Pregled bibliografske jedinice broj: 885
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface // Surface science, 374 (1997), 1-3; 51-60 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 885 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface
Autori
Valla, Tonica ; Pervan, Petar ; Milun, Milorad ; Wandelt, Klaus
Izvornik
Surface science (0039-6028) 374
(1997), 1-3;
51-60
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Angle resolved photoemission; Copper; Growth; Metallic films; Thermal desorption spectroscopy; Vanadium; Work function measurements; X-ray photoelectron spectroscopy
Sažetak
Growth modes and electronic properties of copper ultra-thin films on a V(001) surface were studied.
sp-derived QW states were identified in Cu films.
Lateral structure of the films was determined.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
