Pregled bibliografske jedinice broj: 884783
Characterisation of metal mirrors on GaAs
Characterisation of metal mirrors on GaAs // Electronics letters, 32 (1996), 4; 319-320 doi:10.1049/el:19960230 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 884783 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Characterisation of metal mirrors on GaAs
Autori
Babić, Dubravko I. ; Mirin, R.P. ; Hu, E.L. ; Bowers, J.E.
Izvornik
Electronics letters (0013-5194) 32
(1996), 4;
319-320
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Mirrors, Fabry-Perot interferometers, Semiconductor-metal interfaces, Gallium compounds, Optical reflection, Integrated optics
Sažetak
The authors describe a Fabry-Perot technique for determining the reflectivity and the phase of the interface between semiconductor and a multilayer metal structure as it will be realised in actual device fabrication. The reflection coefficients of GaAs to Ti/Au, Pd/Au, Au and Ag interfaces are measured at 1.55 /spl mu/m.
Izvorni jezik
Engleski
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
