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Pregled bibliografske jedinice broj: 719617

Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons

Poljak, Mirko; Wang, Kang L.; Suligoj, Tomislav
Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons // Solid-state electronics, 108 (2015), 67-74 doi:10.1016/j.sse.2014.12.012 (međunarodna recenzija, članak, znanstveni)

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Naslov
Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons

Autori
Poljak, Mirko ; Wang, Kang L. ; Suligoj, Tomislav

Izvornik
Solid-state electronics (0038-1101) 108 (2015); 67-74

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
graphene nanoribbons; NEGF simulation; tight-binding; edge defects; transport gap; mobility simulation; variability

Sažetak
We report the results of multi-scale modeling of ultra-narrow graphene nanoribbons (GNRs) that combines atomistic non-equilibrium Green's function (NEGF) approach with semiclassical mobility modeling. The variability of the transport gap and carrier mobility caused by random edge defects is analyzed. We find that the variability increases as the GNR width is downscaled and that even the minimum variation of the total mobility reaches more than 100% compared to average mobility in edge-defected nanoribbons. It is shown that scattering by optical phonons exhibits significantly more variability than the acoustic, line-edge roughness and Coulomb scattering mechanisms. The simulation results demonstrate that sub-5 nm-wide nanoribbons offer no improvement over conventional bulk semiconductors, however, GNRs are comparable with sub-7 nm-thick silicon-on-insulator devices in terms of mobility-bandgap trade-off characteristics.

Izvorni jezik
Engleski

Znanstvena područja
Elektrotehnika

Napomena
Objavljen kao odabrani rad prezentiran na skupu The 15th Ultimate Integration on Silicon (ULIS) conference.



POVEZANOST RADA

Projekti:
HRZZ-IP-2013-11-9006 - Poluvodički elementi visokih performansi za primjene u sklopovima za bežične komunikacije i optičke detektore (HiPerSemi) (Suligoj, Tomislav, HRZZ ) ( CroRIS)

Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb

Profili:

Avatar Url Tomislav Suligoj (autor)

Avatar Url Mirko Poljak (autor)

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com

Citiraj ovu publikaciju:

Poljak, Mirko; Wang, Kang L.; Suligoj, Tomislav
Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons // Solid-state electronics, 108 (2015), 67-74 doi:10.1016/j.sse.2014.12.012 (međunarodna recenzija, članak, znanstveni)
Poljak, M., Wang, K. & Suligoj, T. (2015) Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons. Solid-state electronics, 108, 67-74 doi:10.1016/j.sse.2014.12.012.
@article{article, author = {Poljak, Mirko and Wang, Kang L. and Suligoj, Tomislav}, year = {2015}, pages = {67-74}, DOI = {10.1016/j.sse.2014.12.012}, keywords = {graphene nanoribbons, NEGF simulation, tight-binding, edge defects, transport gap, mobility simulation, variability}, journal = {Solid-state electronics}, doi = {10.1016/j.sse.2014.12.012}, volume = {108}, issn = {0038-1101}, title = {Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons}, keyword = {graphene nanoribbons, NEGF simulation, tight-binding, edge defects, transport gap, mobility simulation, variability} }
@article{article, author = {Poljak, Mirko and Wang, Kang L. and Suligoj, Tomislav}, year = {2015}, pages = {67-74}, DOI = {10.1016/j.sse.2014.12.012}, keywords = {graphene nanoribbons, NEGF simulation, tight-binding, edge defects, transport gap, mobility simulation, variability}, journal = {Solid-state electronics}, doi = {10.1016/j.sse.2014.12.012}, volume = {108}, issn = {0038-1101}, title = {Variability of bandgap and carrier mobility caused by edge defects in ultra-narrow graphene nanoribbons}, keyword = {graphene nanoribbons, NEGF simulation, tight-binding, edge defects, transport gap, mobility simulation, variability} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus

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