Pregled bibliografske jedinice broj: 645715
Ion beam induced charge collection time imaging of a silicon microdosimeter
Ion beam induced charge collection time imaging of a silicon microdosimeter // Nuclear Instruments and Methods in Physics Research. B : Beam Interactions with Materials and Atoms, 210 (2003), 191-195 doi:10.1016/S0168-583X(03)01068-1 (međunarodna recenzija, članak, znanstveni)
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Naslov
Ion beam induced charge collection time imaging of a silicon microdosimeter
Autori
Cornelius, I.M. ; Orlić, Ivica ; Siegele, R. ; Rosenfeld, A.B. ; Cohen, D.D.
Izvornik
Nuclear Instruments and Methods in Physics Research. B : Beam Interactions with Materials and Atoms (0168-583X) 210
(2003);
191-195
Vrsta, podvrsta i kategorija rada
Radovi u časopisima, članak, znanstveni
Ključne riječi
microprobe; microdosimetry; pulse shape discrimination
Sažetak
The timing properties of a silicon-on-insulator microdosimeter for medical and space applications have been studied using an ion microprobe. These measurements were used with a pulse shape discrimination technique to render the microdosimeter insensitive to ion strikes outside the ideal sensitive volume.
Izvorni jezik
Engleski
Znanstvena područja
Fizika
Napomena
Rad je prezentiran na skupu 8th International Conference of Nuclear Microprobe Technology and Applications, održanom od 08.-13.09.2002.g., Takasaki, Japan.
Citiraj ovu publikaciju:
Časopis indeksira:
- Current Contents Connect (CCC)
- Web of Science Core Collection (WoSCC)
- Science Citation Index Expanded (SCI-EXP)
- SCI-EXP, SSCI i/ili A&HCI
- Scopus
