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Pregled bibliografske jedinice broj: 82882

General solution for the complex frequency shift in microwave measurements of thin films


Peligrad, D.-N.; Nebendahl, B.; Mehring, M.; Dulčić, Antonije; Požek, Miroslav; Paar, Dalibor
General solution for the complex frequency shift in microwave measurements of thin films // Physical review. B, Condensed matter and materials physics, 64 (2001), 22; 224504, 12 doi:10.1103/PhysRevB.64.224504 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 82882 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
General solution for the complex frequency shift in microwave measurements of thin films

Autori
Peligrad, D.-N. ; Nebendahl, B. ; Mehring, M. ; Dulčić, Antonije ; Požek, Miroslav ; Paar, Dalibor

Izvornik
Physical review. B, Condensed matter and materials physics (1098-0121) 64 (2001), 22; 224504, 12

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
superconducting thin films ; microwave measurement ; surface conductivity ; high-frequency effects

Sažetak
Perturbation of a microwave cavity by a small sample with variable dielectric, magnetic, or conducting properties is considered. The complex frequency shift is derived in terms of a volume integral, or equivalently, in terms of a surface integral. These are used to obtain a general formula for thin films in the microwave electric field maximum. The complex frequency shift depends on the depolarization factor of the film and on its thickness in a nontrivial way. The previously known expressions for the complex frequency shift are shown to be good approximations of the present solution in the low and high conductivity limits. Our formula is applied to calculate the signal shapes in superconducting films of various geometric parameters and conductivities. It is shown that a diversity of signal shapes can result, and experimental support of those shapes is provided. The role of the dielectric substrate on which the thin film is grown is simply reduced to an asymmetry effect.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
119201
119225

Ustanove:
Prirodoslovno-matematički fakultet, Zagreb

Profili:

Avatar Url Antonije Dulčić (autor)

Avatar Url Dalibor Paar (autor)

Avatar Url Miroslav Požek (autor)

Poveznice na cjeloviti tekst rada:

Pristup cjelovitom tekstu rada doi journals.aps.org

Citiraj ovu publikaciju:

Peligrad, D.-N.; Nebendahl, B.; Mehring, M.; Dulčić, Antonije; Požek, Miroslav; Paar, Dalibor
General solution for the complex frequency shift in microwave measurements of thin films // Physical review. B, Condensed matter and materials physics, 64 (2001), 22; 224504, 12 doi:10.1103/PhysRevB.64.224504 (međunarodna recenzija, članak, znanstveni)
Peligrad, D., Nebendahl, B., Mehring, M., Dulčić, A., Požek, M. & Paar, D. (2001) General solution for the complex frequency shift in microwave measurements of thin films. Physical review. B, Condensed matter and materials physics, 64 (22), 224504, 12 doi:10.1103/PhysRevB.64.224504.
@article{article, author = {Peligrad, D.-N. and Nebendahl, B. and Mehring, M. and Dul\v{c}i\'{c}, Antonije and Po\v{z}ek, Miroslav and Paar, Dalibor}, year = {2001}, pages = {12}, DOI = {10.1103/PhysRevB.64.224504}, chapter = {224504}, keywords = {superconducting thin films, microwave measurement, surface conductivity, high-frequency effects}, journal = {Physical review. B, Condensed matter and materials physics}, doi = {10.1103/PhysRevB.64.224504}, volume = {64}, number = {22}, issn = {1098-0121}, title = {General solution for the complex frequency shift in microwave measurements of thin films}, keyword = {superconducting thin films, microwave measurement, surface conductivity, high-frequency effects}, chapternumber = {224504} }
@article{article, author = {Peligrad, D.-N. and Nebendahl, B. and Mehring, M. and Dul\v{c}i\'{c}, Antonije and Po\v{z}ek, Miroslav and Paar, Dalibor}, year = {2001}, pages = {12}, DOI = {10.1103/PhysRevB.64.224504}, chapter = {224504}, keywords = {superconducting thin films, microwave measurement, surface conductivity, high-frequency effects}, journal = {Physical review. B, Condensed matter and materials physics}, doi = {10.1103/PhysRevB.64.224504}, volume = {64}, number = {22}, issn = {1098-0121}, title = {General solution for the complex frequency shift in microwave measurements of thin films}, keyword = {superconducting thin films, microwave measurement, surface conductivity, high-frequency effects}, chapternumber = {224504} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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