Pretraga

Pretražite po imenu i prezimenu autora, mentora, urednika, prevoditelja

Napredna pretraga

Pregled bibliografske jedinice broj: 755479

PureB layers – XRD measurements and temperature characteristics

Suligoj, Tomislav; Knežević Tihomir; Poljak, Mirko; Žonja, Sanja; Žilak, Josip
PureB layers – XRD measurements and temperature characteristics, 2014. (ekspertiza).

CROSBI ID: 755479 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
PureB layers – XRD measurements and temperature characteristics

Autori
Suligoj, Tomislav ; Knežević Tihomir ; Poljak, Mirko ; Žonja, Sanja ; Žilak, Josip

Izvornik
PureB layer analysis with Raman spectroscopy, ellipsometry and electrical measurements

Vrsta, podvrsta
Ostale vrste radova, ekspertiza

Godina
2014

Ključne riječi
amorphous boron; PureB; Raman spectroscopy; ellipsometry; electrical measurements

Sažetak
XRD masurements are performed on the semiconductor devices with amorphous boron layers (PureB layers). Electrical simulations of the devices with PureB layers are performed and the emitter Gummel number is extracted from the simulations. Emitter Gummel number is simulated for different temperatures from which the mechanism dominating the emitter Gummel number could be deduced.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika



POVEZANOST RADA

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Sanja Žonja (autor)

Avatar Url Tomislav Suligoj (autor)

Avatar Url Josip Žilak (autor)

Avatar Url Mirko Poljak (autor)

Avatar Url Tihomir Knežević (autor)

Citiraj ovu publikaciju:

Suligoj, Tomislav; Knežević Tihomir; Poljak, Mirko; Žonja, Sanja; Žilak, Josip
PureB layers – XRD measurements and temperature characteristics, 2014. (ekspertiza).
Suligoj, T., Knežević Tihomir, Poljak, M., Žonja, S. & Žilak, J. (2014) PureB layers – XRD measurements and temperature characteristics. PureB layer analysis with Raman spectroscopy, ellipsometry and electrical measurements. Ekspertiza.
@unknown{unknown, author = {Suligoj, Tomislav and Poljak, Mirko and \v{Z}onja, Sanja and \v{Z}ilak, Josip}, year = {2014}, keywords = {amorphous boron, PureB, Raman spectroscopy, ellipsometry, electrical measurements}, title = {PureB layers – XRD measurements and temperature characteristics}, keyword = {amorphous boron, PureB, Raman spectroscopy, ellipsometry, electrical measurements} }
@unknown{unknown, author = {Suligoj, Tomislav and Poljak, Mirko and \v{Z}onja, Sanja and \v{Z}ilak, Josip}, year = {2014}, keywords = {amorphous boron, PureB, Raman spectroscopy, ellipsometry, electrical measurements}, title = {PureB layers – XRD measurements and temperature characteristics}, keyword = {amorphous boron, PureB, Raman spectroscopy, ellipsometry, electrical measurements} }

Podijeli:





Contrast
Increase Font
Decrease Font
Dyslexic Font
CROSBI koristi kolačiće (cookies) kako bi poboljšao funkcionalnost stranice.