Pregled bibliografske jedinice broj: 76497
Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method
Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method // Automatika, 32 (1991), 3 4; 87-93 (podatak o recenziji nije dostupan, članak, znanstveni)
CROSBI ID: 76497 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Accuracy of Estimation of Virtual Junction Temperature for Semiconductor Devices Using Two-pulse Method
Autori
Benčić, Zvonko ; Ilić-Roller, Dinka
Izvornik
Automatika (0005-1144) 32
(1991), 3 4;
87-93
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Semiconductor devices; virtual junction temperature; transient thermal impedance; current ratings
Sažetak
The two-pulse method is used for calculating a device's virtual junction temperature at the end of a periodical sequence ofcurrent pulses. For a general RC-pair of the electrical model of a device's thermal circuit, the difference between normalized temperature found by means of two-pulse method and normalized accurate temperature was calculated here. Normalization factor is the maximum temperature possible for a general RC-pair. Calculation findings are shown in diagrams, and this for atransitional and stationary state. An example illustrates the use of diagrams.
Izvorni jezik
Engleski
