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Pregled bibliografske jedinice broj: 89552

Optical processing for the detection of faults in interferometric patterns


Kallmeyer, Frank; Krueger, Sven; Wernicke, Guenther; Gruber, Hartmut; Demoli, Nazif; Osten, Wolfgang; Kayser, Daniel
Optical processing for the detection of faults in interferometric patterns // Proceedings of SPIE Vol. 4777 Interferometry XI: Techniques and Analysis / Creath, Katherine ; Schmit, Joanna (ur.).
Bellingham (WA): The International Society for Optical Engineering, 2002. str. 371-381 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Optical processing for the detection of faults in interferometric patterns

Autori
Kallmeyer, Frank ; Krueger, Sven ; Wernicke, Guenther ; Gruber, Hartmut ; Demoli, Nazif ; Osten, Wolfgang ; Kayser, Daniel

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of SPIE Vol. 4777 Interferometry XI: Techniques and Analysis / Creath, Katherine ; Schmit, Joanna - Bellingham (WA) : The International Society for Optical Engineering, 2002, 371-381

Skup
Interferometry XI: Techniques and Analysis

Mjesto i datum
Seattle (WA), Sjedinjene Američke Države, 07.07.2002. - 11.07.2002

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
optical processing; interferometric fringes; wavelet filters

Sažetak
The detection and classification of faults is a major task for optical nondestructive testing in industrial quality control. Interferometric fringes, obtained by real-time optical measurement methods, contain a large amount of image data with information about possible defect features. This mass of data must be reduced for further evaluation. One possible way is the filtering of these images applying the adaptive wavelet transform. The wavelet transform has been proved to be a capable tool in the detection of structures with definite spatial resolution. In this paper it is shown the extraction and classification of disturbances in interferometric fringe patterns, the application of several wavelet functions with different parameters for the detection of faults, and the combination of wavelet filters for fault classification. Furthermore the implementation of complex valued wavelet filters and correlation filters is shown. We will present an algorithm to classify interferometric fringe patterns. In order to achieve real-time processing a hybrid opto-electronic system with a digital image processing and an optical correlation module is favored. The calculated wavelet filters are implemented into the optical correlator system that is based on liquid-crystal spatial light modulators. So, all discussed items were verified experimentally in the optical setup.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
0035005

Ustanove:
Institut za fiziku, Zagreb

Profili:

Avatar Url Nazif Demoli (autor)


Citiraj ovu publikaciju:

Kallmeyer, Frank; Krueger, Sven; Wernicke, Guenther; Gruber, Hartmut; Demoli, Nazif; Osten, Wolfgang; Kayser, Daniel
Optical processing for the detection of faults in interferometric patterns // Proceedings of SPIE Vol. 4777 Interferometry XI: Techniques and Analysis / Creath, Katherine ; Schmit, Joanna (ur.).
Bellingham (WA): The International Society for Optical Engineering, 2002. str. 371-381 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Kallmeyer, F., Krueger, S., Wernicke, G., Gruber, H., Demoli, N., Osten, W. & Kayser, D. (2002) Optical processing for the detection of faults in interferometric patterns. U: Creath, K. & Schmit, J. (ur.)Proceedings of SPIE Vol. 4777 Interferometry XI: Techniques and Analysis.
@article{article, author = {Kallmeyer, Frank and Krueger, Sven and Wernicke, Guenther and Gruber, Hartmut and Demoli, Nazif and Osten, Wolfgang and Kayser, Daniel}, year = {2002}, pages = {371-381}, keywords = {optical processing, interferometric fringes, wavelet filters}, title = {Optical processing for the detection of faults in interferometric patterns}, keyword = {optical processing, interferometric fringes, wavelet filters}, publisher = {The International Society for Optical Engineering}, publisherplace = {Seattle (WA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }
@article{article, author = {Kallmeyer, Frank and Krueger, Sven and Wernicke, Guenther and Gruber, Hartmut and Demoli, Nazif and Osten, Wolfgang and Kayser, Daniel}, year = {2002}, pages = {371-381}, keywords = {optical processing, interferometric fringes, wavelet filters}, title = {Optical processing for the detection of faults in interferometric patterns}, keyword = {optical processing, interferometric fringes, wavelet filters}, publisher = {The International Society for Optical Engineering}, publisherplace = {Seattle (WA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }




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