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Pregled bibliografske jedinice broj: 886164

Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates

Chabak, K.D.; Gillespie, J.K.; Miller, V.; Crespo, A.; Roussos, J.; Trejo, M.; Walker, D.E.; Via, G.D.; Jessen, G.H.; Wasserbauer, J. et al.
Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates // IEEE electron device letters, 31 (2010), 2; 99-101 doi:10.1109/LED.2009.2036574 (međunarodna recenzija, članak, znanstveni)

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Naslov
Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates

Autori
Chabak, K.D. ; Gillespie, J.K. ; Miller, V. ; Crespo, A. ; Roussos, J. ; Trejo, M. ; Walker, D.E. ; Via, G.D. ; Jessen, G.H. ; Wasserbauer, J. ; Faili, F. ; Babić, Dubravko I. ; Francis, D. ; Ejeckam, F.

Izvornik
IEEE electron device letters (0741-3106) 31 (2010), 2; 99-101

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Aluminum gallium nitride, Gallium nitride, HEMTs, MODFETs, Substrates, Electric variables measurement, Chemical processes, Chemical vapor deposition, Radio frequency

Sažetak
We report on electrical characterization and uniformity measurements of the first conventionally processed AlGaN/GaN high electron mobility transistors (HEMTs) on free-standing chemical-vapor-deposited (CVD) diamond substrate wafers.

Izvorni jezik
Engleski



POVEZANOST RADA

Profili:

Avatar Url Dubravko Babić (autor)

Poveznice na cjeloviti tekst rada:

doi ieeexplore.ieee.org

Citiraj ovu publikaciju:

Chabak, K.D.; Gillespie, J.K.; Miller, V.; Crespo, A.; Roussos, J.; Trejo, M.; Walker, D.E.; Via, G.D.; Jessen, G.H.; Wasserbauer, J. et al.
Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates // IEEE electron device letters, 31 (2010), 2; 99-101 doi:10.1109/LED.2009.2036574 (međunarodna recenzija, članak, znanstveni)
Chabak, K., Gillespie, J., Miller, V., Crespo, A., Roussos, J., Trejo, M., Walker, D., Via, G., Jessen, G. & Wasserbauer, J. (2010) Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates. IEEE electron device letters, 31 (2), 99-101 doi:10.1109/LED.2009.2036574.
@article{article, author = {Chabak, K.D. and Gillespie, J.K. and Miller, V. and Crespo, A. and Roussos, J. and Trejo, M. and Walker, D.E. and Via, G.D. and Jessen, G.H. and Wasserbauer, J. and Faili, F. and Babi\'{c}, Dubravko I. and Francis, D. and Ejeckam, F.}, year = {2010}, pages = {99-101}, DOI = {10.1109/LED.2009.2036574}, keywords = {Aluminum gallium nitride, Gallium nitride, HEMTs, MODFETs, Substrates, Electric variables measurement, Chemical processes, Chemical vapor deposition, Radio frequency}, journal = {IEEE electron device letters}, doi = {10.1109/LED.2009.2036574}, volume = {31}, number = {2}, issn = {0741-3106}, title = {Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates}, keyword = {Aluminum gallium nitride, Gallium nitride, HEMTs, MODFETs, Substrates, Electric variables measurement, Chemical processes, Chemical vapor deposition, Radio frequency} }
@article{article, author = {Chabak, K.D. and Gillespie, J.K. and Miller, V. and Crespo, A. and Roussos, J. and Trejo, M. and Walker, D.E. and Via, G.D. and Jessen, G.H. and Wasserbauer, J. and Faili, F. and Babi\'{c}, Dubravko I. and Francis, D. and Ejeckam, F.}, year = {2010}, pages = {99-101}, DOI = {10.1109/LED.2009.2036574}, keywords = {Aluminum gallium nitride, Gallium nitride, HEMTs, MODFETs, Substrates, Electric variables measurement, Chemical processes, Chemical vapor deposition, Radio frequency}, journal = {IEEE electron device letters}, doi = {10.1109/LED.2009.2036574}, volume = {31}, number = {2}, issn = {0741-3106}, title = {Full-Wafer Characterization of AlGaN/GaN HEMTs on Free- Standing CVD Diamond Substrates}, keyword = {Aluminum gallium nitride, Gallium nitride, HEMTs, MODFETs, Substrates, Electric variables measurement, Chemical processes, Chemical vapor deposition, Radio frequency} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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