Pregled bibliografske jedinice broj: 895954
Transport properties of neutron-irradiated 4H-SiC Schottky diode
Transport properties of neutron-irradiated 4H-SiC Schottky diode // Scientific program & book of abstracts : 7th Central European Symposium on Plasma Chemistry / Milošević, Slobodan ; Krstulović, Nikša (ur.).
Zagreb: LDK-PROMET d.o.o., 2017. str. 122-122 (poster, nije recenziran, sažetak, znanstveni)
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Naslov
Transport properties of neutron-irradiated 4H-SiC Schottky diode
(Transport properties of neutron irradiated 4H-SiC Schottky diode)
Autori
Blažeka, Damjan ; Capan, Ivana ; Ohshima, Takeshi ; Sato, Shin-ichiro ; Makino, Takahiro ; Snoj, Luka ; Radulović, Vladimir ;
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Scientific program & book of abstracts : 7th Central European Symposium on Plasma Chemistry
/ Milošević, Slobodan ; Krstulović, Nikša - Zagreb : LDK-PROMET d.o.o., 2017, 122-122
ISBN
978-953-7666-16-3
Skup
7th Central European Symposium on Plasma Chemistry
Mjesto i datum
Sveti Martin na Muri, Hrvatska, 03.09.2017. - 07.09.2017
Vrsta sudjelovanja
Poster
Vrsta recenzije
Nije recenziran
Ključne riječi
poluvodiči ; detektori ; neutronsko zračenje ; silicij-karbid ;
(semiconductors ; detectors ; radiation ; silicon-carbide ;)
Sažetak
Silicon-carbide (SiC) is the semiconductor material with properties which make it suitable for radiation detection. Wide band gap, small intrinsic carrier concentration, small leakage current, large breakdown voltage, good thermal conductivity, hardness, excellent resistance to large temperatures and high radiation tolerance are all properties which make it better than silicon - the most widely used material in semiconductor detectors [1]. 4H-SiC is the SiC polymorph with the best detection properties. Two n-type Ni/4H-SiC diodes with similar dopance and dimensions have been irradiated with thermal and fast reactor neutrons (both at doses 10^10 cm-2, TRIGA Mark reactor – Jožef Štefan Institute) to study their effect on transport properties, which have been measured by current-voltage (I-V) and capacitance-voltage (C-V) at temperatures 150K-375K. All of the observed changes in I-V point to the introduced interface states that locally influence Schottky barrier height. Fast neutrons have introduced much more concentration of such defects than thermal neutrons. From C-V small decrease in free carrier concentration has been observed. [1] Damjan Blažeka, Transportna svojstva poluvodičkih detektora – diplomski rad, 2017
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Institut za fiziku, Zagreb,
Institut "Ruđer Bošković", Zagreb