Pregled bibliografske jedinice broj: 652480
Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods
Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods // Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms, 118 (1996), 1-4; 602-607 doi:10.1016/0168-583X(95)01078-5 (međunarodna recenzija, članak, znanstveni)
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Naslov
Analysis of Stochiometry of Hi-Tc Superconductiong Films by RBS and PIXE Methods
Autori
Sandrik, R. ; Jergel, M. ; Strbik, V. ; Nakamura, K. ; Ishii, A. ; Orlić, Ivica ; Tang, S.M. ; Watt, F.
Izvornik
Nuclear instruments & methods in physics research. Section B, Beam interactions with materials and atoms (0168-583X) 118
(1996), 1-4;
602-607
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
RBS ; PIXE ; thin film YBa2Cu3O7 − δ
Sažetak
Lateral inhomogeneity has been studied in thin films of YBa2Cu3O7 − δ deposited from aerosol on MgO substrates. RBS and PIXE analyses distinguished areas that were found to differ in the critical temperature Tc values. The PIXE results confirmed the differences in composition between those areas. Variations in layer thicknesses were found by means of RBS analysis. Measurements made with a microbeam showed that the film within each of those areas was homogeneous. However, significant variations in the YBaCuO stoichiometry and local changes in the film thickness were found in the intermediate zone between areas with Tc = 85 K and Tc = 80 K.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Rad je prezentiran na skupu Ion Beam Analysis, održanom
od 22.–26.05.1995.g., Tempe, Arizona, SAD ; R.J.
Culbertson (ur.).
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
