Pregled bibliografske jedinice broj: 73280
Compton backscattering of Hf K X-rays in germanium
Compton backscattering of Hf K X-rays in germanium // Fizika B, 4 (1995), 2; 127-135 (međunarodna recenzija, članak, znanstveni)
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Naslov
Compton backscattering of Hf K X-rays in germanium
Autori
Pašić, Selim ; Ilakovac, Ksenofont
Izvornik
Fizika B (1330-0016) 4
(1995), 2;
127-135
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
Coincidence measurement; Compton scattering
Sažetak
The differential cross section, $d^{2}\sigma /d\Omega dE$, for Compton
scattering in germanium was measured by observing detector-to-detector
scattering using the coincidence method. The experiment was performed at
incident energies of 55.791 and 54.612 keV and scattering angle of
$\vartheta=180^0$. The method applied is compared with the corresponding
measurements in the singles mode, i.e. using the source-scatterer-detector
assembly. We found that the coincidence method yields better results, especially
in the region below the peak due to scattering on weakly bound electrons.
However, it is restricted to investigation of Compton scattering in detector
materials. Experimental results are compared with theoretical calculations
based on the "$A^2$-Born" and the impulse approximations.
Izvorni jezik
Engleski
Citiraj ovu publikaciju:
Časopis indeksira:
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI