Pregled bibliografske jedinice broj: 76513
Computer Assisted Identification and Measurement of a Semiconductor Device - Heatsink Thermal System
Computer Assisted Identification and Measurement of a Semiconductor Device - Heatsink Thermal System // Proceedings IMACS-TC1 '93 / Olivier, Guy ; Bouchard, Real-Paul (ur.).
Toronto, 1993. str. 45-48 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
Computer Assisted Identification and Measurement of a Semiconductor Device - Heatsink Thermal System
Autori
Benčić, Zvonko ; Jakopović, Željko ; Mrkoci, Damir
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings IMACS-TC1 '93
/ Olivier, Guy ; Bouchard, Real-Paul - Toronto, 1993, 45-48
Skup
4th International Conference - Computational Aspects of Electromechanical Energy Converters and Drives
Mjesto i datum
Toronto, Kanada, 07.07.1993. - 09.07.1993
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
Transient thermal impedance ; measurement of transient thermal impedance
Sažetak
A computer programme was developed for calculating the transient thermal impedance (TTI) of a semiconductor device - heatsink (SDHS) system starting from the measured TTI of a semiconductor device and from the TTI of a heatsink. It is also capable of computing the parameters of a semiconductor device and a heatsink from measured TTI of an SDHS system. Programme application has been illustrated.
Izvorni jezik
Engleski
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
