Pregled bibliografske jedinice broj: 710330
Development and characterization of EIS structures based on micro and nano SiO2 pores before and after its functionalization with silanes and phosphonate films
Development and characterization of EIS structures based on micro and nano SiO2 pores before and after its functionalization with silanes and phosphonate films // Engineering of functional interfaces
Marburg, Njemačka, 2010. (predavanje, međunarodna recenzija, sažetak, znanstveni)
CROSBI ID: 710330 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Development and characterization of EIS structures based on micro and nano SiO2 pores before and after its functionalization with silanes and phosphonate films
Autori
Hofmann, Martina ; Garma, Tonko ; Cattani-Scholz, Anna ; Dalmau Mallorqui, Anna ; Fontcuberta i Morral, Anna ; Moreno i Codinachs, Lia
Vrsta, podvrsta i kategorija rada
Sažeci sa skupova, sažetak, znanstveni
Izvornik
Engineering of functional interfaces
/ - , 2010
Skup
Engineering of functional interfaces 2010
Mjesto i datum
Marburg, Njemačka, 15.07.2010. - 16.07.2010
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
EIS structures; micro and nano SiO2 pores; functionalization; silanes and phosphonate
Sažetak
In this work electrolyte–insulator–semiconductor (EIS) structures based on lithographically fabricated Si–SiO2 micropillars and pores are studied. The samples are characterized by means of impedance spectroscopy (IS) and they are compared to samples with a planar SiO2 layer on a Si substrate in order to determine whether the increase in active surface is directly related to an increase in sensitivity of the device. Our initial results confirm this question in the case of the pillar samples but not for the pore ones, most likely due to some fabrication issues that must be improved. Afterwards the SiO2 surface is functionalized with posphonates and the influence of the modification is studied using IS. Also, the stability and limits of applicability of the functionalized devices is studied. Analysis with X-ray photoelectron spectroscopy (XPS) is used to show that the deposition of phosphonates was successful.
Izvorni jezik
Engleski
Znanstvena područja
Fizika, Kemija, Elektrotehnika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike, strojarstva i brodogradnje, Split
Profili:
Tonko Garma
(autor)