Pregled bibliografske jedinice broj: 871358
Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera
Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera // X-ray spectrometry, 44 (2015), 3 (S-.I.); 135-140 doi:10.1002/xrs.2590 (međunarodna recenzija, članak, znanstveni)
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Naslov
Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera
Autori
Nowak, Stanislaw H. ; Bjeoumikhov, Aniouar ; von Borany, Johannes ; Buchriegler, Josef ; Munnik, Frans ; Petric, Marko ; Renno, Axel D. ; Radtke, Martin ; Reinholz, Uwe ; Scharf, Oliver ; Strüder, Lothar ; Wedell, Reiner. ; Ziegenrücker, Rene
Izvornik
X-ray spectrometry (0049-8246) 44
(2015), 3 (S-.I.);
135-140
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
PIXE, XRF, Energy and spatially resolved X-ray imaging
Sažetak
We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5μm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Rad je prezentiran na skupu The European Conference on X-Ray Spectrometry, održanom od 15.–20.06-2014.g., Bologna, Italija.
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
