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Pregled bibliografske jedinice broj: 649216

Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C


Zvizdić, Davor; Šestan Danijel
Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C // Temperature: Its Measurement and Control in Science and Industry, Volume 8 / Proceedings of the Ninth International Temperature Symposium / Christopher W. Meyer (ur.).
Melville (NY): American Institute of Physics (AIP), 2013. str. 445-450 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)


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Naslov
Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C

Autori
Zvizdić, Davor ; Šestan Danijel

Vrsta, podvrsta i kategorija rada
Radovi u zbornicima skupova, cjeloviti rad (in extenso), znanstveni

Izvornik
Temperature: Its Measurement and Control in Science and Industry, Volume 8 / Proceedings of the Ninth International Temperature Symposium / Christopher W. Meyer - Melville (NY) : American Institute of Physics (AIP), 2013, 445-450

ISBN
978-0-7354-1178-4

Skup
Ninth International Temperature Symposium (ITS9)

Mjesto i datum
Los Angeles (CA), Sjedinjene Američke Države, 19.03.2013. - 23.03.2013

Vrsta sudjelovanja
Predavanje

Vrsta recenzije
Međunarodna recenzija

Ključne riječi
Industrial platinum resistance thermometers; Thermal hysteresis; Thin-film PRT; R-T characteristics; Uncertainty factors

Sažetak
As opposed to SPRTs, the IPRTs succumb to hysteresis when submitted to change of temperature. This uncertainty component, although acknowledged as omnipresent at many other types of sensors (pressure, electrical, magnetic, humidity, etc.) has often been disregarded in their calibration certificates’ uncertainty budgets in the past, its determination being costly, time-consuming and not appreciated by customers and manufacturers. In general, hysteresis is a phenomenon that results in a difference in an item’s behavior when approached from a different path. Thermal hysteresis results in a difference in resistance at a given temperature based on the thermal history to which the PRTs were exposed. The most prominent factor that contributes to the hysteresis error in an IPRT is a strain within the sensing element caused by the thermal expansion and contraction. The strains that cause hysteresis error are closely related to the strains that cause repeatability error. Therefore, it is typical that PRTs that exhibit small hysteresis also exhibit small repeatability error, and PRTs that exhibit large hysteresis have poor repeatability. Aim of this paper is to provide hysteresis characterization of a batch of IPRTs using the same type of thin-film sensor, encapsulated by same procedure and same company and to estimate to what extent the thermal hysteresis obtained by testing one single thermometer (or few thermometers) can serve as representative of other thermometers of the same type and manufacturer. This investigation should also indicate the range of hysteresis departure between IPRTs of the same type. Hysteresis was determined by cycling IPRTs temperature from 100 °C through intermediate points up to 600 °C and subsequently back to 100 °C. Within that range several typical sub-ranges are investigated: 100 °C to 400 °C, 100 °C to 500 °C, 100 °C to 600 °C, 300 °C to 500 °C and 300 °C to 600 °C . The hysteresis was determined at various temperatures by comparison calibration with SPRT. The results of investigation are presented in a graphical form for all IPRTs, ranges and calibration points.

Izvorni jezik
Engleski

Znanstvena područja
Strojarstvo



POVEZANOST RADA


Projekti:
120-0000000-3322 - Razvoj nacionalnog etalona temperature (Zvizdić, Davor, MZOS ) ( CroRIS)

Ustanove:
Fakultet strojarstva i brodogradnje, Zagreb

Profili:

Avatar Url Danijel Šestan (autor)

Avatar Url Davor Zvizdić (autor)

Poveznice na cjeloviti tekst rada:

Pristup cjelovitom tekstu rada

Citiraj ovu publikaciju:

Zvizdić, Davor; Šestan Danijel
Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C // Temperature: Its Measurement and Control in Science and Industry, Volume 8 / Proceedings of the Ninth International Temperature Symposium / Christopher W. Meyer (ur.).
Melville (NY): American Institute of Physics (AIP), 2013. str. 445-450 (predavanje, međunarodna recenzija, cjeloviti rad (in extenso), znanstveni)
Zvizdić, D. & Šestan Danijel (2013) Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C. U: Christopher W. Meyer (ur.)Temperature: Its Measurement and Control in Science and Industry, Volume 8 / Proceedings of the Ninth International Temperature Symposium.
@article{article, author = {Zvizdi\'{c}, Davor}, year = {2013}, pages = {445-450}, keywords = {Industrial platinum resistance thermometers, Thermal hysteresis, Thin-film PRT, R-T characteristics, Uncertainty factors}, isbn = {978-0-7354-1178-4}, title = {Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C}, keyword = {Industrial platinum resistance thermometers, Thermal hysteresis, Thin-film PRT, R-T characteristics, Uncertainty factors}, publisher = {American Institute of Physics (AIP)}, publisherplace = {Los Angeles (CA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }
@article{article, author = {Zvizdi\'{c}, Davor}, year = {2013}, pages = {445-450}, keywords = {Industrial platinum resistance thermometers, Thermal hysteresis, Thin-film PRT, R-T characteristics, Uncertainty factors}, isbn = {978-0-7354-1178-4}, title = {Hysteresis of thin film IPRTs in the Range 100 °C to 600 °C}, keyword = {Industrial platinum resistance thermometers, Thermal hysteresis, Thin-film PRT, R-T characteristics, Uncertainty factors}, publisher = {American Institute of Physics (AIP)}, publisherplace = {Los Angeles (CA), Sjedinjene Ameri\v{c}ke Dr\v{z}ave} }




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