Pregled bibliografske jedinice broj: 673318
System-ESD Validation of a Microcontroller with External RC-Filter
System-ESD Validation of a Microcontroller with External RC-Filter // Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013) / Toyota, Yoshitaka ; Iokibe, Kengo ; Matsushima, Tohlu ; Wada, Osami (ur.).
Kyoto: Institute of Electrical and Electronics Engineers (IEEE), 2013. str. 196-201 doi:10.1109/EMCCompo.2013.6735200 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
CROSBI ID: 673318 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
System-ESD Validation of a Microcontroller with External RC-Filter
Autori
Steinecke, Thomas ; Unger, Markus ; Scheier, Stanislav ; Frei, Stephan ; Bačmaga, Josip ; Barić, Adrijan
Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni
Izvornik
Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits (EMC Compo 2013)
/ Toyota, Yoshitaka ; Iokibe, Kengo ; Matsushima, Tohlu ; Wada, Osami - Kyoto : Institute of Electrical and Electronics Engineers (IEEE), 2013, 196-201
ISBN
978-1-4799-2314-4
Skup
International Workshop on Electromagnetic Compatibility of Integrated Circuits (9 ; 2013)
Mjesto i datum
Nara-shi, Japan, 15.12.2013. - 18.12.2013
Vrsta sudjelovanja
Predavanje
Vrsta recenzije
Međunarodna recenzija
Ključne riječi
ESD ; electrostatic discharge ; filtering
Sažetak
Although microcontrollers are generally well separated from ESD events happening on a fully equipped and mounted electronic control unit, special configurations expose some microcontrollers to these system-ESD events. In the BISS IC EMC Test Specification [1], several system-level disturbance tests are referenced. One of them is the unpowered system-ESD test according to the international standard ISO 10506 [2]. Automotive companies request that microcontrollers and other ICs shall withstand e.g. 6 kV system-ESD stress applied to ICpins either directly or via discrete protection components. This paper describes the experience made with a 65 nm CMOS 32- bit microcontroller including an external ESD protection filter when exposed to normative system-ESD pulses. Although not expected, discrete SMD protection capacitors degraded or even showed short-circuits after being exposed to several ESD events.
Izvorni jezik
Engleski
Znanstvena područja
Elektrotehnika
POVEZANOST RADA
Ustanove:
Fakultet elektrotehnike i računarstva, Zagreb
