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Pregled bibliografske jedinice broj: 711046

Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method


Hajdek, Krunoslav; Miljković, Petar; Modrić, Damir
Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method // TECHNICAL GAZETTE, 21 (2014), 4; 779-788 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 711046 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method

Autori
Hajdek, Krunoslav ; Miljković, Petar ; Modrić, Damir

Izvornik
TECHNICAL GAZETTE (1330-3651) 21 (2014), 4; 779-788

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
Monte Carlo simulation ; optical dot gain ; subsurface scattering in paper

Sažetak
Better understanding of how internal structural changes affect the optical properties requires modelling the composite structure of a paper layer. We propose a Monte Carlo simulation platform, which allows different geometrical representations of the inner paper structure. Monte Carlo Modelling is a method that can be used to simulate photon interaction with substrate (in our case paper). The model can be built such that increasing complexity can be added as the model is being developed. Thus, the model is developed from a simple concept of random number generation to a very accurate interpretation of photon propagation in paper. We applied the model to the analysis of the effect of dot gain. The above model was used to analyse the effect of weight gain dot gain of printed lines of different thicknesses. The simulation results are in good agreement with measurements of reflection after having additionally introduced a "filter" function that permanently removes photons thereby adapting simulated values to the measured ones. Within the framework of the simulation, we can estimate the number of photons that ends below the screen element causing a possible increase of the optical dot gain.

Izvorni jezik
Engleski

Znanstvena područja
Grafička tehnologija, Informacijske i komunikacijske znanosti



POVEZANOST RADA


Projekti:
MZOS-128-1281955-1960 - Evaluacija kvantitavnih i kvalitativnih kriterija procesa grafičke reprodukcije (Mrvac, Nikola, MZOS ) ( CroRIS)

Ustanove:
Grafički fakultet, Zagreb,
Sveučilište Sjever, Koprivnica

Profili:

Avatar Url Krunoslav Hajdek (autor)

Avatar Url Petar Miljković (autor)

Avatar Url Damir Modrić (autor)

Poveznice na cjeloviti tekst rada:

Hrčak

Citiraj ovu publikaciju:

Hajdek, Krunoslav; Miljković, Petar; Modrić, Damir
Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method // TECHNICAL GAZETTE, 21 (2014), 4; 779-788 (međunarodna recenzija, članak, znanstveni)
Hajdek, K., Miljković, P. & Modrić, D. (2014) Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method. TECHNICAL GAZETTE, 21 (4), 779-788.
@article{article, author = {Hajdek, Krunoslav and Miljkovi\'{c}, Petar and Modri\'{c}, Damir}, year = {2014}, pages = {779-788}, keywords = {Monte Carlo simulation, optical dot gain, subsurface scattering in paper}, journal = {TECHNICAL GAZETTE}, volume = {21}, number = {4}, issn = {1330-3651}, title = {Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method}, keyword = {Monte Carlo simulation, optical dot gain, subsurface scattering in paper} }
@article{article, author = {Hajdek, Krunoslav and Miljkovi\'{c}, Petar and Modri\'{c}, Damir}, year = {2014}, pages = {779-788}, keywords = {Monte Carlo simulation, optical dot gain, subsurface scattering in paper}, journal = {TECHNICAL GAZETTE}, volume = {21}, number = {4}, issn = {1330-3651}, title = {Some aspects of modelling of line screen element reflectance profile within the Monte Carlo method}, keyword = {Monte Carlo simulation, optical dot gain, subsurface scattering in paper} }

Časopis indeksira:


  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


Uključenost u ostale bibliografske baze podataka::


  • Compendex (EI Village)
  • EMBASE (Excerpta Medica)
  • INSPEC
  • Paperchem





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