Pregled bibliografske jedinice broj: 882628
The role of non-uniform dielectric permittivity in the determination of heterojunction band offsets by cv-profiling through isotype heterojunctions
The role of non-uniform dielectric permittivity in the determination of heterojunction band offsets by cv-profiling through isotype heterojunctions // Solid-state electronics, 28 (1985), 10; 1015-1017 doi:10.1016/0038-1101(85)90032-2 (međunarodna recenzija, članak, znanstveni)
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Naslov
The role of non-uniform dielectric permittivity in the determination of heterojunction band offsets by cv-profiling through isotype heterojunctions
Autori
Babić, Dubravko I. ; Kroemer, Herbert
Izvornik
Solid-state electronics (0038-1101) 28
(1985), 10;
1015-1017
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
heterojunctions, capacitance-voltage profiling, band offset, algaas, gaas
Sažetak
Up to now, C–V profiling through isotype heterojunctions has been performed assuming a uniform dielectric permittivity throughout the heterostructure. We extend the interpretation of C–V data to the case of a semiconductor with position-dependent dielectric permittivity, and we show that the variation of the dielectric permittivity across an isotype heterojunction interface has no effect on the determination of the heterojunction band discontinuity and the interface charge density.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
