Naslov
Measurement of Thermal Boundary Resistance using Liquid Crystal Thermography

Autori
Babić, D. I. ; Diduck, Q. ; Khandavalli, C. ; Francis, D. ; Faili, F. ; Ejeckam, F.

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Proceedings of the International Convention on Information and Communications Technology, Electronics and Microelectronics (MIPRO) / - , 2013, 55-59

Skup
International Convention on Information and Communications Technology, Electronics and Microelectronics (MIPRO)

Mjesto i datum
Opatija, Hrvatska, 2013

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Temperature measurement, Thermal resistance, Gallium nitride, Liquid crystals, Electrical resistance measurement, Substrates

Sažetak
Liquid Crystal Thermography (LCT) is commonly used for hotspot identification and peak- temperature measurement in electronic devices. We use LCT to characterize GaN/Si and GaN/SiC high-electron mobility transistors and extract the thermal boundary resistance between the GaN epilayers and the substrate on these transistors.

Izvorni jezik
Engleski

POVEZANOST RADA