Pregled bibliografske jedinice broj: 911694
An FPGA implementation of the Goertzel algorithm in a Non- Destructive Eddy current Testing
An FPGA implementation of the Goertzel algorithm in a Non- Destructive Eddy current Testing // Signals and Systems (ICSigSys), 2017 International Conference on
Bali, Indonezija: Institute of Electrical and Electronics Engineers (IEEE), 2017. str. - doi:10.1109/icsigsys.2017.7967036 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
An FPGA implementation of the Goertzel algorithm in a Non- Destructive Eddy current Testing
Autori
Kekelj, Matija ; Bulic, Neven ; Sucic, Victor
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Signals and Systems (ICSigSys), 2017 International Conference on
/ - : Institute of Electrical and Electronics Engineers (IEEE), 2017
ISBN
978-1-5090-6748-0
Skup
2017 International Conference on Signals and Systems (ICSigSys)
Mjesto i datum
Bali, Indonezija, 16.05.2017. - 18.05.2017
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
eProbes, Eddy currents, Field programmable gate arrays, Signal processing algorithms, Real-time systems, Demodulation
(Probes, Eddy currents, Field programmable gate arrays, Signal processing algorithms, Real-time systems, Demodulation)
Sažetak
Abstract: The paper presents an implementation of the Goertzel algorithm in FPGA (Field Programmable Gate Array) logic as a proposed algorithm utilized in Eddy current NDT (Non-Destructive Testing) instrumentation equipment. The FPGA running a real-time Goertzel algorithm in Eddy current NDT application is a novel approach different from the usual methods ; such are the quadrature demodulation and discrete FFT. The paper provides a brief overview of the Eddy current instrument hardware and gives a mathematical background on Eddy current signals. It also shows a real-time implementation of Goertzel algorithm in SoC (system- on-chip ; FPGA/ARM based chip) and provides experimental results obtained by using common EC NDT probes. The results are compared to the results of several commercial Eddy current instruments.
Izvorni jezik
Engleski