Pregled bibliografske jedinice broj: 652529
Diffusion enhancement in thin films due to low energy ion bombardment during deposition
Diffusion enhancement in thin films due to low energy ion bombardment during deposition // Vacuum, 40 (1990), 1-2; 234-234 doi:10.1016/0042-207X(90)90209-H (međunarodna recenzija, članak, znanstveni)
CROSBI ID: 652529 Za ispravke kontaktirajte CROSBI podršku putem web obrasca
Naslov
Diffusion enhancement in thin films due to low energy ion bombardment during deposition
Autori
Sternberg, Z. ; Stupnišek, Mladen ; Dukić, Predrag ; Stubičar, Mirko ; Milat, Ognjen
Izvornik
Vacuum (0042-207X) 40
(1990), 1-2;
234-234
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
diffusion; boundary layer effects
Sažetak
Sputter deposition of cupper on alumunium, under bombardment of low-energy ions resulted in the formation of two interfacial zones. Results suggest that by supplying energy for the formation of vacancies, the activation energy for diffusion can be reduced.
Izvorni jezik
Engleski
Znanstvena područja
Strojarstvo
Napomena
Jedan od odabranih radova prezentiranih na Yugoslav-Austrian-Hungarian Fourth Joint Vacuum Conference.
POVEZANOST RADA
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus