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Pregled bibliografske jedinice broj: 886970

Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application

Babić, D. I.; Chang, Y-L.; Lefforge, D.; Houng, D.; Robbins, V.; Ratcliff, J.; Martinez, L.; Tan, M.; Carey, K.; Tan, I-H; Kish, F.
Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application // Proceedings of the HP Conference on Optoelectronic and RF Technology (CORT), paper M-1
Palo Alto (CA), Sjedinjene Američke Države, 1997. (predavanje, međunarodna recenzija, neobjavljeni rad, stručni)

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Naslov
Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application

Autori
Babić, D. I. ; Chang, Y-L. ; Lefforge, D. ; Houng, D. ; Robbins, V. ; Ratcliff, J. ; Martinez, L. ; Tan, M. ; Carey, K. ; Tan, I-H ; Kish, F.

Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, neobjavljeni rad, stručni

Izvornik
Proceedings of the HP Conference on Optoelectronic and RF Technology (CORT), paper M-1 / - , 1997

Skup
HP Conference on Optoelectronic and RF Technology (CORT)

Mjesto i datum
Palo Alto (CA), Sjedinjene Američke Države, 05.05.1997. - 06.05.1997

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
GaAs/InP fused junctions ; Vertical-cavity lasers

Sažetak
Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical- cavity laser application

Izvorni jezik
Engleski



POVEZANOST RADA

Profili:

Avatar Url Dubravko Babić (autor)

Citiraj ovu publikaciju:

Babić, D. I.; Chang, Y-L.; Lefforge, D.; Houng, D.; Robbins, V.; Ratcliff, J.; Martinez, L.; Tan, M.; Carey, K.; Tan, I-H; Kish, F.
Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application // Proceedings of the HP Conference on Optoelectronic and RF Technology (CORT), paper M-1
Palo Alto (CA), Sjedinjene Američke Države, 1997. (predavanje, međunarodna recenzija, neobjavljeni rad, stručni)
Babić, D., Chang, Y., Lefforge, D., Houng, D., Robbins, V., Ratcliff, J., Martinez, L., Tan, M., Carey, K., Tan, I. & Kish, F. (1997) Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application. U: Proceedings of the HP Conference on Optoelectronic and RF Technology (CORT), paper M-1.
@article{article, author = {Babi\'{c}, D. I. and Chang, Y-L. and Lefforge, D. and Houng, D. and Robbins, V. and Ratcliff, J. and Martinez, L. and Tan, M. and Carey, K. and Tan, I-H and Kish, F.}, year = {1997}, keywords = {GaAs/InP fused junctions, Vertical-cavity lasers}, title = {Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application}, keyword = {GaAs/InP fused junctions, Vertical-cavity lasers}, publisherplace = {Palo Alto (CA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }
@article{article, author = {Babi\'{c}, D. I. and Chang, Y-L. and Lefforge, D. and Houng, D. and Robbins, V. and Ratcliff, J. and Martinez, L. and Tan, M. and Carey, K. and Tan, I-H and Kish, F.}, year = {1997}, keywords = {GaAs/InP fused junctions, Vertical-cavity lasers}, title = {Capacitance-voltage and SIMS characterization of GaAs/InP fused junctions for 1300 nm vertical-cavity laser application}, keyword = {GaAs/InP fused junctions, Vertical-cavity lasers}, publisherplace = {Palo Alto (CA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }

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