Pregled bibliografske jedinice broj: 68023
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods // Program and Proceedings NCPV Program Review Meeting
Denver (CO): NREL, Sandia National Laboratories, 2000. str. 225-226 (poster, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
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Naslov
The chemical ordering in a-Si1-xCx:H thin films by vibrational spectroscopy and nuclear methods
Autori
Gracin, Davor ; Dutta, J.M. ; Borjanović, Vesna ; Vlahović, Branimir ; Bogdanović, Ivančica ; Jakšić, Milko ; Nemanich, R.J.
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Program and Proceedings NCPV Program Review Meeting
/ - Denver (CO) : NREL, Sandia National Laboratories, 2000, 225-226
Skup
National center for photovoltaics program review meeting, 2000
Mjesto i datum
Denver (CO), Sjedinjene Američke Države, 16.04.2000. - 19.04.2000
Vrsta sudjelovanja
Poster
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
chemical ordering; FTIR; Raman; RBS; ERDA
Sažetak
The amorphous hydrogenated silicon carbide thin films were deposited in wide composition range and under various deposition conditions. The film composition and concentration of chemical bonding have been measured by RBS, ERDA, FTIR and Raman spectroscopy. The compatibility and accuracy of applied methods in quantitative analysis has been discussed and degree of chemical ordering has been estimated.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb,
Institut "Ruđer Bošković", Zagreb
Profili:
Davor Gracin
(autor)
Ivančica Bogdanović Radović
(autor)
Milko Jakšić
(autor)
Vesna Borjanović
(autor)
