Pregled bibliografske jedinice broj: 733606
Mathematical model of critical implant stress testing in the weld metal od API 5L X80 steel
Mathematical model of critical implant stress testing in the weld metal od API 5L X80 steel // Materialwissenschaft und Werkstofftechnik, 45 (2014), 11; 470-481 doi:10.1002/mawe.201400344 (međunarodna recenzija, članak, znanstveni)
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Naslov
Mathematical model of critical implant stress testing in the weld metal od API 5L X80 steel
Autori
Tomić, Tanja ; Kralj, Slobodan ; Kožuh, Zoran
Izvornik
Materialwissenschaft und Werkstofftechnik (0933-5137) 45
(2014), 11;
470-481
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
critical Implant stress testing; mathematical model; FCAW; CCD design of experiments
Sažetak
In this paper the influence of heat input and preheat temperature on the critical Implant stress was analyzed for the weld metal of API 5L X80. High strength steel marked as API 5L X80 is produced with a TMCP (Thermo – Mechanical Controlled Process), its chemical composition shows low carbon content due to which the steel has good weldability, but in the weld metal zone cold cracking can occure. The goal of this paper is to define optimal work conditions in form of FCAW (Flux Cored Arc Welding) welding parameters at which no cold cracks can be found. The experiment was conducted using CCD DoE (Central Composite Design – Design of Experiments) with two independent variables (preheat temperature and heat input). Mathematical models were developed for all three different wire types that were used (two rutile, one basic flux cored wire). The samples in this paper which had cold cracks were further analyzed on the scanning electron microscope (SEM).
Izvorni jezik
Engleski
Znanstvena područja
Strojarstvo
POVEZANOST RADA
Ustanove:
Fakultet strojarstva i brodogradnje, Zagreb
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus