Profil: 11601, MBZ: 113630)
Pronađeno 368 radova
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251.Pastuović, ŽeljkoRazvoj i primjena mikro-IBIC metode za istraživanje elektroničkih svojstava poluvodičkih detektora, 2004., magistarski rad, Prirodoslovno-matematički fakultet, Zagreb
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252.Manfredotti, C.; Vittone, E.; Paolini, C.; Olivero, P.; Lo Giudice, A.; Jakšić, Milko; Barrett, R.Investigation of 4H-SiC Schottky diodes by ion and X-ray micro beam induced charge collection techniques // Diamond and Related Materials, 12 (2003), 667-671 (međunarodna recenzija, članak, znanstveni)
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253.Medunić, Zvonko; Jakšić, Milko; Pastuović, Željko; Skukan, Natko; Bogdanović Radović, IvančicaProučavanje poluvodičkih materijala snopovima iona // Knjiga sazetaka / 4. znanstveni sastanak Hrvatskog fizikalnog društva / Kumerički, Krešimir (ur.).
Zagreb, 2003. (predavanje, sažetak, znanstveni) -
254.Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Pivac, Branko; Katz, EugeneIBIC studies of structural defect activity in different polycrystalline silicon material // Vacuum, 71 (2003), 117-122 (međunarodna recenzija, članak, znanstveni)
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255.Manfredotti, C.; Fizzotti, C.; Lo Giudice, A.; Jakšić, Milko; Pastuović, Željko; Paolini, C.; Olivero, P.; Vittone, E.Time-resolved ion beam-induced charge collection measurement of minority carrier lifetime in semiconductor power devices by using Gunn's theorem // Materials science & engineering. B, Solid-state materials for advanced technology, 102 (2003), 193-197 (međunarodna recenzija, članak, znanstveni)
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256.Jakšić, Milko; Medunić, Zvonko; Skukan, NatkoOn the use of pulsed microbeam in IBIC // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 210 (2003), 176-180 (međunarodna recenzija, članak, znanstveni)
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257.Medunić, Zvonko; Jakšić, Milko; Pastuović, Željko; Skukan, NatkoTemperature dependent TRIBIC in CZT detectors // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 210 (2003), 237-242 (međunarodna recenzija, članak, znanstveni)
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258.Radić, Nikola; Tonejc, Antun; Tonejc, Anđelka; Djerdj, Igor; Furlan, Andrej; Panjan, Peter; Čekada, Miha; Jakšić, Milko; Medunić, Zvonkobeta -W faza u tankim filmovima - posljedica naprezanja ili kisika u filmu? // Zbornik Povzetkov / Jenko, M. (ur.).
Ljubljana: Društvo za vakuumsko tehniko slovenije, 2003. str. 9-9 (poster, sažetak, znanstveni) -
259.Gracin, Davor; Jakšić, Milko; Dubček, Pavo; Zorc, Hrvoje; Juraić, KrunoslavMedium range ordering of amorphous silicon-carbon alloys studied by GISAXS, optical spectroscopy and IBA // Abstracts of 8th European Vacuum Congress / ? (ur.).
Berlin: Deutsche Vakuumgesellschaft, 2003. str. 86-86 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
260.Pivac, Branko; Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Zulim, IvanIBIC studies of oxygen doped polycrystalline silicon // 2nd aSiNet Workshop on Thin Silicon and 9th Euroregional Workshop on Thin Silicon Devices, Book of Abstracts / Shubert, Markus B. ; Conde, Joao P. (ur.).
Lisabon: Instituto Superior Técnico, 2003. (poster, međunarodna recenzija, sažetak, znanstveni) -
261.Gracin, Davor; Dubček, Pavo; Jakšić, Milko; Bernstorff, S.Nanostructural properties of amorphous silicon carbide by GISAXS and optical spectroscopy // Thin Solid Films, 433 (2003), 1-2; 88-91 (međunarodna recenzija, članak, znanstveni)
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262.Gracin, Davor; Jakšić, Milko; Dubček, Pavo; Medunić, ZvonkoInvestigation of the nano-structural properties of amorphous silicon-carbon alloys by IBA technique, optical spectroscopy and GISAXS // Vacuum, 71 (2003), 1-2; 47-51 (međunarodna recenzija, članak, znanstveni)
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263.Blaauw, M.; Campbell, J.L.; Fazinić, S.; Jakšić, Milko; Orlić, Ivica; Van Espen, P.The 2000 IAEA intercomparison of PIXE spectrum analysis software // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 189 (2002), 1-4; 113-122 doi:10.1016/S0168-583X(01)01016-3 (međunarodna recenzija, članak, znanstveni)
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264.Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Pivac, Branko; Katz, EugeneIBIC studies of structural defect activity in different polycrystalline silicon material // Final programme and book of abstracts / Leisch, M. ; Winkler, A. (ur.).
