Pregled bibliografske jedinice broj: 767142
DEFINING THE CRITERIA TO SELECT THE WAVELET TYPE FOR THE ASSESSMENT OF SURFACE QUALITY
DEFINING THE CRITERIA TO SELECT THE WAVELET TYPE FOR THE ASSESSMENT OF SURFACE QUALITY // Tehnički vjesnik : znanstveno-stručni časopis tehničkih fakulteta Sveučilišta u Osijeku, 22 (2015), 3; 781-784 (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 767142 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
DEFINING THE CRITERIA TO SELECT THE WAVELET TYPE FOR THE ASSESSMENT OF SURFACE QUALITY
Autori
Stępień, Krzysztof ; Makiela, Wlodzimierz ; Stoić, Antun ; Samardžić, Ivan
Izvornik
Tehnički vjesnik : znanstveno-stručni časopis tehničkih fakulteta Sveučilišta u Osijeku (1330-3651) 22
(2015), 3;
781-784
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
mother wavelet; surface roughness; surface texture; wavelet transform
Sažetak
The paper deals with one of the most important problems in the wavelet analysis – the methodology for mother wavelet selection. In this study, the surface texture of machine parts was assessed applying a wavelet transform. The calculations involved in roughness profile evaluation were based on three selection criteria: an autocorrelation test, a cross-correlation function and an entropy-based test. All the calculations and diagrams were produced using the Wavelet toolbox of the MATLAB package.
Izvorni jezik
Engleski
Znanstvena područja
Strojarstvo
POVEZANOST RADA
Projekti:
152-0000000-3309 - Suvremene tehnike obrade rezanjem u proizvodnji prihvatljivoj okolišu (Stoić, Antun, MZOS ) ( CroRIS)
152-1521473-1474 - Napredni postupci izravne izradbe polimernih proizvoda (Raos, Pero, MZOS ) ( CroRIS)
152-1521473-1476 - Suvremene tehnologije spajanja lakih strojarskih konstrukcija (Samardžić, Ivan, MZOS ) ( CroRIS)
Ustanove:
Strojarski fakultet, Slavonski Brod
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus