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Pregled bibliografske jedinice broj: 80885

High-Speed GaAs SCFL Digital Test Structures


Marković, Hrvoje; Marić, Nikica; Čeperić, Vladimir; Barić, Adrijan
High-Speed GaAs SCFL Digital Test Structures // The 9th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2002) : Proceedings / Barić, Adrijan ; Magjarević, R. ; Pejčinović, B. ; Chrzanowska-Jeske, M. (ur.).
Piscataway (NJ): The Institut of Electrical and Electronic Engineers, 2002. str. 635-639 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


CROSBI ID: 80885 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
High-Speed GaAs SCFL Digital Test Structures

Autori
Marković, Hrvoje ; Marić, Nikica ; Čeperić, Vladimir ; Barić, Adrijan

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
The 9th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2002) : Proceedings / Barić, Adrijan ; Magjarević, R. ; Pejčinović, B. ; Chrzanowska-Jeske, M. - Piscataway (NJ) : The Institut of Electrical and Electronic Engineers, 2002, 635-639

ISBN
0-7803-7596-3

Skup
IEEE International Conference on Electronics, Circuits and Systems (9 ; 2002)

Mjesto i datum
Dubrovnik, Hrvatska, 15.09.2002. - 18.09.2002

Vrsta sudjelovanja
Poster

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
GaAs; SCFL; high-speed; digital test structures

Sažetak
The work presented in this paper describes the simulations performed in order to evaluate expected performance of digital cells processed in 0.5-mm GaAs MESFET technology, before these cells are measured on-chip. A number of basic SCFL digital cells (buffer, OR, XOR, AND, D-flip-flop) is simulated, as well as various ring oscillator configurations and a programmable 2/3 divider. The cells used to generate pulse signals from the sine generator and the output cells used for measurements are also characterized. The simulations show that the operation up to 3 &#8211 ; ; 5 GHz may be achieved, which is consistent with what can be expected from the fT = 20 GHz 0.5-mm GaAs MESFET technology.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA


Projekti:
0036027

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Adrijan Barić (autor)

Avatar Url Vladimir Čeperić (autor)


Citiraj ovu publikaciju:

Marković, Hrvoje; Marić, Nikica; Čeperić, Vladimir; Barić, Adrijan
High-Speed GaAs SCFL Digital Test Structures // The 9th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2002) : Proceedings / Barić, Adrijan ; Magjarević, R. ; Pejčinović, B. ; Chrzanowska-Jeske, M. (ur.).
Piscataway (NJ): The Institut of Electrical and Electronic Engineers, 2002. str. 635-639 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Marković, H., Marić, N., Čeperić, V. & Barić, A. (2002) High-Speed GaAs SCFL Digital Test Structures. U: Barić, A., Magjarević, R., Pejčinović, B. & Chrzanowska-Jeske, M. (ur.)The 9th IEEE International Conference on Electronics, Circuits and Systems (ICECS 2002) : Proceedings.
@article{article, author = {Markovi\'{c}, Hrvoje and Mari\'{c}, Nikica and \v{C}eperi\'{c}, Vladimir and Bari\'{c}, Adrijan}, year = {2002}, pages = {635-639}, keywords = {GaAs, SCFL, high-speed, digital test structures}, isbn = {0-7803-7596-3}, title = {High-Speed GaAs SCFL Digital Test Structures}, keyword = {GaAs, SCFL, high-speed, digital test structures}, publisher = {The Institut of Electrical and Electronic Engineers}, publisherplace = {Dubrovnik, Hrvatska} }
@article{article, author = {Markovi\'{c}, Hrvoje and Mari\'{c}, Nikica and \v{C}eperi\'{c}, Vladimir and Bari\'{c}, Adrijan}, year = {2002}, pages = {635-639}, keywords = {GaAs, SCFL, high-speed, digital test structures}, isbn = {0-7803-7596-3}, title = {High-Speed GaAs SCFL Digital Test Structures}, keyword = {GaAs, SCFL, high-speed, digital test structures}, publisher = {The Institut of Electrical and Electronic Engineers}, publisherplace = {Dubrovnik, Hrvatska} }




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