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Pregled bibliografske jedinice broj: 801727

MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter

Stoytschew, V.; Bogdanović Radović, Ivančica; Demarche, J.; Jakšić, Milko; Matjačić, L.; Siketić, Zdravko; Webb, R.
MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter // Nuclear Instruments and Methods in Physics Research B, 371 (2016), 194-198 doi:10.1016/j.nimb.2015.11.020 (međunarodna recenzija, članak, znanstveni)

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Naslov
MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter

Autori
Stoytschew, V. ; Bogdanović Radović, Ivančica ; Demarche, J. ; Jakšić, Milko ; Matjačić, L. ; Siketić, Zdravko ; Webb, R.

Izvornik
Nuclear Instruments and Methods in Physics Research B (0168-583X) 371 (2016); 194-198

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
yield; MeV SIMS; current; electronic stopping; molecular analysis

Sažetak
Megaelectronvolt-Secondary Ion Mass Spectrometry (MeV-SIMS) is an emerging Ion Beam Analysis technique for molecular speciation and submicron imaging. Various setups have been constructed in the recent years. Still a systematic investigation on the dependence of MeV-SIMS yields on different ion beam parameters is missing. A reliable measurement method of the beam current down to the attoampere range is needed for this investigation. Therefore, a new detector has been added to the MeV-SIMS setup at the Ruđer Bošković Institute (RBI), which measures the current directly using a Si PIN-diode. In this work, we present the constructed system, its characteristics, and results of the first yield measurements. These measurements have already identified important factors that have to be considered while constructing a MeV SIMS setup.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA

Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Profili:

Avatar Url Zdravko Siketić (autor)

Avatar Url Milko Jakšić (autor)

Avatar Url Ivančica Bogdanović Radović (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com

Citiraj ovu publikaciju:

Stoytschew, V.; Bogdanović Radović, Ivančica; Demarche, J.; Jakšić, Milko; Matjačić, L.; Siketić, Zdravko; Webb, R.
MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter // Nuclear Instruments and Methods in Physics Research B, 371 (2016), 194-198 doi:10.1016/j.nimb.2015.11.020 (međunarodna recenzija, članak, znanstveni)
Stoytschew, V., Bogdanović Radović, I., Demarche, J., Jakšić, M., Matjačić, L., Siketić, Z. & Webb, R. (2016) MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter. Nuclear Instruments and Methods in Physics Research B, 371, 194-198 doi:10.1016/j.nimb.2015.11.020.
@article{article, author = {Stoytschew, V. and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Demarche, J. and Jak\v{s}i\'{c}, Milko and Matja\v{c}i\'{c}, L. and Siketi\'{c}, Zdravko and Webb, R.}, year = {2016}, pages = {194-198}, DOI = {10.1016/j.nimb.2015.11.020}, keywords = {yield, MeV SIMS, current, electronic stopping, molecular analysis}, journal = {Nuclear Instruments and Methods in Physics Research B}, doi = {10.1016/j.nimb.2015.11.020}, volume = {371}, issn = {0168-583X}, title = {MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter}, keyword = {yield, MeV SIMS, current, electronic stopping, molecular analysis} }
@article{article, author = {Stoytschew, V. and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Demarche, J. and Jak\v{s}i\'{c}, Milko and Matja\v{c}i\'{c}, L. and Siketi\'{c}, Zdravko and Webb, R.}, year = {2016}, pages = {194-198}, DOI = {10.1016/j.nimb.2015.11.020}, keywords = {yield, MeV SIMS, current, electronic stopping, molecular analysis}, journal = {Nuclear Instruments and Methods in Physics Research B}, doi = {10.1016/j.nimb.2015.11.020}, volume = {371}, issn = {0168-583X}, title = {MeV-SIMS yield measurements using a Si-PIN diode as a primary ion current counter}, keyword = {yield, MeV SIMS, current, electronic stopping, molecular analysis} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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