Pregled bibliografske jedinice broj: 998446
A Method for Defining, Measuring and Processing of Implant Quality Data
A Method for Defining, Measuring and Processing of Implant Quality Data // Proceedings of the 10th International Multi- Conference on Complexity, Informatics and Cybernetics IMCIC 2019
Orlando (FL): International Institute of Informatics and Systematics, 2019. str. 42-46 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 998446 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
A Method for Defining, Measuring and Processing of
Implant Quality Data
Autori
Batoš, Vedran ; Zakarija, Ivona
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 10th International Multi- Conference on Complexity, Informatics and Cybernetics IMCIC 2019
/ - Orlando (FL) : International Institute of Informatics and Systematics, 2019, 42-46
ISBN
978-1-941763-97-1
Skup
10th International Multi-Conference on Complexity, Informatics and Cybernetics 2019 (IMCIC 2019)
Mjesto i datum
Orlando (FL), Sjedinjene Američke Države, 12.03.2019. - 15.03.2019
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
computing ; software application ; biomedical engineering ; electrical engineering
Sažetak
This paper presents a method for defining, measuring and processing of implant quality data, by application of information and communication technology (ICT) for biomedical purposes. The proper application is leading to the proposed automated process that started with measurement procedure collecting data from biomedical environment using electrical measuring devices, converting data into transferrable values sending them through wireless network to computing unit and ending with finally processed outcomes. Reaching the computing unit, data are processed in real-time, grouped by selected processing results and by dedicated criteria best samples are recommended for further usage. Sampled data present transient voltage values generated on element and collected for further data processing and analysis.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika, Računarstvo
POVEZANOST RADA
Ustanove:
Sveučilište u Dubrovniku
Citiraj ovu publikaciju:
Časopis indeksira:
- Scopus