Pregled bibliografske jedinice broj: 887435
Diamond for enhanced GaN device performance
Diamond for enhanced GaN device performance // Proceedings of the 2014 IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
Orlando (FL), Sjedinjene Američke Države, 2014. str. 1206-1209 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Diamond for enhanced GaN device performance
Autori
Ejeckam, F. ; Francis, D. ; Faili, F. ; Dodson, J. ; Twichen, D. J. ; Bollinger, B. ; Babic, D.
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 2014 IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
/ - , 2014, 1206-1209
Skup
IEEE Intersociety Conference on Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm)
Mjesto i datum
Orlando (FL), Sjedinjene Američke Države, 2014
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Thermal resistance, Gallium nitride, Thermal conductivity, HEMTs, Diamonds, Substrates
Sažetak
AlGaN/GaN high electron mobility transistors (HEMT) semiconductor technology holds promise for revolutionary improvements in the cost, size, weight, and performance of a broad range of military and commercial microelectronics [1]. However, exploiting the true capabilities of GaN is a compromise between the desired RF performance and the realities of current thermal solutions. In this work we present modeling and integration details on performance of AlGaN/GaN high-electron-mobility transistors (HEMTs) fabricated on freestanding and mounted, heat-spreading diamond substrates. The excellent thermal properties of diamond substrates grown by chemical vapor deposition (CVD) provide a superior heat spreading material for electronic packages. The successful on-wafer integration of diamond with gallium nitride (GaN) has emerged as a critical solution for the expected thermal challenges of the next generation of high power RF and microwave devices.
Izvorni jezik
Engleski
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
Profili:
Dubravko Babić
(autor)