Pregled bibliografske jedinice broj: 74352
Influence of electrical contacts on charge collection profiles in CdZnTe studied by IBIC
Influence of electrical contacts on charge collection profiles in CdZnTe studied by IBIC // Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment, 458 (2001), (1-2); 254-261 (međunarodna recenzija, članak, znanstveni)
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Naslov
Influence of electrical contacts on charge collection profiles in CdZnTe studied by IBIC
Autori
Pastuović, Željko ; Jakšić, Milko ; James, R.B. ; Chattopadhyay, K. ; Ma, X. ; Burger, A.
Izvornik
Nuclear Instruments & Methods in Physics Research Section A-Accelerators Spectrometers Detectors and Associated Equipment (0168-583X) 458
(2001), (1-2);
254-261
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
IBIC
Sažetak
The lateral and frontal modes of the nuclear microprobe technique ion beam-induced charge collection (IBICC) were used for imaging the electronic properties of CdZnTe room-temperature detectors. The detectors with different contacts (In-In, In-Au, Au-Au) were bombarded with a scanned 4 MeV proton microbeam. By measuring the detector response at bias voltages of up to several hundred volts, charge collection profiles: along the thickness of a detector were calculated for different shaping times, Obvious differences between the various contacts were observed in lateral IBICC efficiency profiles that varied in shape, height and smoothness. No hole collection contribution was observed at apllied voltages for all three configurations of the CZT detector. Electron mobility-lifetime products were calculated from measured IBICC efficiency profiles.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus