Pregled bibliografske jedinice broj: 942545
Off-the-shelf Measurement Setup for Compressive Imaging
Off-the-shelf Measurement Setup for Compressive Imaging // IEEE transactions on instrumentation and measurement, 68 (2018), 2; 502-511 doi:10.1109/TIM.2018.2847018 (međunarodna recenzija, članak, znanstveni)
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Naslov
Off-the-shelf Measurement Setup for Compressive Imaging
Autori
Ralašić, Ivan ; Seršić, Damir ; Petrinović, Davor
Izvornik
IEEE transactions on instrumentation and measurement (0018-9456) 68
(2018), 2;
502-511
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
2D imaging, calibration method, camera, compressive sensing (CS), measurement system, projector, sparse optimization
Sažetak
While numerous works analyze theoretical background of compressive sensing and provide rich mathematical theory, few practical implementations exist and they mostly share the same disadvantage of being either too complex or too expensive to implement. As a result of the reported work, simple measurement setup for compressive sensing using off-the-shelf components is proposed. A simple and portable compressive sensing architecture consists of a digital camera, a projector and mechanical integration elements. Extensive analysis of the proposed measurement system and detailed calibration method is provided. Presented compressive sensing method allows for use of a low-resolution camera with significant lens distortion for data acquisition. The results of our compressive sensing method are non- distorted, high-resolution images, which are obtained from the acquired measurement data using sparse optimization.
Izvorni jezik
Engleski
Znanstvena područja
Računarstvo
POVEZANOST RADA
Projekti:
HRZZ-IP-2014-09-2625 - Iznad Nyquistove granice (BeyondLimit) (Seršić, Damir, HRZZ ) ( CroRIS)
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus