Naslov
Characterization of measurement system for high- precision oscillator measurements

Autori
Brezovec, Ivan ; Magerl, Marko ; Mikulić, Josip ; Schatzberger, Gregor ; Barić, Adrijan

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO) / - , 2017, 88-92

ISBN
978-953-233-090-8

Skup
2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)

Mjesto i datum
Opatija, Hrvatska, 22.05.2017. - 26.05.2017

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
oscillator characterization, temperature calibration, on-chip temperature sensor, Allan deviation

Sažetak
Abstract: Temperature stability of a high- precision oscillator is characterized by measurements in a temperature chamber. Two time constants are measured for a given temperature of the chamber: (i) time required for the silicon to reach the steady-state temperature obtained by measuring the time-domain voltage response of the on-chip temperature sensor ; (ii) time required for the oscillator circuit to reach the steady-state frequency obtained by measuring the oscillator frequency in the time- domain. The temperature probe for measuring the chamber temperature is characterized in terms of its response to a step in temperature. The noise performance of the measurement system is characterized based on Allan deviation.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika

POVEZANOST RADA