Graz: HTU GmbH, 2002. str. 42-42 (predavanje, međunarodna recenzija, sažetak, znanstveni) -
265.Pivac, Branko; Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Zulim, Ivan; Vlahović, BranislavIBICC studies of polycrystalline silicon // Preliminary Program
New Orleans (LA): Institute of Electrical and Electronics Engineers (IEEE), 2002. str. 1P25-1P25 (poster, međunarodna recenzija, sažetak, znanstveni) -
266.Gracin, Davor; Dubček, Pavo; Jakšić, MilkoNanostructual properties of amorphous silicon carbide by GISAX and optical spectroscopy // Book of Abstracts, ICTF 12, Bratislava, Slovakia, Sept. 15-20, 2002 / Majkova, Eva; Luby, Štefan (ur.).
Bratislava: VEDA, Publishing House of SAS, 2002. (predavanje, međunarodna recenzija, sažetak, znanstveni) -
267.Gracin, Davor; Jakšić, Milko; Dubček, Pavo; Medunić, ZvonkoNano-structural properties of amorphous hydrogenated silicon - carbon alloys by IBA technique, optical methods and GISAX // Book of Abstrtacts, JVC-9, Sloss Seggau , Leibnitz by Graz, June 16-20, 2002, / M.Leisch ; A.Winkler (ur.).
Graz: HTU GmbH, Graz University of technology, 2002. (predavanje, međunarodna recenzija, sažetak, znanstveni) -
268.Blaauw, M.; Campbell, J.L.; Fazinić, Stjepko; Jakšić, Milko; Orlić, Ivo; Van Espen, P.The 2000 IAEA intercomparison of PIXE spetrcum analysis software // Nuclear Instruments and Methods in Physics Research B, 189 (2002), 113-122 (međunarodna recenzija, članak, znanstveni)
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269.Vittone, Ettore; Manfredotti, C.; Fizzotti, F.; Lo Guidice, Alessandro; Lorenzi, A.; Galassini, Silvio; Jakšić, MilkoMeasurements of charge collection profiles in virgin and strongly irradiated silicon diodes by means of the micro-IBICC technique // Nuclear Instruments and Methods in Physics Research A, 476 (2002), 607-613 (međunarodna recenzija, članak, znanstveni)
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270.Nsouli, B.; Roumie, M.; Zahraman, K.; Thomas, J.-P.; Jakšić, Milko; Pastuović, Željko; Dole, P.; Nasreddine, M.PIXE, micro-PIXE and RBS analysis of thermal aged rubber material: On the additives behaviour versus aging time // Nuclear Instruments and Methods in Physics Research B, 198 (2002), 201-207 (međunarodna recenzija, članak, znanstveni)
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271.Bogdanović Radović, Ivančica; Jakšić, Milko; Benka, O.; Gurbich, A.F.Helium elastic scattering from carbon for 30° to 150° in the energy region from 2 to 4.8 MeV // Nuclear Instruments and Methods in Physics Research B, 190 (2002), 100-106 (međunarodna recenzija, članak, znanstveni)
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272.Medunić, Zvonko; Gracin, Davor; Bogdanović Radović, Ivančica; Jakšić, MilkoChatacterisation of amorphous silicon solar cells by IBA method // Nuclear Instruments and Methods in Physics Research B, 190 (2002), 611-614 (međunarodna recenzija, članak, znanstveni)
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273.Jakšić, Milko; Bošnjak, Željka; Gracin, Davor; Medunić, Zvonko; Pastuović, Željko; Vittone, Ettore; Nava, F.Characterisation of SiC by IBIC and other IBA techniques // Nuclear Instruments and Methods in Physics Research B, 188 (2002), 130-134 (međunarodna recenzija, članak, znanstveni)
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274.Gržeta, Biserka; Tkalčec, Emilija; Goebbrt, Christian; Takeda, Masuo; Takahashi, Masashi; Nomura, Kiyoshi; Jakšić, MilkoStructural studies of nanocrystalline SnO_2 doped with antimony: XRD and Mossbauer spectroscopy // Journal of Physics and Chemistry of Solids, 63 (2002), 765-772 (međunarodna recenzija, članak, znanstveni)
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275.Borjanović, Vesna; Jakšić, Milko; Pastuović, Željko; Pivac, Branko; Vlahović, Branislav; Dutta, J.; Ječmenica, RadeDefects in polycristalline silicon studied by IBICC // Solar Energy Materials and Solar Cells, 72 (2002), 1-4; 487-494 (međunarodna recenzija, članak, znanstveni)
