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Pregled bibliografske jedinice broj: 701165

Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility


Tadić, Tonči; Bogdanović Radović, Ivančica; Siketić, Zdravko; Cosica, Donny Domagoj; Skukan, Natko; Jakšić, Milko; Matsuo, Jiro
Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 332 (2014), 234-237 doi:10.1016/j.nimb.2014.02.068 (međunarodna recenzija, članak, znanstveni)


CROSBI ID: 701165 Za ispravke kontaktirajte CROSBI podršku putem web obrasca

Naslov
Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility

Autori
Tadić, Tonči ; Bogdanović Radović, Ivančica ; Siketić, Zdravko ; Cosica, Donny Domagoj ; Skukan, Natko ; Jakšić, Milko ; Matsuo, Jiro

Izvornik
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms (0168-583X) 332 (2014); 234-237

Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni

Ključne riječi
MeV SIMS ; heavy ion microbeam ; molecular imaging ; organic samples

Sažetak
We describe a new Time-of-flight Secondary Ion Mass Spectrometry (TOF SIMS) setup for MeV SIMS application, which is constructed and installed at the heavy ion microbeam facility at the Ruđer Bošković Institute in Zagreb. The TOF-SIMS setup is developed for high sensitivity molecular imaging using a heavy ion microbeam that focuses ion beams (from C to I) with sub- micron resolution. Dedicated pulse processing electronics for MeV SIMS application have been developed, enabling microbeam-scanning control, incoming ion microbeam pulsing and molecular mapping. The first results showing measured MeV SIMS spectra as well as molecular maps for samples of interest are presented and discussed.

Izvorni jezik
Engleski

Znanstvena područja
Fizika



POVEZANOST RADA


Projekti:
098-1191005-2876 - Procesi interakcije ionskih snopova i nanostrukture (Jakšić, Milko, MZOS ) ( CroRIS)

Ustanove:
Institut "Ruđer Bošković", Zagreb

Poveznice na cjeloviti tekst rada:

doi www.sciencedirect.com

Citiraj ovu publikaciju:

Tadić, Tonči; Bogdanović Radović, Ivančica; Siketić, Zdravko; Cosica, Donny Domagoj; Skukan, Natko; Jakšić, Milko; Matsuo, Jiro
Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility // Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 332 (2014), 234-237 doi:10.1016/j.nimb.2014.02.068 (međunarodna recenzija, članak, znanstveni)
Tadić, T., Bogdanović Radović, I., Siketić, Z., Cosica, D., Skukan, N., Jakšić, M. & Matsuo, J. (2014) Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility. Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 332, 234-237 doi:10.1016/j.nimb.2014.02.068.
@article{article, author = {Tadi\'{c}, Ton\v{c}i and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Siketi\'{c}, Zdravko and Cosica, Donny Domagoj and Skukan, Natko and Jak\v{s}i\'{c}, Milko and Matsuo, Jiro}, year = {2014}, pages = {234-237}, DOI = {10.1016/j.nimb.2014.02.068}, keywords = {MeV SIMS, heavy ion microbeam, molecular imaging, organic samples}, journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms}, doi = {10.1016/j.nimb.2014.02.068}, volume = {332}, issn = {0168-583X}, title = {Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility}, keyword = {MeV SIMS, heavy ion microbeam, molecular imaging, organic samples} }
@article{article, author = {Tadi\'{c}, Ton\v{c}i and Bogdanovi\'{c} Radovi\'{c}, Ivan\v{c}ica and Siketi\'{c}, Zdravko and Cosica, Donny Domagoj and Skukan, Natko and Jak\v{s}i\'{c}, Milko and Matsuo, Jiro}, year = {2014}, pages = {234-237}, DOI = {10.1016/j.nimb.2014.02.068}, keywords = {MeV SIMS, heavy ion microbeam, molecular imaging, organic samples}, journal = {Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms}, doi = {10.1016/j.nimb.2014.02.068}, volume = {332}, issn = {0168-583X}, title = {Development of a TOF SIMS setup at the Zagreb heavy ion microbeam facility}, keyword = {MeV SIMS, heavy ion microbeam, molecular imaging, organic samples} }

Časopis indeksira:


  • Current Contents Connect (CCC)
  • Web of Science Core Collection (WoSCC)
    • Science Citation Index Expanded (SCI-EXP)
    • SCI-EXP, SSCI i/ili A&HCI
  • Scopus


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