Naslov
Imaging of Optically Active Defects with Nanometer Resolution

Autori
Feng, Jiandong ; Deschout, Hendrik ; Caneva, Sabina ; Hofmann, Stephan ; Lončarić, Ivor ; Lazić, Predrag ; Radenovic, Aleksandra

Izvornik
Nano letters (1530-6984) 18 (2018), 3; 1739-1744

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
super resolution microscopy ; boron nitride monolayer ; point defects ; localization microscopy

Sažetak
Point defects significantly influence the optical and electrical properties of solid-state materials due to their interactions with charge carriers, which reduce the band-to-band optical transition energy. There has been a demand for developing direct optical imaging methods that would allow in situ characterization of individual defects with nanometer resolution. Here, we demonstrate the localization and quantitative counting of individual optically active defects in monolayer hexagonal boron nitride using single molecule localization microscopy. By exploiting the blinking behavior of defect emitters to temporally isolate multiple emitters within one diffraction limited region, we could resolve two defect emitters with a point-to-point distance down to ten nanometers. The results and conclusion presented in this work add unprecedented dimensions toward future applications of defects in quantum information processing and biological imaging.

Izvorni jezik
Engleski

Znanstvena područja
Fizika

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